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公开(公告)号:US20210364453A1
公开(公告)日:2021-11-25
申请号:US17287412
申请日:2019-07-22
Applicant: Shimadzu Corporation
Inventor: Satoshi SANO , Koichi TANABE , Yukihisa WADA , Satoshi TOKUDA , Akira HORIBA , Naoki MORIMOTO
IPC: G01N23/041 , G01N23/046
Abstract: This X-ray phase imaging system (100) includes an X-ray source (1), a detector (2), a first grating group (3), a second grating group (4), a moving mechanism (5), and an image processing unit (6). The moving mechanism is configured to relatively move a subject (T) and the imaging system (9) such that the subject (T) passes through a first grating region (R1) and a second grating region (R2). The image processing unit is configured to generate a first phase-contrast image (14a) and a second phase-contrast image (14b).
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公开(公告)号:US20210137476A1
公开(公告)日:2021-05-13
申请号:US17041986
申请日:2019-01-22
Applicant: SHIMADZU CORPORATION
Inventor: Satoshi SANO , Koichi TANABE , Yukihisa WADA , Satoshi TOKUDA , Akira HORIBA , Naoki MORIMOTO
Abstract: The X-ray imaging device (100) is provided with an imaging system (CS) including an X-ray source (1), a detector (5), and a plurality of gratings, a moving mechanism (8), a position information acquisition unit (7a), and an image processing unit (6) for generating a phase-contrast image (16) in a tomographic plane by acquiring a phase distribution in a tomographic plane (40) based on a plurality of X-ray images (10) and the acquired tomographic position (z+jd).
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公开(公告)号:US20210015437A1
公开(公告)日:2021-01-21
申请号:US16955312
申请日:2018-11-08
Applicant: Shimadzu Corporation
Inventor: Koichi TANABE , Yukihisa WADA , Satoshi TOKUDA , Satoshi SANO , Akira HORIBA
Abstract: In an X-ray imaging apparatus an image processor is configured to generate a phase contrast image based on a plurality of first images acquired by a first detection region (R1) at a plurality of relative positions of the first detection region with respect to a subject (T) to be imaged, and to generate an absorption image based on a plurality of second images acquired by a second detection region (R2) at a plurality of relative positions of the second detection region with respect to the subject.
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公开(公告)号:US20200249178A1
公开(公告)日:2020-08-06
申请号:US16636492
申请日:2018-09-19
Applicant: Shimadzu Corporation
Inventor: Naoki MORIMOTO , Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
IPC: G01N23/041 , A61B6/00
Abstract: A phase contrast X-ray imaging system includes an X-ray source; a plurality of gratings; a detector; a grating movement mechanism; and an image processor that generates a phase contrast image. The image processor generates the phase contrast image by using a pitch of an intensity change and a function which has the pitch as a variable and expresses the intensity change in a pixel value as a grating moves.
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公开(公告)号:US20200205761A1
公开(公告)日:2020-07-02
申请号:US16643701
申请日:2018-10-12
Applicant: Shimadzu Corporation
Inventor: Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA , Naoki MORIMOTO
Abstract: A radiation phase contrast imaging device includes an X-ray source, an X-ray detector configured to detect radiated X-rays, a plurality of gratings, an image processor configured to generate a reconstructed image from an X-ray image acquired from the X-ray detector, a display, and a controller configured or programmed to perform control to display, on the display, the X-ray image before reconstruction and the reconstructed image generated by the image processor.
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公开(公告)号:US20190167219A1
公开(公告)日:2019-06-06
申请号:US16321297
申请日:2017-07-10
Applicant: Shimadzu Corporation , OSAKA UNIVERSITY
Inventor: Satoshi SANO , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Akira HORIBA , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC: A61B6/00
Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.
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公开(公告)号:US20190072503A1
公开(公告)日:2019-03-07
申请号:US16116720
申请日:2018-08-29
Applicant: Shimadzu Corporation
Inventor: Satoshi SANO , Taro SHIRAI , Takahiro DOKI , Akira HORIBA , Naoki MORIMOTO , Kenji KIMURA , Hiroshi MIZUSHIMA
IPC: G01N23/20 , G02B5/18 , G01N23/20008 , G01N23/041 , G01N23/201
Abstract: The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction.
