公开(公告)号：US10057470B2

公开(公告)日：2018-08-21

申请号：US15290481

申请日：2016-10-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sangeun Kim ,  Kiyoung Kwon ,  Kyunghwan Kim ,  Jihoon Park ,  Taeyoon An ,  Taewon Um ,  Inho Oh ,  Jaewoong Choi

IPC: H04N5/225 ,  H04N5/232 ,  G02B7/02 ,  G02B7/182

CPC classification number: H04N5/2254 ,  G02B7/02 ,  G02B7/1821 ,  G02B7/1822 ,  G02B13/0065 ,  G02B26/0816 ,  G04B3/00 ,  H04N5/2257 ,  H04N5/23293

Abstract: An electronic device and a method for photographing an image in a multi-direction is provided. The electronic device includes a case, including a display, an image sensor, and a processor, and a crown disposed on the case, the crown including a camera window. The crown is rotatable and when the crown is rotated, the camera window is rotated, and light passing through the camera window is transmitted to the image sensor.

公开(公告)号：US20220268830A1

公开(公告)日：2022-08-25

申请号：US17495487

申请日：2021-10-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Taeyoon An ,  Sangwoon Lee ,  Sungjin Kim ,  Seunghyun Kim ,  Wonki Roh ,  Chulwoo Park ,  Seongjae Byeon ,  Joohyun Jeon ,  Hyoeun Jung

IPC: G01R31/28 ,  G06F30/20 ,  G06N20/00 ,  G01T1/24

Abstract: A method for predicting a defect in a semiconductor device includes: calculating a first probability that particles will be generated in a semiconductor element by radiation; calculating a second probability that damage will occur in the semiconductor element due to the particles; generating a training data set using input data and simulation data, the input data including damage data generated using the first probability and the second probability and including at least one of a position in which the damage will occur and an amount of the damage, impurity concentration of impurities doped in at least a portion of the semiconductor element, and structural data of the semiconductor element, and the simulation data including electrical characteristics of the semiconductor element obtained as a result of a simulation based on the input data; and training a machine learning model based on the training data set to generate a defect prediction model.

公开(公告)号：US10511257B2

公开(公告)日：2019-12-17

申请号：US15609420

申请日：2017-05-31

Applicant: Samsung Electronics Co., Ltd.

Inventor： Bongjae Rhee ,  Sungsoo Moon ,  Jihoon Park ,  Kemsuk Seo ,  Taeyoon An ,  Changsu Lee ,  Jihun Heo

IPC: H02S40/30 ,  H01L31/054 ,  H02S40/38 ,  H02S40/42 ,  H01L31/0216 ,  H01L31/0224 ,  H01L31/042 ,  H01L31/075 ,  H02J3/38 ,  H02J7/00 ,  H02J7/35 ,  H02S99/00 ,  H01L27/30

Abstract: Disclosed is a photovoltaic cell including a first electrode and a second electrode having transparency and disposed facing each other, and a photovoltaic cell layer disposed between the first and second electrodes, and configured to produce electric energy by absorbing a part of incident light, wherein the photovoltaic cell layer includes a plurality of unit cells disposed in a specific distance from each other and formed with a plurality of slits for polarizing the incident light, and a transparent insulator disposed in the plurality of slits.

公开(公告)号：US20240320402A1

公开(公告)日：2024-09-26

申请号：US18544065

申请日：2023-12-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sangjune Bae ,  Taeyoon An ,  Joohyung You ,  In Huh ,  Moonhyun Cha ,  Jaemyung Choe

IPC: G06F30/27

CPC classification number: G06F30/27

Abstract: Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method selected according to a number of sample data from among a plurality of bandwidth estimation methods, estimating threshold values corresponding to a tail region of the kernel density function based on the optimal kernel bandwidths, and providing a quantitative value for quantifying uncertainty of the threshold values based on the plurality of threshold values.

