INTEGRATED ELECTRONIC DEVICE FOR DETECTING A LOCAL PARAMETER RELATED TO A FORCE EXPERIENCED IN A PREDETERMINED DIRECTION, WITHIN A SOLID STRUCTURE
    2.
    发明申请
    INTEGRATED ELECTRONIC DEVICE FOR DETECTING A LOCAL PARAMETER RELATED TO A FORCE EXPERIENCED IN A PREDETERMINED DIRECTION, WITHIN A SOLID STRUCTURE 有权
    用于检测与固体结构中预测方向经验的力相关的本地参数的集成电子装置

    公开(公告)号:US20140182394A1

    公开(公告)日:2014-07-03

    申请号:US14108688

    申请日:2013-12-17

    CPC classification number: G01L1/18 G01B7/18 G01L1/26 G01M5/0041 G01M5/0083

    Abstract: The integrated electronic device is for detecting a local parameter related to a force experienced in a predetermined direction within a solid structure. The device includes a semiconductor substrate having a substantially planar region that defines a plane substantially perpendicular to the predetermined direction. At least one sensor detects the local parameter at least in the predetermined direction with a piezo-resistive effect. At least one substantially planar face is arranged in a portion of the integrated electronic device, the face belonging to a inclined plane by a predetermined angle relative to the plane perpendicular to the predetermined direction, which plane is defined by the substantially planar region of the substrate. The predetermined angle is defined such as to reduce forces acting in directions other than the predetermined direction at the portion of the device around the at least one sensor.

    Abstract translation: 集成电子装置用于检测与固体结构内的预定方向上经受的力有关的局部参数。 该器件包括具有限定基本上垂直于预定方向的平面的基本平坦的区域的半导体衬底。 至少一个传感器至少在预定方向上以压阻效应来检测局部参数。 至少一个基本上平坦的面布置在集成电子设备的一部分中,该面部属于倾斜平面,相对于垂直于该预定方向的平面成预定角度,该平面由基板的基本平坦的区域限定 。 预定角度被限定为在围绕该至少一个传感器的装置的部分处减小作用于除了预定方向以外的方向的力。

    Integrated electronic device for detecting a local parameter related to a force experienced in a predetermined direction, within a solid structure
    3.
    发明授权
    Integrated electronic device for detecting a local parameter related to a force experienced in a predetermined direction, within a solid structure 有权
    集成电子装置,用于检测在固体结构内与在预定方向上经受的力有关的局部参数

    公开(公告)号:US08978483B2

    公开(公告)日:2015-03-17

    申请号:US14108688

    申请日:2013-12-17

    CPC classification number: G01L1/18 G01B7/18 G01L1/26 G01M5/0041 G01M5/0083

    Abstract: The integrated electronic device is for detecting a local parameter related to a force experienced in a predetermined direction within a solid structure. The device includes a semiconductor substrate having a substantially planar region that defines a plane substantially perpendicular to the predetermined direction. At least one sensor detects the local parameter at least in the predetermined direction with a piezo-resistive effect. At least one substantially planar face is arranged in a portion of the integrated electronic device, the face belonging to a inclined plane by a predetermined angle relative to the plane perpendicular to the predetermined direction, which plane is defined by the substantially planar region of the substrate. The predetermined angle is defined such as to reduce forces acting in directions other than the predetermined direction at the portion of the device around the at least one sensor.

    Abstract translation: 集成电子装置用于检测与固体结构内的预定方向上经受的力有关的局部参数。 该器件包括具有限定基本上垂直于预定方向的平面的基本平坦的区域的半导体衬底。 至少一个传感器至少在预定方向上以压阻效应来检测局部参数。 至少一个基本上平坦的面布置在集成电子设备的一部分中,该面部属于倾斜平面,相对于垂直于该预定方向的平面成预定角度,该平面由基板的基本平坦的区域限定 。 预定角度被限定为在围绕该至少一个传感器的装置的部分处减小作用于除了预定方向以外的方向的力。

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