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公开(公告)号:US20190025232A1
公开(公告)日:2019-01-24
申请号:US16033739
申请日:2018-07-12
Applicant: Shimadzu Corporation
Inventor: Satoshi SANO , Taro SHIRAI , Takahiro DOKI , Akira HORIBA , Naoki MORIMOTO
IPC: G01N23/20
CPC classification number: G01N23/20075 , A61B6/4035 , A61B6/4291 , A61B6/484 , G01N23/041 , G01N2223/615 , G01N2223/646 , G21K2207/005
Abstract: This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.
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公开(公告)号:US20150265227A1
公开(公告)日:2015-09-24
申请号:US14663240
申请日:2015-03-19
Applicant: SHIMADZU CORPORATION
Inventor: Satoshi SANO , Toshiyuki SATO , Koichi TANABE , Toshinori YOSHIMUTA , Hiroyuki KISHIHARA , Takahiro DOKI
IPC: A61B6/00
CPC classification number: A61B6/542 , A61B6/4233 , G01T1/247
Abstract: Disclosed is an X-ray apparatus with an X-ray tube controller. The X-ray tube controller controls an X-ray tube so as for X-rays emitted from the X-ray tube to have an energy width whose upper limit is more than the minimum K-shell absorption edge of K-shell absorption edges for elements forming a conversion film and is equal to or less than a preset value depending on a K-shell absorption edge corresponding to a characteristic X-ray whose energy influences the blur. Accordingly, the less number of ejected K-shell characteristic X-rays is obtainable than the case when the emitted X-rays have an energy width whose upper limit is more than a preset value depending on the K-shell absorption edge corresponding to the characteristic X-ray whose energy influences the blur. This allows a suppressed blurred image generated from ejected K-shell characteristic X-rays outside a pixel area where X-rays enter to introduce a photoelectric effect.
Abstract translation: 公开了具有X射线管控制器的X射线装置。 X射线管控制器控制X射线管,以便从X射线管发射的X射线的能量宽度的上限大于K壳吸收边缘的最小K壳吸收边缘, 形成转换膜的元件,并且根据与其能量影响模糊的特征X射线相对应的K壳吸收边缘等于或小于预设值。 因此,与发射的X射线的上限大于预设值的能量宽度取决于与特性对应的K壳吸收边缘的情况相比,可以获得较少数量的弹出的K-壳特征X射线 X射线的能量影响模糊。 这允许由X射线进入的像素区域之外的K-shell特征X射线产生的抑制的模糊图像引入光电效应。
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公开(公告)号:US20150200323A1
公开(公告)日:2015-07-16
申请号:US14595002
申请日:2015-01-12
Applicant: SHIMADZU CORPORATION
Inventor: Takahiro DOKI , Koichi TANABE , Toshinori YOSHIMUTA , Hiroyuki KISHIHARA , Satoshi SANO
IPC: H01L31/115 , H01L31/0224 , H01L31/0296
CPC classification number: H01L31/115 , H01L27/14658 , H01L27/14661 , H01L27/14696 , H01L31/022408 , H01L31/0296
Abstract: In an X-ray strip detector, at least one joining semiconductor film are formed on surface of a sensitive semiconductor film, on the part of X-strips and Y-strips, that is sensitive to incident X-rays to generate electric charge, and on at least an entire sensitive region of a conversion film. The joining semiconductor film has higher resistance value than resistance value of the sensitive semiconductor film. Accordingly, when the electric charge generated in the sensitive semiconductor film are collected in the X-strips and the Y-strips, movement of the electric charge into other adjacent strip electrodes is avoidable. Consequently, crosstalk can be suppressed that the electric charge leak to the adjacent strip electrodes.
Abstract translation: 在X射线条检测器中,至少一个接合半导体膜形成在敏感半导体膜的X射线和Y带上对于入射的X射线敏感以产生电荷的表面上,以及 在转换膜的至少整个敏感区域上。 接合半导体膜的电阻值比敏感半导体膜的电阻值高。 因此,当在敏感半导体膜中产生的电荷被收集在X条和Y条中时,可以避免电荷进入其它相邻带状电极的运动。 因此,可以抑制电荷泄漏到相邻条状电极的串扰。
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