-
公开(公告)号：US20180279972A1
公开(公告)日：2018-10-04
申请号：US15562777
申请日：2016-03-01
申请人： SHIMADZU CORPORATION
发明人： Koichi TANABE , Shingo FURUI , Toshinori YOSHIMUTA , Kenji KIMURA , Akihiro NISHIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA , Toshiyuki SATO
CPC分类号： G01T1/2018 , A61B6/4208 , A61B6/4233 , A61B6/484
摘要： In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.
-
公开(公告)号：US20200158662A1
公开(公告)日：2020-05-21
申请号：US16319574
申请日：2017-07-10
发明人： Akira HORIBA , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC分类号： G01N23/041 , A61B6/00
摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).
-
公开(公告)号：US20190056336A1
公开(公告)日：2019-02-21
申请号：US16081249
申请日：2017-02-22
发明人： Takahiro DOKI , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Akihiro NISHIMURA , Taro SHIRAI , Satoshi SANO , Akira HORIBA , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC分类号： G01N23/041 , G01N23/20 , A61B6/00
摘要： [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration[SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.
-
4.发明申请公开(公告)号：US20180331060A1
公开(公告)日：2018-11-15
申请号：US15775538
申请日：2015-11-12
IPC分类号： H01L23/00 , H01L27/146
摘要： In a method for manufacturing a radiation detector, counter pixel electrodes 33 are formed on a counter substrate 2 at positions facing a plurality of pixel electrodes formed on a signal reading substrate, and wall bump electrodes 34 are further formed on the counter pixel electrodes 33. In order to achieve the above, a resist R is applied, and the resist R is exposed to light to form openings O. When Au sputter deposition is performed on the openings O, only some of the Au is deposited on the bottom surface in the openings O as the counter pixel electrodes 33. The rest of the Au is not deposited on the bottom surface in the openings O, and the most of the remaining Au adheres to the inner walls of the openings O to form wall bump electrodes 34. The bump electrodes 34 are cylindrical, making it possible to reduce the pressure acting on the signal reading substrate by an extent corresponding to the decrease in the bonding area in comparison to conventional bump-shaped bump electrodes. The decrease in the bonding area also makes it possible to correspondingly improve the reproducibility of forming the diameter of the electrodes, and make reliable connection possible.
-
公开(公告)号：US20180329081A1
公开(公告)日：2018-11-15
申请号：US15776809
申请日：2015-11-19
申请人： Shimadzu Corporation
IPC分类号： G01T1/24 , G01T7/00 , H01L29/47 , H01L29/872 , H01L31/108 , H01L23/00
CPC分类号： G01T1/20 , G01T1/24 , G01T7/00 , H01L27/146 , H01L27/14618 , H01L31/108 , H01L2224/16225 , H01L2224/73204
摘要： In a radiation detector, a Schottky electrode is formed such that an interdiffusion coefficient between the material of an outermost surface electrode formed on the Schottky electrode and the material of the Schottky electrode is smaller than an interdiffusion coefficient between the material of the outermost surface electrode and Al (aluminum). Consequently, the material of the outermost surface electrode does not diffuse into the Schottky electrode, and Schottky functions can be maintained, and at the same time, the material of the Schottky electrode does not diffuse into the outermost surface electrode, and the outermost surface electrode can be prevented from alloying.
-
公开(公告)号：US20180042571A1
公开(公告)日：2018-02-15
申请号：US15555663
申请日：2015-03-06
申请人： Shimadzu Corporation
发明人： Satoshi SANO , Toshiyuki SATO , Koichi TANABE , Shingo FURUI , Toshinori YOSHIMUTA , Hiroyuki KISHIHARA , Takahiro DOKI , Akira HORIBA
CPC分类号： A61B6/5258 , A61B6/4035 , A61B6/484 , A61B6/487 , G01N23/043 , G01N23/20075
摘要： Provided is a radiation phase difference imaging apparatus in which a separation distance between a phase grating and a radiation detector is optimized. The separation distance between the phase grating and a detection surface of an FPD is determined based on the magnitude of noise corruption in a self-image projected onto the detection surface. The magnitude of the effect of the noise is used as a basis for assessing the separation distance. It is determined whether a distance Zd is appropriate for imaging, based on the magnitude of noise corruption in the self-image in a self-image picture which is obtained when the distance Zd is the distance between the phase grating and the detection surface of the FPD. The separation distance can thus be optimized based on actual conditions of an actual X-ray source that emits a plurality of types of X-rays.
