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1.
公开(公告)号:US20170103871A1
公开(公告)日:2017-04-13
申请号:US15291193
申请日:2016-10-12
Applicant: SEMES CO., LTD.
Inventor: Jong Hwan AN , Shin-Woo NAM , Hong Won LEE , Jae Bak SHIM
CPC classification number: H01J37/32146 , G01R21/12 , G01R23/04 , G01R23/10 , G01R29/02 , H01J37/32174 , H01J37/32935 , H01J2237/334 , H02M7/04 , H03H7/24 , H03H7/38
Abstract: Disclosed are an apparatus for monitoring pulsed high-frequency power and a substrate processing apparatus including the same. The apparatus includes an attenuation module configured to attenuate a pulsed high-frequency power signal; a rectifier module configured to convert the pulsed high-frequency power signal into a direct current signal; and a detection module configured to detect a pulse parameter based on the direct current signal.
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公开(公告)号:US20210050184A1
公开(公告)日:2021-02-18
申请号:US17089041
申请日:2020-11-04
Applicant: SEMES CO., LTD.
Inventor: Jong Hwan AN , Shin-Woo NAM , Hong Won LEE , Jae Bak SHIM
Abstract: Disclosed are an apparatus for monitoring pulsed high-frequency power and a substrate processing apparatus including the same. The apparatus includes an attenuation module configured to attenuate a pulsed high-frequency power signal; a rectifier module configured to convert the pulsed high-frequency power signal into a direct current signal; and a detection module configured to detect a pulse parameter based on the direct current signal.
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