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公开(公告)号:US20220093735A1
公开(公告)日:2022-03-24
申请号:US17541625
申请日:2021-12-03
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung-Min SONG , Woo-Seok PARK , Jung-Gil YANG , Geum-Jong BAE , Dong-Il Bae
IPC: H01L29/06 , H01L29/423 , H01L29/08 , H01L27/088 , H01L29/78 , H01L29/66 , H01L21/306 , H01L21/308 , H01L21/02 , H01L29/10 , B82Y10/00 , H01L29/786 , H01L29/775 , H01L29/40
Abstract: Semiconductor devices are provided. A semiconductor device includes a substrate and a gate structure on the substrate. The semiconductor device includes a channel on the substrate. The semiconductor device includes a source/drain layer on the channel. Moreover, the semiconductor device includes a spacer on a sidewall of the gate structure. The spacer includes a central portion overlapping the channel in a vertical direction, and a protrusion portion protruding from the central portion. Related methods of manufacturing semiconductor devices are also provided.
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公开(公告)号:US20200381514A1
公开(公告)日:2020-12-03
申请号:US16996334
申请日:2020-08-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung-Min SONG , Woo-Seok PARK , Jung-Gil YANG , Geum-Jong BAE , Dong-Il Bae
IPC: H01L29/06 , H01L29/423 , H01L29/08 , H01L27/088 , H01L29/78 , H01L29/66 , H01L21/306 , H01L21/308 , H01L21/02 , H01L29/10 , B82Y10/00 , H01L29/786 , H01L29/775 , H01L29/40
Abstract: Semiconductor devices are provided. A semiconductor device includes a substrate and a gate structure on the substrate. The semiconductor device includes a channel on the substrate. The semiconductor device includes a source/drain layer on the channel. Moreover, the semiconductor device includes a spacer on a sidewall of the gate structure. The spacer includes a central portion overlapping the channel in a vertical direction, and a protrusion portion protruding from the central portion. Related methods of manufacturing semiconductor devices are also provided.
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公开(公告)号:US20220238707A1
公开(公告)日:2022-07-28
申请号:US17659571
申请日:2022-04-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jung-Gil YANG , Beom-Jin PARK , Seung-Min SONG , Geum-Jong BAE , Dong-Il BAE
IPC: H01L29/78 , H01L29/06 , H01L29/66 , H01L21/308 , H01L21/762 , H01L21/8234 , H01L29/786 , H01L29/423 , H01L29/775
Abstract: A semiconductor device includes channels, a gate structure, and a source/drain layer. The channels are disposed at a plurality of levels, respectively, and spaced apart from each other in a vertical direction on an upper surface of a substrate. The gate structure is disposed on the substrate, at least partially surrounds a surface of each of the channels, and extends in a first direction substantially parallel to the upper surface of the substrate. The source/drain layer is disposed at each of opposite sides of the gate structure in a second direction substantially parallel to the upper surface of the substrate and substantially perpendicular to the first direction and is connected to sidewalls of the channels. A length of the gate structure in the second direction changes along the first direction at a first height from the upper surface of the substrate in the vertical direction.
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公开(公告)号:US20190096996A1
公开(公告)日:2019-03-28
申请号:US16052091
申请日:2018-08-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung-Min SONG , Woo-Seok PARK , Jung-Gil YANG , Geum-Jong BAE , Dong-Il Bae
IPC: H01L29/06 , H01L29/10 , H01L29/423 , H01L29/08 , H01L27/088 , H01L29/78 , H01L29/66 , H01L21/306 , H01L21/308 , H01L21/02
Abstract: Semiconductor devices are provided. A semiconductor device includes a substrate and a gate structure on the substrate. The semiconductor device includes a channel on the substrate. The semiconductor device includes a source/drain layer on the channel. Moreover, the semiconductor device includes a spacer on a sidewall of the gate structure. The spacer includes a central portion overlapping the channel in a vertical direction, and a protrusion portion protruding from the central portion. Related methods of manufacturing semiconductor devices are also provided.
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