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公开(公告)号:US10224331B2
公开(公告)日:2019-03-05
申请号:US15911922
申请日:2018-03-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Raheel Azmat , Deepak Sharma , Su-Hyeon Kim , Chulhong Park
IPC: H01L27/092 , H01L29/06 , H01L27/02 , H01L27/118 , H01L29/775
Abstract: Provided is a semiconductor device including a substrate with first, second, and third logic cells, active patterns provided in each of the first to third logic cells to protrude from the substrate, and gate structures crossing the active patterns. The second and third logic cells are spaced apart from each other in a first direction with the first logic cell interposed therebetween. The active patterns are arranged in the first direction and extend in a second direction crossing the first direction. When measured in the first direction, a distance between the closest adjacent pair of the active patterns with each in the first and second logic cells respectively is different from that between the closest pair of the active patterns with each in the first and third logic cells respectively.
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公开(公告)号:US20180158811A1
公开(公告)日:2018-06-07
申请号:US15655125
申请日:2017-07-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kuchanuri Subhash , Rastogi Sidharth , Deepak Sharma , Chul-hong Park , Jae-seok Yang
IPC: H01L27/02 , H01L23/528 , H01L27/118 , H01L27/11 , H01L27/105
CPC classification number: H01L27/0207 , H01L23/5283 , H01L27/105 , H01L27/1104 , H01L27/1116 , H01L27/11807 , H01L2027/11875 , H01L2027/11883 , H03K19/00
Abstract: An integrated circuit (IC) device includes at least one standard cell. The at least one standard cell includes: first and second active regions respectively disposed on each of two sides of a dummy region, the first and second active regions having different conductivity types and extending in a first direction; first and second gate lines extending parallel to each other in a second direction perpendicular to the first direction across the first and second active regions, a first detour interconnection structure configured to electrically connect the first gate line with the second gate line; and a second detour interconnection structure configured to electrically connect the second gate line with the first gate line. The first and second detour interconnection structures include a lower interconnection layer extending in the first direction, an upper interconnection layer extending in the second direction, and a contact via.
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公开(公告)号:US11316032B2
公开(公告)日:2022-04-26
申请号:US16887331
申请日:2020-05-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Deepak Sharma , Hyun-jong Lee , Raheel Azmat , Chul-hong Park , Sang-jun Park
IPC: H01L29/66 , H01L27/088 , H01L27/02 , H01L23/528 , H01L27/092 , H01L21/8238
Abstract: Provided is an integrated circuit including at least one cell, the at least one cell includes first and second active regions spaced apart from each other, a dummy region disposed between the first and second active regions, at least one first active fin disposed in the first active region and extending in a first direction, at least one second active fin extending along the first direction over the entire length of the second active region, and an active gate line extending in a second direction that is substantially perpendicular to the first direction, wherein the active gate line vertically overlaps the first active region and the dummy region and does not vertically overlap the second active region.
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公开(公告)号:US10546855B2
公开(公告)日:2020-01-28
申请号:US15473913
申请日:2017-03-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Rajeev Ranjan , Deepak Sharma , Subhash Kuchanuri , Chul Hong Park , Jae Seok Yang , Kwan Young Chun
IPC: H01L27/088 , H01L23/528 , H01L27/02 , H01L29/06 , H01L27/092 , H01L23/522
Abstract: Integrated circuit devices are provided. The IC devices may include an active region extending in a first direction, first and second gate electrodes extending in a second direction, a first impurity region in the active region adjacent a first side of the first gate electrode, a second impurity region in the active region between a second side of the first gate electrode and a first side of the second gate electrode, a third impurity region in the active region adjacent a second side of the second gate electrode, a cross gate contact electrically connecting the first and second impurity regions, a first contact electrically connected to the third impurity region, a first wire electrically connected to the cross gate contact, and a second wire electrically connected to the first contact. The first and second wires may extend only in the first direction and may be on the same line.
