公开(公告)号：US09910749B2

公开(公告)日：2018-03-06

申请号：US15191150

申请日：2016-06-23

Applicant: SANDISK TECHNOLOGIES LLC

Inventor： Nian Niles Yang ,  Jiahui Yuan ,  Grishma Shah ,  Xinde Hu ,  Lanlan Gu ,  Bin Wu

IPC: G11C16/04 ,  G06F11/20 ,  G11C16/08 ,  G11C16/10 ,  G11C16/16

CPC classification number: G06F11/2094 ,  G06F2201/805 ,  G06F2201/82 ,  G11C8/08 ,  G11C8/14 ,  G11C16/0483 ,  G11C16/08 ,  G11C16/10 ,  G11C16/16 ,  G11C16/3495 ,  G11C29/025 ,  G11C2029/1202

Abstract: A non-volatile memory system includes a plurality of non-volatile data memory cells arranged into groups of data memory cells, a plurality of select devices connected to the groups of data memory cells, a selection line connected to the select devices, a plurality of data word lines connected to the data memory cells, and one or more control circuits connected to the selection line and the data word lines. The one or more control circuits are configured to determine whether the select devices are corrupted. If the select devices are corrupted, then the one or more control circuits repurpose one of the word lines (e.g., the first data word line closet to the select devices) to be another selection line, thus operating the memory cells connected to the repurposed word line as select devices.

公开(公告)号：US20170371755A1

公开(公告)日：2017-12-28

申请号：US15191150

申请日：2016-06-23

Applicant: SANDISK TECHNOLOGIES LLC

Inventor： Nian Niles Yang ,  Jiahui Yuan ,  Grishma Shah ,  Xinde Hu ,  Lanlan Gu ,  Bin Wu

IPC: G06F11/20 ,  G11C16/04 ,  G11C16/08 ,  G11C16/16 ,  G11C16/10

CPC classification number: G06F11/2094 ,  G06F2201/805 ,  G06F2201/82 ,  G11C8/08 ,  G11C8/14 ,  G11C16/0483 ,  G11C16/08 ,  G11C16/10 ,  G11C16/16 ,  G11C16/3495 ,  G11C29/025 ,  G11C2029/1202

Abstract: A non-volatile memory system includes a plurality of non-volatile data memory cells arranged into groups of data memory cells, a plurality of select devices connected to the groups of data memory cells, a selection line connected to the select devices, a plurality of data word lines connected to the data memory cells, and one or more control circuits connected to the selection line and the data word lines. The one or more control circuits are configured to determine whether the select devices are corrupted. If the select devices are corrupted, then the one or more control circuits repurpose one of the word lines (e.g., the first data word line closet to the select devices) to be another selection line, thus operating the memory cells connected to the repurposed word line as select devices.