SOLID-STATE IMAGING ELEMENT
    1.
    发明公开

    公开(公告)号:US20240284075A1

    公开(公告)日:2024-08-22

    申请号:US18292726

    申请日:2022-01-31

    摘要: To improve the image quality in a solid-state imaging element that performs differential amplification. Each of a plurality of reference pixels is provided with a reference-side amplifier transistor that supplies a reference current according to a predetermined reference potential. Each of a plurality of readout pixel circuits is provided with a readout-side amplifier transistor that supplies from a drain to a source a signal current according to a difference between a potential of a gate and the reference potential. Further, in a potential difference generation unit, a plurality of source follower transistors are arranged for each of columns of the readout pixel circuits, each source follower transistor controlling a potential difference between the gate and the drain to a predetermined value when the potential of the gate and the reference potential are initialized.

    SOLID-STATE IMAGING ELEMENT AND IMAGING DEVICE

    公开(公告)号:US20240357260A1

    公开(公告)日:2024-10-24

    申请号:US18245900

    申请日:2021-07-28

    摘要: To improve an image quality in a solid-state imaging element that performs differential amplification. A reference-side amplification transistor supplies a reference current corresponding to a predetermined reference potential. A read-side amplification transistor supplies a signal current corresponding to a difference between a potential of a gate and the reference potential from a drain to a source. A pair of reset transistors initializes the potential of the gate and the reference potential. A potential control circuit controls a potential difference between the gate and the drain to a predetermined value when the potential of the gate and the reference potential are initialized.