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公开(公告)号:US10720429B2
公开(公告)日:2020-07-21
申请号:US16390431
申请日:2019-04-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Deepak Sharma , Hyun-jong Lee , Raheel Azmat , Chul-hong Park , Sang-jun Park
IPC: H01L27/088 , H01L27/02 , H01L23/528 , H01L27/092 , H01L29/66 , H01L21/8238
Abstract: Provided is an integrated circuit including at least one cell, the at least one cell includes first and second active regions spaced apart from each other, a dummy region disposed between the first and second active regions, at least one first active fin disposed in the first active region and extending in a first direction, at least one second active fin extending along the first direction over the entire length of the second active region, and an active gate line extending in a second direction that is substantially perpendicular to the first direction, wherein the active gate line vertically overlaps the first active region and the dummy region and does not vertically overlap the second active region.
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公开(公告)号:US11282836B2
公开(公告)日:2022-03-22
申请号:US16894045
申请日:2020-06-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Deepak Sharma , Hyun-jong Lee , Raheel Azmat , Chul-hong Park , Sang-jun Park
IPC: H01L29/76 , H01L29/94 , H01L27/088 , H01L27/02 , H01L23/528 , H01L27/092 , H01L29/66 , H01L21/8238
Abstract: Provided is an integrated circuit including at least one cell, the at least one cell includes first and second active regions spaced apart from each other, a dummy region disposed between the first and second active regions, at least one first active fin disposed in the first active region and extending in a first direction, at least one second active fin extending along the first direction over the entire length of the second active region, and an active gate line extending in a second direction that is substantially perpendicular to the first direction, wherein the active gate line vertically overlaps the first active region and the dummy region and does not vertically overlap the second active region.
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公开(公告)号:US11610356B2
公开(公告)日:2023-03-21
申请号:US17121048
申请日:2020-12-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Deepak Sharma , Kamya Jaiswal , Akshar Bhatnagar , Asif Anis , Nitin Tanwar , Pratush Kumar Srivastava , Sushant Vobbilisetty
Abstract: A method for providing sign language is disclosed. The method includes receiving, by an electronic device, a natural language information input from at least one source for conversion into sign language. The natural language information input includes at least one sentence. The method further includes predicting, by the electronic device, an emphasis score for each word of the at least one sentence based on acoustic components. The method further includes rephrasing, by the electronic device, the at least one sentence based on the emphasis score of each of the words. The method further includes converting, by the electronic device, the at least one rephrased sentence into the sign language. The method further includes delivering, by the electronic device, the sign language.
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公开(公告)号:US10297596B2
公开(公告)日:2019-05-21
申请号:US15496507
申请日:2017-04-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Deepak Sharma , Hyun-jong Lee , Raheel Azmat , Chul-hong Park , Sang-jun Park
IPC: H01L27/088 , H01L27/02 , H01L23/528 , H01L27/092 , H01L29/66 , H01L21/8238
Abstract: Provided is an integrated circuit including at least one cell, the at least one cell includes first and second active regions spaced apart from each other, a dummy region disposed between the first and second active regions, at least one first active fin disposed in the first active region and extending in a first direction, at least one second active fin extending along the first direction over the entire length of the second active region, and an active gate line extending in a second direction that is substantially perpendicular to the first direction, wherein the active gate line vertically overlaps the first active region and the dummy region and does not vertically overlap the second active region.
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公开(公告)号:US10249605B2
公开(公告)日:2019-04-02
申请号:US15655125
申请日:2017-07-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kuchanuri Subhash , Rastogi Sidharth , Deepak Sharma , Chul-hong Park , Jae-seok Yang
IPC: H01L27/02 , H01L23/528 , H01L27/118 , H01L27/11 , H01L27/105 , H03K19/00
Abstract: An integrated circuit (IC) device includes at least one standard cell. The at least one standard cell includes: first and second active regions respectively disposed on each of two sides of a dummy region, the first and second active regions having different conductivity types and extending in a first direction; first and second gate lines extending parallel to each other in a second direction perpendicular to the first direction across the first and second active regions, a first detour interconnection structure configured to electrically connect the first gate line with the second gate line; and a second detour interconnection structure configured to electrically connect the second gate line with the first gate line. The first and second detour interconnection structures include a lower interconnection layer extending in the first direction, an upper interconnection layer extending in the second direction, and a contact via.
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