Abstract:
A semiconductor device includes a first transistor on a first region of a substrate, and a second transistor on a second region of the substrate. The first transistor includes a first gate insulating layer including a first interfacial insulating layer, a first lower high-κ dielectric layer, and a first composite dielectric layer, sequentially stacked on each of first semiconductor channel layers. The second transistor includes a second gate insulating layer including a second interfacial insulating layer, a second lower high-κ dielectric layer, a second composite dielectric layer, and a second upper high-κ dielectric layer, sequentially stacked on each of second semiconductor channel layers. The first and the second lower high-κ dielectric layers include a first metal element, the second upper high-κ dielectric layer includes a second metal element, and the first and the second composite dielectric layers include both of the first and the second metal elements.
Abstract:
According to an example embodiment, a variable resistance memory device includes a lower electrode that includes a spacer-shaped first sub lower electrode and a second sub lower electrode covering a curved sidewall of the first sub lower electrode. The second sub lower electrode extends upward to protrude above the top of the first sub lower electrode. The lower electrode includes an upward-tapered shape.