公开(公告)号：US20190204314A1

公开(公告)日：2019-07-04

申请号：US16057206

申请日：2018-08-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seung Hyun KIM ,  Kyu Youn HWANG

IPC: G01N33/543

CPC classification number: G01N33/54386

Abstract: A sample analysis cartridge and a sample analysis apparatus having the sample analysis cartridge are provided. The sample analysis cartridge includes a housing having a sample injecting hole and a strip coupled with the housing such that a sample that is passed through the sample injecting hole is directed into the strip, and the strip is configured to detect a target material from the sample through an antigen-antibody reaction. The strip includes a membrane including a test line and a transparent cover disposed outside the membrane.

公开(公告)号：US20180345273A1

公开(公告)日：2018-12-06

申请号：US15778574

申请日：2016-11-17

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kyu Youn HWANG ,  Young Seop SEONG ,  Jong Myeon PARK ,  Jeo Young SHIM ,  Do Gyoon KIM ,  Jae Sung LEE ,  Hae Seok LEE

IPC: B01L3/00 ,  B01D39/20

CPC classification number: B01L3/502746 ,  G01N35/00029

Abstract: A fluid analysis cartridge having an improved structure in order to increase test reliability, and a fluid analysis apparatus including the same are disclosed. The fluid analysis apparatus comprises: a housing having a fluid supply part for supplying a fluid sample, and a filter member arranged such that the fluid sample supplied to the fluid supply part passes therethrough; a fluid analysis cartridge having a test unit that is connected to the housing so that the fluid sample that has passed through the filter member can be introduced and a test can be performed; and a pressure member that is arranged to pressurize the fluid analysis cartridge in order to move the fluid sample supplied to the fluid supply part to the test unit, wherein the test unit includes a first panel that has a first inflow part facing the filter member, and a second panel that is arranged to face the first panel and that has a second inflow part corresponding to the first inflow part, and the first inflow part may have a smaller width than the second inflow part.

公开(公告)号：US20170189905A1

公开(公告)日：2017-07-06

申请号：US15362953

申请日：2016-11-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jeo Young SHIM ,  Jong Myeon PARK ,  Jae Sung LEE ,  Do Gyoon KIM ,  Young Seop SEONG ,  Yeong Bae YEO ,  Hae Seok LEE ,  Kyu Youn HWANG

IPC: B01L3/00

CPC classification number: B01L3/502715 ,  B01L2200/143 ,  B01L2200/16 ,  B01L2300/021 ,  B01L2300/0663 ,  B01L2300/0864 ,  B01L2300/168

Abstract: A fluid analysis cartridge includes a reference well including a macromolecular coloring reagent having an optical characteristic that varies according to a thickness of the reference well, and a test well including a test reagent having an optical characteristic that varies according to a concentration of a component of a fluid sample that reacts with the test reagent and a thickness of the test well.

公开(公告)号：US20190195842A1

公开(公告)日：2019-06-27

申请号：US16050799

申请日：2018-07-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seung Hyun KIM ,  Kyu Youn HWANG

IPC: G01N30/74 ,  G01N30/86 ,  G06F3/0481

CPC classification number: G01N30/74 ,  B01L3/502715 ,  B01L2200/143 ,  B01L2300/0816 ,  B01L2400/0406 ,  G01N21/8483 ,  G01N30/8651 ,  G01N30/8693 ,  G01N33/54386 ,  G01N33/557 ,  G06F3/0481

Abstract: A testing apparatus and control method thereof are provided. The testing apparatus includes a detector configured to measure optical characteristic values on a control line and a test line formed on a reactor; and a controller configured to obtain an optical characteristic value measured, by the detector, on the control line, determine a reaction time corresponding to the optical characteristic value measured on the control line based on predetermined reaction time information, and determine a measurement time at which the detector is to measure another optical characteristic value on the test line based on the reaction time that is determined

公开(公告)号：US20180095069A1

公开(公告)日：2018-04-05

申请号：US15720617

申请日：2017-09-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kyu Youn HWANG ,  Sung Chul SHIN ,  Jong Myeon PARK ,  Sang Hyun LEE ,  Hae Seok LEE

IPC: G01N33/50 ,  G01N33/68 ,  G01N33/493 ,  G01N15/14 ,  G01N35/00

CPC classification number: G01N33/5005 ,  B01J2219/00277 ,  G01N15/14 ,  G01N21/274 ,  G01N21/77 ,  G01N33/493 ,  G01N33/6848 ,  G01N35/00594

Abstract: A specimen analysis apparatus and measurement method thereof are provided. The specimen analysis apparatus includes: a cartridge including at least two containers, at least one of the at least two containers containing an internal standard material including a target material; and a controller configured to determine a correction value for a concentration of the target material by comparing an extent of a change in optical signal values of the target material measured in the at least two containers with a predetermined extent of change in the optical signal values of the target material..