Semiconductor measurement apparatus

    公开(公告)号:US12222282B2

    公开(公告)日:2025-02-11

    申请号:US18082040

    申请日:2022-12-15

    Abstract: A semiconductor measurement apparatus includes an illumination unit configured to provide illumination light including linearly polarized light beams having different wavelengths, an optical unit including an objective lens configured to allow the illumination light to be incident on a sample, the optical unit being configured to transmit reflection light generated when the illumination light is reflected from the sample, a self-interference generator configured to self-interfere the reflection light transmitted from the optical unit and transmit the reflection light to a first image sensor, for each wavelength, and a controller. The controller is configured to process a measurement image output by the image sensor to divide the measurement image into a first image representing an intensity ratio of a polarization component of the reflection light and a second image representing a phase difference of the polarization component of the reflection light, for each wavelength.

    SYSTEM AND METHOD OF OPTICAL MEASUREMENT OF NUMERICAL APERTURE OF OBJECTIVE LENS

    公开(公告)号:US20250060276A1

    公开(公告)日:2025-02-20

    申请号:US18651417

    申请日:2024-04-30

    Abstract: An optical measurement system includes a hemispherical mirror including a planar portion and a spherical portion having a hemispherical recessed shape in the planar portion. In the spherical portion are latitude markers formed with a different reflectance from the rest of the spherical portion. The system includes an optical unit with an objective lens and at least one beam splitter. The optical unit transmits light reflected from the hemispherical mirror through the objective lens to a first sensor. A controller measures a numerical aperture of the objective lens by aligning the hemispherical mirror to be at the focus of the objective lens, detecting a back focal image of the objective lens in which the latitude markers appear as darker circular lines, and performing calculations on the image.

    Method for controlling camera and electronic device therefor

    公开(公告)号:US11350033B2

    公开(公告)日:2022-05-31

    申请号:US17193474

    申请日:2021-03-05

    Abstract: Various embodiments of the present invention relate to an apparatus and a method for controlling a plurality of cameras in an electronic device. Herein, the electronic device comprises: a first camera; a second camera set to have an angle of view included in an angle of view of the first camera; a display; and a processor, wherein the processor may be configured to display, on the display, a first image acquired through the first camera of the plurality of cameras; detect information corresponding to the second camera from the first image; activate the second camera, when it is determined to activate the second camera on the basis of the information corresponding to the second camera; and display, on the display, at least one image corresponding to activation of the first camera and the second camera. Other embodiments are also possible.

    Method for controlling camera and electronic device therefor

    公开(公告)号:US10944908B2

    公开(公告)日:2021-03-09

    申请号:US16328155

    申请日:2017-06-20

    Abstract: Various embodiments of the present invention relate to an apparatus and a method for controlling a plurality of cameras in an electronic device. Herein, the electronic device comprises: a first camera; a second camera set to have an angle of view included in an angle of view of the first camera; a display; and a processor, wherein the processor may be configured to display, on the display, a first image acquired through the first camera of the plurality of cameras; detect information corresponding to the second camera from the first image; activate the second camera, when it is determined to activate the second camera on the basis of the information corresponding to the second camera; and display, on the display, at least one image corresponding to activation of the first camera and the second camera. Other embodiments are also possible.

    Method for measuring electromagnetic signal radiated from device and electronic device thereof

    公开(公告)号:US10779427B2

    公开(公告)日:2020-09-15

    申请号:US16683692

    申请日:2019-11-14

    Abstract: A method for measuring an electromagnetic (EM) signal radiated from an external electronic device and an electronic device thereof are provided. The electronic device includes a housing, a display, a first conducting unit, a second conducting unit, at least one EM sensing circuit, at least one wireless communication circuit, a processor, and a memory. The memory stores instructions of when being executed, enabling the processor to receive, by using the first conducting unit, a first signal sensed by the EM sensing circuit, and receive, by using the second conducting unit, a second signal sensed by the EM sensing circuit, and provide a signal pattern on the basis of the first signal and the second signal, and identify an external electronic device, at least partially on the basis of the signal pattern.

    Method for providing images and electronic device supporting the same

    公开(公告)号:US10326936B2

    公开(公告)日:2019-06-18

    申请号:US15226382

    申请日:2016-08-02

    Abstract: An apparatus and a method for providing images are provided. The apparatus includes an electronic device that may have a camera, and a processor configured to obtain an image that contains a plurality of objects by using the camera, display the image through a display that is functionally connected to the processor, select a partial area of the image, which includes at least a portion of at least one of the plurality of objects, based on the sizes, movements, or positions of the plurality of objects, and stabilize the image based on the selected partial area.

    Method of measuring electromagnetic signal and electronic device therefor

    公开(公告)号:US11340281B2

    公开(公告)日:2022-05-24

    申请号:US16738864

    申请日:2020-01-09

    Abstract: An electronic device and method related to measurement of an electromagnetic (EM) signal emitted from an external electronic device. The electronic device including a processor, a memory, and an EM sensor. The memory stores instructions, which, when executed, enable the processor to: obtain an input signal including an electromagnetic signal of an external electronic device and a self-noise using the EM sensor; identify an ambient condition of the electronic device; identify a compensation self-noise corresponding to the ambient condition; generate a signal pattern, based on the input signal and the compensation self-noise; and identify the external electronic device, based on at least a part of the signal pattern.

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