公开(公告)号：US10411224B2

公开(公告)日：2019-09-10

申请号：US15937693

申请日：2018-03-27

Applicant: Samsung Electronics Co., Ltd

Inventor： Jihun Heo ,  Ji Hoon Park ,  Sung-Soo Moon ,  Kemsuk Seo ,  Taeyoon An ,  Bong Jae Rhee ,  Chang-Su Lee

IPC: H01L51/52 ,  H01L27/32 ,  H01L51/00 ,  B32B7/12 ,  B32B17/06 ,  H04M1/02

Abstract: The present disclosure relates to an electronic device with a display device having enhanced display power consumption. The electronic device includes: a housing; a transparent member disposed in at least a portion of the housing, and includes an upper surface and a lower surface; a first anti-reflection layer coupled to the upper surface of the transparent member; and a display panel coupled to at least a portion of the lower surface of the transparent member by a visually transparent adhesive member, and housed in the housing. The display panel includes: a polarizing film layer coupled to the adhesive member and including an upper surface and lower surface; a light emitting layer disposed under the lower surface of the polarizing film layer; and a second anti-reflection layer disposed on the lower surface of the polarizing film layer between the lower surface of the polarizing film layer and the light emitting layer.

公开(公告)号：US12182486B2

公开(公告)日：2024-12-31

申请号：US17491739

申请日：2021-10-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sangwoon Lee ,  Joohyun Jeon ,  Sungjin Kim ,  Seunghyun Kim ,  Wonki Roh ,  Chulwoo Park ,  Seongjae Byeon ,  Taeyoon An ,  Hyoeun Jung

IPC: G06F30/3308 ,  G06F30/25

Abstract: A method of modeling damages to a crystal caused by an incident particle includes obtaining particle information and crystal information; estimating energy loss of the incident particle based on the particle information and the crystal information; estimating a volume of a vacancy based on the energy loss; estimating a vacancy reaction based on the crystal information and the volume of the vacancy; and generating output data based on the vacancy reaction, the output data including quantification data of the damages.

公开(公告)号：US20170359018A1

公开(公告)日：2017-12-14

申请号：US15609420

申请日：2017-05-31

Applicant: Samsung Electronics Co., Ltd.

Inventor： Bongjae Rhee ,  Sungsoo Moon ,  Jihoon Park ,  Kemsuk Seo ,  Taeyoon An ,  Changsu Lee ,  Jihun Heo

IPC: H02S40/30 ,  H01L31/054 ,  H02S99/00 ,  H02S40/42 ,  H01L31/042 ,  H02J3/38 ,  H02J7/00 ,  H02S40/38 ,  H01L31/0224 ,  H01L31/075 ,  H01L31/0216 ,  H02J7/35

Abstract: Disclosed is a photovoltaic cell including a first electrode and a second electrode having transparency and disposed facing each other, and a photovoltaic cell layer disposed between the first and second electrodes, and configured to produce electric energy by absorbing a part of incident light, wherein the photovoltaic cell layer includes a plurality of unit cells disposed in a specific distance from each other and formed with a plurality of slits for polarizing the incident light, and a transparent insulator disposed in the plurality of slits.

公开(公告)号：US09094759B2

公开(公告)日：2015-07-28

申请号：US13709310

申请日：2012-12-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jin Sagong ,  Harksang Kim ,  Sangeun Kim ,  Taegyun Kim ,  Jaeyong Sim ,  Taeyoon An

IPC: H04R1/10 ,  H04M1/725 ,  H04M1/60

CPC classification number: H04R1/1041 ,  H04M1/6058 ,  H04M1/72527 ,  H04R2420/09

Abstract: A system for detecting the connection of an earphone system to a mobile device is provided. The earphone connection detecting system detects an electrical change from a mechanical change according to the insertion of the earphone jack plug of the earphone system to the jack interface of the mobile device, via a switching device electrically isolated from the earphone system, thereby identifying the connection of the earphone system to the mobile device.

Abstract translation: 提供一种用于检测耳机系统与移动设备的连接的系统。 耳机连接检测系统通过与耳机系统电隔离的开关装置，根据耳机系统的耳机插头插头插入到移动装置的插孔接口来检测机械变化的电气变化，从而识别连接 的耳机系统到移动设备。