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公开(公告)号：US10942216B2
公开(公告)日：2021-03-09
申请号：US15958387
申请日：2018-04-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung-Yeol Kim , Jae-Hong Kim , Kyung-Min Lee , Mee-Hyun Lim
Abstract: An interconnect circuit testing apparatus including: an electric signal generating circuit for generating an electric signal; a first electrode arranged at a first region of a substrate, wherein the substrate includes an interconnect circuit, an upper surface and a lower surface; a second electrode arranged at a second region of the substrate; and a sensor for detecting an electric field emitted from the first region or the second region when the electric signal is applied to the substrate through the first electrode and the second electrode.
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2.发明授权公开(公告)号：US10984790B2
公开(公告)日：2021-04-20
申请号：US16202932
申请日：2018-11-28
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyeon-Taek Lim , Sang-Yoon Kim , Kyung-Min Lee , Chang-Woo Han , Nam-Hoon Kim , Jong-Youb Ryu , Chi-Youn Park , Jae-Won Lee
Abstract: A speech recognition device is provided. The speech recognition device includes at least one microphone configured to receive a sound signal from a first sound source, and at least one processor configured to determine a direction of the first sound source based on the sound signal, determine whether the direction of the first sound source is in a registered direction, and based on whether the direction of the first sound source is in the registered direction, recognize a speech from the sound signal regardless of whether the sound signal comprises a wake-up keyword.
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Patent Agency Ranking
3.发明申请公开(公告)号：US20160127085A1
公开(公告)日：2016-05-05
申请号：US14932837
申请日：2015-11-04
Inventor： Sang-Hyo Kim , Hyun-Seok Ryu , Seung-Hoon Park , Peng Xue , Myung-Hoon Ko , Kyung-Min Lee , Min Jang
CPC classification number: H04L5/0001 , H03M13/23 , H03M13/2757 , H03M13/276 , H04L1/00
Abstract: The present disclosure relates to a pre-5G or 5G communication system to be provided for supporting higher data rates beyond a 4G communication system, such as Long Term Evolution (LTE). Disclosed are a method and an apparatus for performing interleaving by using an identical interleaving bit generation method in multiple interleavers included in a communication system. The present disclosure provides a method for interleaving an input bit sequence by an interleaver of a multiple access communication system. The method includes setting a common parameter used by multiple interleavers; setting a unique parameter for the interleaver in view of a correlation between bit sequences which are input to the multiple interleavers; and interleaving the input bit sequence by using prime-power depending on the common parameter and the unique parameter.
Abstract translation: 本公开涉及要提供用于支持超越4G通信系统（诸如长期演进（LTE））的更高数据速率的前5G或5G通信系统。 公开了一种通过在通信系统中包括的多个交织器中使用相同的交织比特生成方法来执行交织的方法和装置。 本公开提供了一种用于由多址通信系统的交织器交织输入比特序列的方法。 该方法包括设置多个交织器使用的公共参数; 鉴于输入到多个交织器的比特序列之间的相关性，设置交织器的唯一参数; 并且根据公共参数和唯一参数通过使用素数来交织输入比特序列。
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公开(公告)号：US11047901B2
公开(公告)日：2021-06-29
申请号：US16437675
申请日：2019-06-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Mee-Hyun Lim , Sung-Yeol Kim , Seong-Keun Cho , Won-Don Joo , Jae-Hong Kim , Taek-Jin Kim , Kyung-Min Lee , Sang-Min Lee
IPC: G01R31/26 , G01N21/21 , G01R1/07 , G01R31/308
Abstract: In a method of testing an interconnection substrate, a blocking condition of a reference light reflected from a probe having an intrinsic optical characteristic may be set. An electric field emitted from a test interconnection substrate having a plurality of circuits may change the intrinsic optical characteristics of the probe into test optical characteristics. Light may be irradiated to the probe having the test optical characteristics. The reference light reflected from the probe having the test optical characteristic may be blocked in accordance with the blocking condition. The remaining reflected light that may be due to an abnormal circuit may be detected.
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公开(公告)号：US20190113565A1
公开(公告)日：2019-04-18
申请号：US15958387
申请日：2018-04-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung-Yeol Kim , Jae-Hong Kim , Kyung-Min Lee , Mee-Hyun Lim
Abstract: An interconnect circuit testing apparatus including: an electric signal generating circuit for generating an electric signal; a first electrode arranged at a first region of a substrate, wherein the substrate includes an interconnect circuit, an upper surface and a lower surface; a second electrode arranged at a second region of the substrate; and a sensor for detecting an electric field emitted from the first region or the second region when the electric signal is applied to the substrate through the first electrode and the second electrode.
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公开(公告)号：US10306581B2
公开(公告)日：2019-05-28
申请号：US15578052
申请日：2016-06-08
Inventor： Hyunseok Ryu , Sang-Hyo Kim , Jong-Hwan Kim , Seung-Hoon Park , Peng Xue , Kyung-Min Lee , Min Jang
Abstract: The present disclosure relates to a pre-5th-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4th-Generation (4G) communication system such as Long Term Evolution (LTE). A reception method for an electronic device of the present disclosure comprises the steps of: receiving, from a transmission device, first location information including information on the coverage area of the transmission device; generating second location information using the first location information and location information of the electronic device; and determining location information of the transmission device using the second location information and information on the coverage area of the electronic device.
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公开(公告)号：US09960889B2
公开(公告)日：2018-05-01
申请号：US14932837
申请日：2015-11-04
Inventor： Sang-Hyo Kim , Hyun-Seok Ryu , Seung-Hoon Park , Peng Xue , Myung-Hoon Ko , Kyung-Min Lee , Min Jang
CPC classification number: H04L5/0001 , H03M13/23 , H03M13/2757 , H03M13/276 , H04L1/00
Abstract: A pre-5G or 5G communication system to be provided for supporting higher data rates beyond a 4G communication system, such as Long Term Evolution (LTE). Disclosed are a method and an apparatus for performing interleaving by using an identical interleaving bit generation method in multiple interleavers included in a communication system. The present disclosure provides a method for interleaving an input bit sequence by an interleaver of a multiple access communication system. The method includes setting a common parameter used by multiple interleavers; setting a unique parameter for the interleaver in view of a correlation between bit sequences which are input to the multiple interleavers; and interleaving the input bit sequence by using prime-power depending on the common parameter and the unique parameter.
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