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公开(公告)号:US09299811B2
公开(公告)日:2016-03-29
申请号:US14519771
申请日:2014-10-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Wook-Je Kim , Jae-Yup Chung , Jong-Seo Hong , Cheol Kim , Hee-Soo Kang , Hyun-Jo Kim , Hee-Don Jeong , Soo-Hun Hong , Sang-Bom Kang , Myeong-Cheol Kim , Young-Su Chung
IPC: H01L29/66 , H01L21/8234 , H01L29/78 , H01L29/165
CPC classification number: H01L29/66795 , H01L21/823431 , H01L21/823481 , H01L29/165 , H01L29/66545 , H01L29/7848
Abstract: Semiconductor devices may include first and second fins that protrude from a substrate, extend in a first direction, and are separated from each other in the first direction. Semiconductor devices may also include a field insulating layer that is disposed between the first and second fins to extend in a second direction intersecting the first direction, an etch-stop layer pattern that is formed on the field insulating layer and a dummy gate structure that is formed on the etch-stop layer pattern.
Abstract translation: 半导体器件可以包括从基板突出的第一和第二鳍片,沿第一方向延伸,并且在第一方向上彼此分离。 半导体器件还可以包括场绝缘层,其设置在第一和第二鳍之间,沿与第一方向相交的第二方向延伸,形成在场绝缘层上的蚀刻停止层图案和伪栅极结构, 形成在蚀刻停止层图案上。
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公开(公告)号:US20150147860A1
公开(公告)日:2015-05-28
申请号:US14519771
申请日:2014-10-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Wook-Je Kim , Jae-Yup Chung , Jong-Seo Hong , Cheol Kim , Hee-Soo Kang , Hyun-Jo Kim , Hee-Don Jeong , Soo-Hun Hong , Sang-Bom Kang , Myeong-Cheol Kim , Young-Su Chung
IPC: H01L29/66
CPC classification number: H01L29/66795 , H01L21/823431 , H01L21/823481 , H01L29/165 , H01L29/66545 , H01L29/7848
Abstract: Semiconductor devices may include first and second fins that protrude from a substrate, extend in a first direction, and are separated from each other in the first direction. Semiconductor devices may also include a field insulating layer that is disposed between the first and second fins to extend in a second direction intersecting the first direction, an etch-stop layer pattern that is formed on the field insulating layer and a dummy gate structure that is formed on the etch-stop layer pattern.
Abstract translation: 半导体器件可以包括从基板突出的第一和第二鳍片,沿第一方向延伸,并且在第一方向上彼此分离。 半导体器件还可以包括场绝缘层,其设置在第一和第二鳍之间,沿与第一方向相交的第二方向延伸,形成在场绝缘层上的蚀刻停止层图案和伪栅极结构, 形成在蚀刻停止层图案上。
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