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Patent Agency Ranking
公开(公告)号：US11789305B2
公开(公告)日：2023-10-17
申请号：US16924088
申请日：2020-07-08
Applicant: SEMES CO., LTD.
Inventor： Han Lim Kang , Yoon Ok Jang , Jun Seok Lee , Hyun Min Lee
IPC: G02F1/1335 , G02B5/22 , G02F1/1333 , G03F7/20
CPC classification number: G02F1/133516 , G02B5/223 , G02F1/133377 , G02F1/133512 , G03F7/202 , G03F7/2018
Abstract: A substrate, a display panel, and a substrate manufacturing method are proposed. The substrate includes a base layer; partitioning walls located on the base layer and dividing the base layer into a plurality of pixel regions, and patterns located in each of the pixel regions of the base layer, and guiding spread of a liquid drop discharged to the base layer.
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公开(公告)号：US11161337B2
公开(公告)日：2021-11-02
申请号：US16920359
申请日：2020-07-02
Applicant: SEMES CO., LTD.
Inventor： Han Lim Kang , Yoon Ok Jang , Jun Seok Lee , Hyun Min Lee
IPC: B41J2/045
Abstract: A liquid drop discharge apparatus is proposed. The liquid drop discharge apparatus includes: an inkjet head discharging ink to each of pixels of a substrate; a laser emitter coupled to the inkjet head, and emitting an aiming laser beam by which a discharged position of a liquid drop from the inkjet head to each of the pixels is aimed; a camera capturing an emitted position of the aiming laser beam on the substrate; and a position alignment unit aligning a position of the inkjet head on the basis of image data obtained from the shooting unit.
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公开(公告)号：US12097696B2
公开(公告)日：2024-09-24
申请号：US17958435
申请日：2022-10-03
Applicant: SEMES CO., LTD.
Inventor： Jae Duck Lee , Han Lim Kang , Won Yong Jin , Suk Won Jang
IPC: B41J2/125 , B41J2/045 , G01N15/1434
CPC classification number: B41J2/125 , B41J2/0454 , B41J2/04561 , G01N15/1436 , G01N2015/1438 , G01N2015/144
Abstract: Provided are a fringe information measuring apparatus that measures information on a fringe region using a temperature sensor array and a substrate treating system including the same. The fringe information measuring apparatus comprises: a laser sensor configured to output a first laser light and a second laser light to intersect each other; a thermal sensor array configured to pass through a fringe region formed by the intersection of the first laser light and the second laser light; and a control module configured to measure a position of the fringe region based on information obtained when the thermal sensor array passes through the fringe region.
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公开(公告)号：US12251944B2
公开(公告)日：2025-03-18
申请号：US17885552
申请日：2022-08-11
Applicant: SEMES CO., LTD.
Inventor： Han Lim Kang , Suk Won Jang , Jae Duck Lee , Won Yong Jin
Abstract: A meniscus measuring method capable of quickly and accurately measuring meniscus positions in a plurality of nozzles of an inkjet head can be provided. The meniscus measuring method comprises providing a head unit capable of discharging ink through a plurality of nozzles, adhering ink remaining in the plurality of nozzles to a film to form a detection pattern on the film by bringing the film into close contact with the plurality of nozzles, measuring meniscus of ink remaining in the plurality of nozzles based on the detection pattern.
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公开(公告)号：US20230134959A1
公开(公告)日：2023-05-04
申请号：US17958435
申请日：2022-10-03
Applicant: SEMES CO., LTD.
Inventor： Jae Duck LEE , Han Lim Kang , Won Yong Jin , Suk Won Jang
Abstract: Provided are a fringe information measuring apparatus that measures information on a fringe region using a temperature sensor array and a substrate treating system including the same. The fringe information measuring apparatus comprises: a laser sensor configured to output a first laser light and a second laser light to intersect each other; a thermal sensor array configured to pass through a fringe region formed by the intersection of the first laser light and the second laser light; and a control module configured to measure a position of the fringe region based on information obtained when the thermal sensor array passes through the fringe region.
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