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公开(公告)号:US20220278125A1
公开(公告)日:2022-09-01
申请号:US17747174
申请日:2022-05-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jong Seon AHN , Ji Sung CHEON , Young Jin KWON , Seok Cheon BAEK , Woong Seop LEE
IPC: H01L27/11582 , H01L27/1157 , H01L29/423 , H01L27/11573 , H01L21/28 , H01L27/11565
Abstract: A three-dimensional semiconductor device includes an upper substrate, a gate-stacked structure on the upper substrate, the gate-stacked structure including gate electrodes stacked within a memory cell array region, while being spaced apart from each other in a direction perpendicular to a surface of the upper substrate, and extending into an extension region adjacent to the memory cell array region to be arranged within the extension region to have a staircase shape, and at least one through region passing through the gate-stacked structure within the memory cell array region or the extension region, the at least one through region including a lower region and an upper region wider than the lower region.
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公开(公告)号:US20190214404A1
公开(公告)日:2019-07-11
申请号:US16257357
申请日:2019-01-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jong Seon AHN , Ji Sung CHEON , Young Jin KWON , Seok Cheon BAEK , Woong Seop LEE
IPC: H01L27/11582 , H01L27/1157 , H01L27/11565 , H01L27/11573 , H01L21/28 , H01L29/423
CPC classification number: H01L27/11582 , H01L21/28282 , H01L27/11565 , H01L27/1157 , H01L27/11573 , H01L29/4234
Abstract: A three-dimensional semiconductor device includes an upper substrate, a gate-stacked structure on the upper substrate, the gate-stacked structure including gate electrodes stacked within a memory cell array region, while being spaced apart from each other in a direction perpendicular to a surface of the upper substrate, and extending into an extension region adjacent to the memory cell array region to be arranged within the extension region to have a staircase shape, and at least one through region passing through the gate-stacked structure within the memory cell array region or the extension region, the at least one through region including a lower region and an upper region wider than the lower region.
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