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公开(公告)号:US20170316920A1
公开(公告)日:2017-11-02
申请号:US15443212
申请日:2017-02-27
Applicant: SEMES CO., LTD.
Inventor: Harutyun MELIKYAN , Junghwan LEE , Jong Hwan AN , Shin-Woo NAM
CPC classification number: H01J37/3211 , H01J37/3244 , H01J2237/334 , H01L21/67069
Abstract: An antenna and a substrate treating process utilizing the same are provided. The antenna may extend along an imaginary baseline having predetermined curvature and comprise a section where the distance between the baseline and intersection point between the antenna and a vertical line perpendicular to the baseline changes depending on a position on the baseline.
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2.
公开(公告)号:US20170103871A1
公开(公告)日:2017-04-13
申请号:US15291193
申请日:2016-10-12
Applicant: SEMES CO., LTD.
Inventor: Jong Hwan AN , Shin-Woo NAM , Hong Won LEE , Jae Bak SHIM
CPC classification number: H01J37/32146 , G01R21/12 , G01R23/04 , G01R23/10 , G01R29/02 , H01J37/32174 , H01J37/32935 , H01J2237/334 , H02M7/04 , H03H7/24 , H03H7/38
Abstract: Disclosed are an apparatus for monitoring pulsed high-frequency power and a substrate processing apparatus including the same. The apparatus includes an attenuation module configured to attenuate a pulsed high-frequency power signal; a rectifier module configured to convert the pulsed high-frequency power signal into a direct current signal; and a detection module configured to detect a pulse parameter based on the direct current signal.
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公开(公告)号:US20170318627A1
公开(公告)日:2017-11-02
申请号:US15463319
申请日:2017-03-20
Applicant: SEMES CO., LTD.
Inventor: Jung Min WON , Ik-Jin CHOI , Hyo Seong SEONG , Shin-Woo NAM
Abstract: An embodiment includes an apparatus for controlling temperature of a substrate, an apparatus for treating a substrate comprising the same, and a method of controlling the same, which may control the temperature of the substrate by each area and not increasing the volume of the apparatus. The substrate temperature control apparatus comprises: a support plate for supporting a substrate; a plurality of heating units placed in different area of the substrate and controlling a temperature of the substrate by each area; a power supply unit for providing a power to control the temperature of the substrate; a switch unit connected between the plurality of heating units and the power supply unit, and obtaining one or more of a transistor device; and a controller for controlling a power which is supplied to each heating units by controlling unit.
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公开(公告)号:US20210050184A1
公开(公告)日:2021-02-18
申请号:US17089041
申请日:2020-11-04
Applicant: SEMES CO., LTD.
Inventor: Jong Hwan AN , Shin-Woo NAM , Hong Won LEE , Jae Bak SHIM
Abstract: Disclosed are an apparatus for monitoring pulsed high-frequency power and a substrate processing apparatus including the same. The apparatus includes an attenuation module configured to attenuate a pulsed high-frequency power signal; a rectifier module configured to convert the pulsed high-frequency power signal into a direct current signal; and a detection module configured to detect a pulse parameter based on the direct current signal.
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公开(公告)号:US20180315580A1
公开(公告)日:2018-11-01
申请号:US15962487
申请日:2018-04-25
Applicant: SEMES CO., LTD.
Inventor: Harutyun MELIKYAN , Ogsen GALSTYAN , Junghwan LEE , Jong Hwan AN , Shin-Woo NAM
CPC classification number: H01J37/32174 , H01J37/321 , H03H7/40
Abstract: Disclosed inventions are apparatus for supplying power and an apparatus for treating a substrate including the same. The apparatus for supplying power includes a high-frequency power source that provides a high-frequency power; a plasma source including first and second antennas that generates plasma by using the high-frequency power; and a power divider connected between the high-frequency power source and the plasma source to divide the high-frequency power supplied to the first and second antennas. The power divider includes a first variable device that controls the high-frequency power supplied to the first and second antennas; and a second variable device that compensates for non-linearity of the high-frequency power supplied to the first and second antennas.
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6.
公开(公告)号:US20180102238A1
公开(公告)日:2018-04-12
申请号:US15702119
申请日:2017-09-12
Applicant: SEMES CO., LTD.
Inventor: Jamyung GU , Jong Hwan AN , Shin-Woo NAM , Sooryun RO
IPC: H01J37/32 , H02N13/00 , H03H7/38 , H01L21/67 , H01L21/683
CPC classification number: H01J37/32642 , H01J37/32174 , H01J37/32183 , H01J37/32449 , H01J37/32477 , H01J37/32522 , H01J37/32715 , H01J2237/0203 , H01J2237/334 , H01L21/67069 , H01L21/67103 , H01L21/67109 , H01L21/6831 , H02N13/00 , H03H7/38
Abstract: A substrate treating apparatus includes a chamber having a treatment space in the interior thereof, a support unit that supports a substrate in the treatment space, a gas supply unit configured to supply a treatment gas into the treatment space, and a plasma source configured to generate plasma from the treatment gas. The support unit includes an electrostatic chuck, on which the substrate is positioned, a first ring surrounding a circumference of the substrate positioned on the electrostatic chuck, a second ring surrounding a circumference of the electrostatic chuck and formed of an insulation material, an insertion body disposed in the second ring and formed of a conductive material, and an impedance control unit configured to adjust an impedance of the insertion body.
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