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公开(公告)号:US20210143008A1
公开(公告)日:2021-05-13
申请号:US16905310
申请日:2020-06-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jungmin Ko , Hyeongmun Kang , Sangsick Park , Hyeonjun Song
IPC: H01L21/02 , H01L21/56 , H01L21/762
Abstract: A semiconductor package includes a buffer, a chip stack mounted on the buffer, an adhesive layer disposed between the buffer and the chip stack, and a molding material surrounding the chip stack. The buffer includes a plurality of trenches disposed adjacent to a plurality of edges of the buffer. Each of the trenches is shorter than a corresponding adjacent edge of a chip area of the buffer.
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公开(公告)号:US11469099B2
公开(公告)日:2022-10-11
申请号:US16905310
申请日:2020-06-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jungmin Ko , Hyeongmun Kang , Sangsick Park , Hyeonjun Song
IPC: G11C5/06 , H01L27/108 , H01L21/02 , H01L21/56 , H01L21/762
Abstract: A semiconductor package includes a buffer, a chip stack mounted on the buffer, an adhesive layer disposed between the buffer and the chip stack, and a molding material surrounding the chip stack. The buffer includes a plurality of trenches disposed adjacent to a plurality of edges of the buffer. Each of the trenches is shorter than a corresponding adjacent edge of a chip area of the buffer.
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公开(公告)号:US11658160B2
公开(公告)日:2023-05-23
申请号:US17574953
申请日:2022-01-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyeonjun Song , Eunkyul Oh , Hyeongmun Kang , Jungmin Ko
IPC: H01L23/00 , H01L25/065 , H01L23/31 , H01L23/367 , H01L21/48 , H01L21/56 , H01L25/00
CPC classification number: H01L25/0657 , H01L21/4871 , H01L21/563 , H01L21/565 , H01L23/3128 , H01L23/367 , H01L24/14 , H01L25/50 , H01L2224/1403 , H01L2224/14132 , H01L2224/14519 , H01L2225/06513 , H01L2225/06541 , H01L2225/06586 , H01L2225/06589
Abstract: A semiconductor package may include a package substrate, semiconductor chips, signal bumps, and first and second heat dissipation bumps. The semiconductor chips may be stacked on an upper surface of the package substrate, have first and second regions having different heat dissipation efficiencies. The second temperature may be higher than the first temperature. The signal bumps may be arranged between the semiconductor chips. The first heat dissipation bumps may be arranged between the semiconductor chips in the first region by a first pitch. The second heat dissipation bumps may be arranged between the semiconductor chips in the second region by a second pitch narrower than the first pitch. Heat generated from the second region of the semiconductor chips may be dissipated through the second heat dissipation bumps, which may be relatively closely arranged with each other.
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公开(公告)号:US20230420403A1
公开(公告)日:2023-12-28
申请号:US18165419
申请日:2023-02-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyeonjun Song , Jungmin Ko , Taehyeong Kim , Youngwoo Lim , Dongki Choi
CPC classification number: H01L24/32 , H01L25/18 , H01L23/3107 , H01L24/16 , H01L24/73 , H01L24/83 , H01L24/13 , H01L2224/16145 , H01L2224/32145 , H01L2224/73204 , H01L2224/83007 , H01L2224/26125 , H01L2224/13111 , H01L2224/13116 , H01L2224/13139 , H01L2224/13144 , H01L2224/13147 , H01L2224/13113 , H01L2224/13118
Abstract: A semiconductor package includes a base chip; semiconductor chips stacked on the base chip; bumps, a lowermost bump of the bumps disposed between the base chip and a lowermost semiconductor chip of the semiconductor chips, and each of the bumps except the lowermost bump respectively disposed between the semiconductor chips; organic material layers, a lowermost organic material layer of the organic material layers disposed between the base chip and the lowermost semiconductor chip, and each of organic material layers except the lowermost organic material layer respectively disposed between the plurality of semiconductor chips; underfill layers respectively surrounding the plurality of bumps, the underfill layers extending between the base chip and the lowermost semiconductor chip and between the semiconductor chips; and an encapsulant covering the base chip, the semiconductor chips, and the underfill layers.
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公开(公告)号:US11257794B2
公开(公告)日:2022-02-22
申请号:US17030588
申请日:2020-09-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyeonjun Song , Eunkyul Oh , Hyeongmun Kang , Jungmin Ko
IPC: H01L23/00 , H01L25/065 , H01L23/31 , H01L23/367 , H01L21/48 , H01L21/56 , H01L25/00
Abstract: A semiconductor package may include a package substrate, semiconductor chips, signal bumps, and first and second heat dissipation bumps. The semiconductor chips may be stacked on an upper surface of the package substrate, have first and second regions having different heat dissipation efficiencies. The second temperature may be higher than the first temperature. The signal bumps may be arranged between the semiconductor chips. The first heat dissipation bumps may be arranged between the semiconductor chips in the first region by a first pitch. The second heat dissipation bumps may be arranged between the semiconductor chips in the second region by a second pitch narrower than the first pitch. Heat generated from the second region of the semiconductor chips may be dissipated through the second heat dissipation bumps, which may be relatively closely arranged with each other.
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