XRF Analyzer Activation Switch
    2.
    发明申请
    XRF Analyzer Activation Switch 有权
    XRF分析仪激活开关

    公开(公告)号:US20160054243A1

    公开(公告)日:2016-02-25

    申请号:US14886342

    申请日:2015-10-19

    申请人: Moxtek, Inc.

    IPC分类号: G01N23/223 H05G1/56

    摘要: The invention includes various electronic devices for avoiding or minimizing XRF analyzer user fatigue. In one embodiment, the XRF analyzer can include a finger sensor for activating an XRF analysis. In another embodiment, the XRF analyzer can include a finger tap switch for activating the XRF analysis. In another embodiment, the XRF analyzer can include a microphone for activating the XRF analysis by receipt of a verbal command. Additional benefits of some embodiments include improving XRF analysis safety and avoiding XRF analyzer theft.

    摘要翻译: 本发明包括用于避免或最小化XRF分析仪用户疲劳的各种电子装置。 在一个实施例中,XRF分析器可以包括用于激活XRF分析的手指传感器。 在另一个实施例中,XRF分析器可以包括用于激活XRF分析的手指分接开关。 在另一个实施例中,XRF分析器可以包括用于通过接收口头命令来激活XRF分析的麦克风。 一些实施例的附加益处包括提高XRF分析安全性并避免XRF分析仪器的盗窃。

    X-ray fluorescence spectrometer
    4.
    发明授权

    公开(公告)号:US10012605B2

    公开(公告)日:2018-07-03

    申请号:US15522944

    申请日:2016-07-01

    IPC分类号: G01N23/223 G01N23/207

    摘要: A measurement line evaluation unit (23): calculates, for all of specified measurement lines, estimated measured intensities by theoretical calculation on the basis of a composition and/or a thickness specified for a thin film; changes, by a predetermined amount, only an estimated measured intensity of one measurement line, and obtains quantitative values of the composition and/or the thickness of the thin film after change of the estimated measured intensity, for each changed measurement line, by a fundamental parameter method; and estimates a quantitative error and/or determines possibility of analysis, on the basis of the obtained quantitative values and the specified composition and/or the specified thickness.

    Docking stand for analytical instrument
    7.
    发明授权
    Docking stand for analytical instrument 有权
    分析仪器对接支架

    公开(公告)号:US07875847B2

    公开(公告)日:2011-01-25

    申请号:US12200847

    申请日:2008-08-28

    IPC分类号: G01J3/00 G01N21/00 B01D59/44

    摘要: An analytical instrument may be docked in a stand. The stand provides electrical power, cooling, gas to purge air from an analytical gap within the instrument and/or other supplies or services to the instrument. The stand contains a contactless memory, such as an RF-ID tag, which stores information about the supplies and/or services the stand is capable of providing to the instrument. The instrument reads the stand's contactless memory and automatically sets operational parameters of the instrument in accordance with the supplies and/or services the stand is capable of providing. Thus, the instrument may automatically operate in an enhanced mode, such as at a higher x-ray beam power, as a result of being mounted in the stand.

    摘要翻译: 分析仪器可以停放在支架上。 支架提供电力,冷却,气体以从仪器内的分析间隙和/或仪器的其他耗材或服务中清除空气。 支架包含非接触式存储器,例如RF-ID标签,其存储有关支架能够提供给仪器的供应和/或服务的信息。 仪器读取支架的非接触式存储器,并根据支架能够提供的耗材和/或服务自动设置仪器的操作参数。 因此,作为安装在支架中的结果,仪器可以以增强模式(例如,较高的X射线束功率)自动运行。

    Device and Method for Mapping the Distribution of an X-ray Fluorescence Marker
    8.
    发明申请
    Device and Method for Mapping the Distribution of an X-ray Fluorescence Marker 失效
    用于映射X射线荧光标记分布的装置和方法

    公开(公告)号:US20080226025A1

    公开(公告)日:2008-09-18

    申请号:US10598003

    申请日:2005-02-11

    IPC分类号: G01N23/223

    摘要: The invention relates to a method and a device for determining the distribution of an X-ray fluorescence (XRF) marker (16) in a body volume (14). The body volume (14) is irradiated with a beam of rays (12) from an X-ray source (10) with a first ray component with a quantum energy just above and a second ray component with a quantum energy just below the K-edge of the XRF marker (16). Secondary radiation emitted from the body volume (14) is detected in a location-resolved way by a detector (30). To separate the X-ray fluorescence components in the secondary radiation from background radiation, the body volume is irradiated for a second time with a beam of rays from which the first ray component has been substantially removed by a filter (22) made from the material of the XRF marker.

    摘要翻译: 本发明涉及一种用于确定身体体积(14)中的X射线荧光(XRF)标记物(16)的分布的方法和装置。 用来自X射线源(10)的射线束(12)照射具有刚好在上面的量子能的第一射线分量的体积(14),并且具有刚好低于K值的量子能量的第二射线分量, 边缘的XRF标记(16)。 通过检测器(30)以位置分辨的方式检测从体积(14)发射的次级辐射。 为了将二次辐射中的X射线荧光成分从背景辐射中分离出来,用第一射线成分基本上被该材料制成的过滤器(22)除去的射线束照射体积第二次 的XRF标记。

    XRF Analyzer Activation Switch
    9.
    发明申请

    公开(公告)号:US20170238406A1

    公开(公告)日:2017-08-17

    申请号:US15585672

    申请日:2017-05-03

    申请人: Moxtek, Inc.

    IPC分类号: H05G1/56 G01N23/223

    摘要: The invention includes various electronic devices for avoiding or minimizing XRF analyzer user fatigue. In one embodiment, the XRF analyzer can include a finger tap switch for activating the XRF analysis. In another embodiment, the XRF analyzer can include a hand sensor and a finger tap switch, activation of both required to activate the XRF analysis. In another embodiment, the XRF analyzer can include a microphone capable of receiving a verbal command from a user and a finger tap switch, both receipt of the verbal command and activation of the finger tap switch required to activate the XRF analysis. Additional benefits of some embodiments include improving XRF analysis safety and avoiding XRF analyzer theft.