-
公开(公告)号：US20170067142A1
公开(公告)日：2017-03-09
申请号：US15115563
申请日：2015-01-20
申请人： Shimadzu Corporation
发明人： Akina ICHIOKA , Toshinori YOSHIMUTA , Satoshi TOKUDA , Daisuke IMAI , Satoru OZAKI , Yuu TOKUTAKE
IPC分类号： C23C14/02 , G02B5/08 , C23C16/505 , C23C14/20 , C23C16/40
CPC分类号： C23C14/024 , C22C21/00 , C23C14/205 , C23C16/402 , C23C16/505 , G02B5/0808
摘要： Provided is a structure configured such that even when resin, such as methacryl resin, exhibiting a low adhesion to a metal thin film is used, the resin and the metal thin film are firmly stacked in close contact with each other, and a film formation method capable of manufacturing a structure in which a metal thin film is, with a high adhesion, formed on a resin work exhibiting a low adhesion to the metal thin film, wherein the structure is configured such that an Al thin film 102 is, by sputtering, formed on a work W made of methacryl resin to form a stack of the work W and the Al thin film 102, and has a mixed region 101 of Al, Si, O, and C between the work W and the Al thin film 102. In the mixed region 101, Al is covalently bound to any one of Si, O, and C, or Al, Si, O, and C form a diffusion mixed layer.
摘要翻译： 提供一种构造成使得即使使用与金属薄膜具有低粘合性的树脂（例如甲基丙烯酸树脂），树脂和金属薄膜彼此紧密地层叠，并且成膜方法 能够制造在与金属薄膜具有低粘合性的树脂工件上形成金属薄膜具有高粘附性的结构，其中该结构被构造成使得Al薄膜102通过溅射， 形成在由甲基丙烯酸树脂制成的工件W上以形成工件W和Al薄膜102的堆叠，并且在工件W和Al薄膜102之间具有Al，Si，O和C的混合区域101。 在混合区域101中，Al与Si，O和C中的任一种共价结合，或Al，Si，O和C形成扩散混合层。
-
公开(公告)号：US20190175126A1
公开(公告)日：2019-06-13
申请号：US16309820
申请日：2017-03-15
申请人： Shimadzu Corporation
发明人： Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
IPC分类号： A61B6/00 , G01N23/046
摘要： Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.
-
公开(公告)号：US20180306735A1
公开(公告)日：2018-10-25
申请号：US15958188
申请日：2018-04-20
申请人： Shimadzu Corporation
发明人： Koichi TANABE , Kenji KIMURA , Toshinori YOSHIMUTA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA , Naoki MORIMOTO
IPC分类号： G01N23/041 , G01N23/083 , G01N23/20 , A61B6/00 , G01T1/164
CPC分类号： G01N23/041 , A61B6/4035 , A61B6/4291 , A61B6/4452 , A61B6/484 , G01N23/083 , G01N23/20075 , G01T1/1648 , G21K1/10
摘要： The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.
-
公开(公告)号：US20180226167A1
公开(公告)日：2018-08-09
申请号：US15890376
申请日：2018-02-07
申请人： Shimadzu Corporation
CPC分类号： G21K1/062 , G01B15/00 , G21K1/025 , G21K1/06 , G21K2207/005
摘要： The method of producing this diffraction grating includes a step of generating a moire by a periodic pattern projected onto a plurality of unit diffraction gratings and a plurality of unit diffraction gratings, and a step of adjusting so that the extending directions of the gratings are aligned by relatively rotating at least one of a plurality of unit diffractions with respect to at least one of the others of the plurality of unit diffractions.
-
-
-
-
-
-
-
-
-
搜索结果
16 条记录 (耗时 0.015 秒)
