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公开(公告)号：US11681947B2
公开(公告)日：2023-06-20
申请号：US16518104
申请日：2019-07-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jeong-Hoon Ko , Jae-Jun Lee , Seong-Je Kim , In Huh , Chang-Wook Jeong
CPC classification number: G06N20/00 , G06F11/3495 , G06F17/15 , G06F17/18
Abstract: A method of selecting a model of machine learning executed by a processor is provided. The method includes: receiving at least one data-set; configuring a configuration space for machine learning of the at least one data-set; extracting, from the at least one data-set, a meta-feature including quantitative information about the data-set; calculating performance of the machine learning for the at least one data-set based on a plurality of configurations included in the configuration space; executing meta-learning based on the meta-feature, the plurality of configurations, and the calculated performance; and optimizing the configuration space based on a result of executing the meta-learning.
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2.发明授权公开(公告)号：US10055829B2
公开(公告)日：2018-08-21
申请号：US15252613
申请日：2016-08-31
Applicant: Samsung Electronics Co., Ltd.
Inventor： Min-Chul Park , Je-Hyun Lee , Jeong-Hoon Ko , Young-Gu Kim , Keun-Ho Lee
CPC classification number: G06T7/0004 , G06T5/002 , G06T7/12 , G06T7/62 , G06T2207/10061 , G06T2207/20024 , G06T2207/20048 , G06T2207/20216 , G06T2207/30148
Abstract: A thickness of a first layer in a structure may be measured based on an original image of the structure. A first boundary of the first layer may be identified in the original image. A second boundary that is substantially indistinguishable in the original image may be identified based on converting the original image into a first image based on the first boundary and generating a second image based on filtering the first image. The first image may be generated based on adjusting partial image portions of the original image to align the representation of the first boundary with an axis line, such that the first image includes a representation of the first boundary that extends substantially in parallel with the axis line. The second boundary may be identified from the second image, and the thickness of the layer may be determined based on the identified first and second boundaries.
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3.发明申请公开(公告)号：US20170109896A1
公开(公告)日：2017-04-20
申请号：US15252613
申请日：2016-08-31
Applicant: Samsung Electronics Co., Ltd.
Inventor： Min-Chul Park , Je-Hyun Lee , Jeong-Hoon Ko , Young-Gu Kim , Keun-Ho Lee
CPC classification number: G06T7/0004 , G06T5/002 , G06T7/12 , G06T7/62 , G06T2207/10061 , G06T2207/20024 , G06T2207/20048 , G06T2207/20216 , G06T2207/30148
Abstract: A thickness of a first layer in a structure may be measured based on an original image of the structure. A first boundary of the first layer may be identified in the original image. A second boundary that is substantially indistinguishable in the original image may be identified based on converting the original image into a first image based on the first boundary and generating a second image based on filtering the first image. The first image may be generated based on adjusting partial image portions of the original image to align the representation of the first boundary with an axis line, such that the first image includes a representation of the first boundary that extends substantially in parallel with the axis line. The second boundary may be identified from the second image, and the thickness of the layer may be determined based on the identified first and second boundaries.
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