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    XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSING ON PRODUCTION LINE
    6.
    发明公开
    XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSING ON PRODUCTION LINE 审中-公开

    公开(公告)号：US20240035989A1

    公开(公告)日：2024-02-01

    申请号：US18258450

    申请日：2021-12-13

    申请人： SECURITY MATTERS LTD.

    发明人： Haggai ALON ,  Tehila NAHUM ,  Nataly TAL ,  Mor KAPLINSKY ,  Chen NACHMIAS ,  Ron DAFNI ,  Nadav YORAN

    IPC分类号： G01N23/207 ,  G01N23/223

    CPC分类号： G01N23/2076 ,  G01N23/223 ,  G01N2223/0766 ,  G01N2223/623 ,  G01N2223/643

    摘要： An X-Ray-Spectroscopy (XRS) inspection station is presented for inspecting objects progressing on a production line. The XRS station comprises: at least one XRS inspection system each defining an XRS inspection region and performing one or more XRS inspection sessions on the object passing through the inspection region while progressing on the production line and generating XRS inspection data piece for said object. The XRS inspection system comprises at least one emitter, each producing X-Ray or Gamma-Ray exciting radiation to excite at least a portion of the object, and at least one detection unit that detects a response of said at least portion of the object to the exciting radiation and generates corresponding XRS inspection data pieces comprising data indicative of an XRS signature of marking(s) embedded in plastic material composition of the object, said data indicative of the XRS signature being informative of one or more conditions of plastic material composition in the object. The inspection system also includes an analyzer utility adapted to, generate, based on the XRS inspection data pieces, object status in association with identification data of the respective object. Also provided at the inspection station is a control unit which is adapted to generate, based on the object status data, sorting data in relation to said object for use at a sorting station of the production line.

    METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS
    8.
    发明申请
    METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS 审中-公开

    公开(公告)号：US20200225174A1

    公开(公告)日：2020-07-16

    申请号：US16834732

    申请日：2020-03-30

    申请人： SECURITY MATTERS LTD.

    发明人： Nataly TAL ,  Mor KAPLINSKY ,  Tehila NAHUM ,  Hagit SADE ,  Dana GASPER ,  Ron DAFNI ,  Chen NACHMIAS ,  Michal FIRSTENBERG ,  Avital TRACHTMAN ,  Haggai ALON ,  Nadav YORAN ,  Tzemah KISLEV

    IPC分类号： G01N23/223 ,  C23C16/48

    摘要： Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking. Certain embodiments also disclose electronic systems including at least a first and a second electronic components/devices respectively having the first and second XRF marking compositions that enable verification of compatibility of the components. Certain embodiments disclose techniques for pairing the first and second components (e.g. devices) based a correspondence between the first and second XRF signatures/markings thereof. Certain embodiments disclose various calibration techniques for calibrating the XRF measurements of XRF markings applied to different substrate materials of the electronic components.