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公开(公告)号:US20220122908A1
公开(公告)日:2022-04-21
申请号:US17348936
申请日:2021-06-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Donguk KWON , Jiwon SHIN , Kwangbok WOO , Minseung JI
IPC: H01L23/498 , H01L23/32 , H01L23/00 , H01L23/31 , H01L25/10
Abstract: A lower semiconductor package of a package-on-package type semiconductor package includes: a package substrate; a semiconductor chip mounted on the package substrate; a chip connecting terminal disposed between the semiconductor chip and the package substrate and configured to connect the semiconductor chip to the package substrate; conductive pillars arranged on the package substrate to at least partially surround the semiconductor chip; and a dam structure configured to cover the conductive pillars on the package substrate and having a first opening at least partially surrounding the semiconductor chip.
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公开(公告)号:US20240153898A1
公开(公告)日:2024-05-09
申请号:US18387656
申请日:2023-11-07
Applicant: SAMSUNG ELECTRONICS CO. LTD.
Inventor: Minseung JI , Seungduk Baek , Aenee Jang
IPC: H01L23/00 , H01L25/065
CPC classification number: H01L24/06 , H01L24/05 , H01L24/08 , H01L25/0657 , H01L2224/05553 , H01L2224/05554 , H01L2224/05555 , H01L2224/05573 , H01L2224/05624 , H01L2224/05639 , H01L2224/05647 , H01L2224/05657 , H01L2224/05676 , H01L2224/0603 , H01L2224/06051 , H01L2224/06152 , H01L2224/06181 , H01L2224/08121 , H01L2224/08145 , H01L2224/08225 , H01L2225/0652 , H01L2225/06541 , H01L2225/06562 , H01L2225/06565
Abstract: A semiconductor package includes a lower chip including a first lower bonding pad and a second lower bonding pad, and an upper chip disposed on the lower chip, the upper chip including a first upper bonding pad and a second upper bonding pad respectively hybrid-bonded together. The first lower and upper bonding pads have a first shape in which first and second axis lengths are the same, and are disposed in a first center region of the chips. The second lower and upper bonding pads have a second shape in which third and fourth axis lengths differ, and are disposed in a first edge region which is near a corner point of the chip. In the second lower and upper bonding pads disposed in the first edge region, the third axis length is arranged in a direction perpendicular to a radial direction from the center point.
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