Method of forming semiconductor device having stressor
    1.
    发明授权
    Method of forming semiconductor device having stressor 有权
    形成具有应力源的半导体器件的方法

    公开(公告)号:US09299812B2

    公开(公告)日:2016-03-29

    申请号:US14591465

    申请日:2015-01-07

    Inventor: Jun-Suk Kim

    Abstract: Provided are methods of forming a semiconductor device having an embedded stressor. The method includes forming a fin active area on a substrate. A gate structure configured to cross the fin active area and cover a side surface of the fin active area, and a gate spacer on a sidewall of the gate structure are formed. Preliminary trenches are formed in the fin active area adjacent to both sides of the gate structure using an anisotropic etching process. An etching select area is formed by oxidizing the fin active area exposed to the preliminary trenches. Trenches are formed by removing the etching select area. A stressor is formed in each of the trenches.

    Abstract translation: 提供了形成具有嵌入式应力源的半导体器件的方法。 该方法包括在衬底上形成翅片有源区。 栅极结构,其被配置为跨过鳍片有源区域并覆盖翅片有源区域的侧表面,并且形成栅极结构的侧壁上的栅极间隔物。 使用各向异性蚀刻工艺在与栅极结构的两侧相邻的翅片有源区域中形成初步沟槽。 通过氧化暴露于初始沟槽的翅片活动区域来形成蚀刻选择区域。 通过去除蚀刻选择区域形成沟槽。 在每个沟槽中形成应力源。

    METHODS OF FORMING SEMICONDUCTOR DEVICES INCLUDING AN EMBEDDED STRESSOR, AND RELATED APPARATUSES
    3.
    发明申请
    METHODS OF FORMING SEMICONDUCTOR DEVICES INCLUDING AN EMBEDDED STRESSOR, AND RELATED APPARATUSES 有权
    形成嵌入式压力器的半导体器件的方法及相关装置

    公开(公告)号:US20150140757A1

    公开(公告)日:2015-05-21

    申请号:US14323007

    申请日:2014-07-03

    Abstract: Methods of forming semiconductor devices are provided. A method of forming a semiconductor device includes forming preliminary trenches adjacent opposing sides of an active region. The method includes forming etching selection regions in portions of the active region that are exposed after forming the preliminary trenches. The method includes forming trenches by removing the etching selection regions. Moreover, the method includes forming a stressor in the trenches. Related apparatuses are also provided.

    Abstract translation: 提供了形成半导体器件的方法。 形成半导体器件的方法包括在有源区的相对侧邻近地形成预备沟槽。 该方法包括在形成预备沟槽之后暴露的有源区的部分形成蚀刻选择区。 该方法包括通过去除蚀刻选择区域来形成沟槽。 此外,该方法包括在沟槽中形成应力源。 还提供了相关装置。

    Methods of forming semiconductor devices including an embedded stressor, and related apparatuses
    5.
    发明授权
    Methods of forming semiconductor devices including an embedded stressor, and related apparatuses 有权
    形成包括嵌入式应力源的半导体器件的方法及相关装置

    公开(公告)号:US09240460B2

    公开(公告)日:2016-01-19

    申请号:US14323007

    申请日:2014-07-03

    Abstract: Methods of forming semiconductor devices are provided. A method of forming a semiconductor device includes forming preliminary trenches adjacent opposing sides of an active region. The method includes forming etching selection regions in portions of the active region that are exposed after forming the preliminary trenches. The method includes forming trenches by removing the etching selection regions. Moreover, the method includes forming a stressor in the trenches. Related apparatuses are also provided.

    Abstract translation: 提供了形成半导体器件的方法。 形成半导体器件的方法包括在有源区的相对侧邻近地形成预备沟槽。 该方法包括在形成预备沟槽之后暴露的有源区的部分形成蚀刻选择区。 该方法包括通过去除蚀刻选择区域来形成沟槽。 此外,该方法包括在沟槽中形成应力源。 还提供了相关装置。

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