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公开(公告)号:US20190109151A1
公开(公告)日:2019-04-11
申请号:US16211496
申请日:2018-12-06
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JU-HYUN KANG , HYUN LEE , MIN-SU KIM , JI-KYUM KIM , JONG-WOO KIM
IPC: H01L27/118 , G06F17/50
CPC classification number: H01L27/11807 , G06F17/505 , H01L2027/11875 , H01L2027/11881
Abstract: An integrated circuit includes a complex logic cell. The complex logic cell includes a first logic circuit providing a first output signal from a first input signal group and a common input signal group, and a second logic circuit providing a second output signal from a second input signal group and the common input signal group. The first and second logic circuits respectively include first and second transistors formed from a gate electrode, the gate electrode extending in a first direction and receiving a first common input signal of the common input signal group.
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公开(公告)号:US20190109586A1
公开(公告)日:2019-04-11
申请号:US15981415
申请日:2018-05-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: HYUN LEE , DAE SEONG LEE , MINSU KIM , AHREUM KIM , CHUNGHEE KIM
IPC: H03K3/037 , H03K19/20 , G01R31/3177 , G01R31/317 , G06F1/10
Abstract: An electronic circuit includes a first flip-flop, a second flip-flop, and a clock generator. The first flip-flop comprises a first master latch and a first slave latch arranged in order along a first direction. The second flip-flop comprises a second master latch and a second slave latch arranged in order along a second direction that is opposite to the first direction. The clock generator is arranged between the first master latch and the second master latch and outputs a clock.
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公开(公告)号:US20170292993A1
公开(公告)日:2017-10-12
申请号:US15479310
申请日:2017-04-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: DOO-SEOK YOON , MIN-SU KIM , CHUNG-HEE KIM , DAE-SEONG LEE , HYUN LEE , MATTHEW BERZINS , JAMES LIM
IPC: G01R31/3177 , G01R31/317 , H03K3/037
CPC classification number: G01R31/3177 , G01R31/31723 , G01R31/31725 , G01R31/318541 , H03K3/0372
Abstract: A multi-bit flip-flop includes: a single scan input pin to receive a scan input signal, a plurality of data input pins to receive first and second data input signals, a first scan flip-flop to select one of the scan input signal and the first data input signal as a first selection signal in response to a scan enable signal and to latch the first selection signal to provide a first output signal, a second scan flip-flop to select one of an internal signal corresponding to the first output signal and the second data input signal as a second selection signal in response to the scan enable signal and to latch the second selection signal to provide a second output signal, and a plurality of output pins to output the first and second output signals, wherein scan paths of the first and second scan flip-flops are connected to each other.
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公开(公告)号:US20170317100A1
公开(公告)日:2017-11-02
申请号:US15409674
申请日:2017-01-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JU-HYUN KANG , HYUN LEE , MIN-SU KIM , JI-KYUM KIM , JONG-WOO KIM
IPC: H01L27/118 , G06F17/50
CPC classification number: H01L27/11807 , G06F17/505 , H01L2027/11875 , H01L2027/11881
Abstract: An integrated circuit includes a complex logic cell. The complex logic cell includes a first logic circuit providing a first output signal from a first input signal group and a common input signal group, and a second logic circuit providing a second output signal from a second input signal group and the common input signal group. The first and second logic circuits respectively include first and second transistors formed from a gate electrode, the gate electrode extending in a first direction and receiving a first common input signal of the common input signal group.
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