Abstract:
A memory device may include a data output circuit configured to multiplex a plurality of data signals read from a memory cell array, wherein the data output circuit includes a clock boosting circuit configured to receive a plurality of internal clock signals generated based on a first power voltage, and to generate a plurality of boosted clock signals by boosting the plurality of internal clock signals based on a second power voltage having a voltage level greater than that of the first power voltage, and a data output driver configured to multiplex and output the plurality of data signals synchronized with the boosted clock signals.
Abstract:
A delay locked loop (DLL) circuit having improved noise characteristics. The DLL circuit includes a first divider for generating a first divided signal by dividing an external clock; a second divider for generating a second divided signal by dividing an internal clock; a phase detector for detecting a phase difference between the first divided signal and the second divided signal; and an adjusting unit for synchronizing the internal clock and the external clock, based on the phase difference.