公开(公告)号：US20180095069A1

公开(公告)日：2018-04-05

申请号：US15720617

申请日：2017-09-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kyu Youn HWANG ,  Sung Chul SHIN ,  Jong Myeon PARK ,  Sang Hyun LEE ,  Hae Seok LEE

IPC: G01N33/50 ,  G01N33/68 ,  G01N33/493 ,  G01N15/14 ,  G01N35/00

CPC classification number: G01N33/5005 ,  B01J2219/00277 ,  G01N15/14 ,  G01N21/274 ,  G01N21/77 ,  G01N33/493 ,  G01N33/6848 ,  G01N35/00594

Abstract: A specimen analysis apparatus and measurement method thereof are provided. The specimen analysis apparatus includes: a cartridge including at least two containers, at least one of the at least two containers containing an internal standard material including a target material; and a controller configured to determine a correction value for a concentration of the target material by comparing an extent of a change in optical signal values of the target material measured in the at least two containers with a predetermined extent of change in the optical signal values of the target material..