Internal voltage source generator in semiconductor memory device
    1.
    发明授权
    Internal voltage source generator in semiconductor memory device 有权
    半导体存储器件内部电压源发生器

    公开(公告)号:US06774712B2

    公开(公告)日:2004-08-10

    申请号:US10331602

    申请日:2002-12-31

    IPC分类号: G05F110

    CPC分类号: G05F1/465

    摘要: In this circuit, an external voltage source is supplied or down converted in response to a normal operating mode to provide the internal voltage source of a first level to the internal circuit. The external voltage source is converted to a voltage of a second level, lower than the first level, in response to a low consumption power mode having a complementary relation with the normal mode.

    摘要翻译: 在该电路中,响应于正常操作模式,提供或降低外部电压源,以向内部电路提供第一电平的内部电压源。 响应于与正常模式具有互补关系的低功耗模式,外部电压源被转换成低于第一电平的第二电平的电压。

    Temperature detection circuit and temperature detection method
    2.
    发明授权
    Temperature detection circuit and temperature detection method 有权
    温度检测电路和温度检测方法

    公开(公告)号:US07082070B2

    公开(公告)日:2006-07-25

    申请号:US10875003

    申请日:2004-06-22

    申请人: Sang-Pyo Hong

    发明人: Sang-Pyo Hong

    IPC分类号: G11C7/04 G11C7/00

    摘要: A temperature detection circuit and method are provided. The temperature detection circuit samples a first delay time for an input signal at a target temperature to be detected, stores a first addresses generated as the sampled result, samples a second delay time for the input address at a present operating temperature, compares a second addresses generated as the sampled result with the first addresses, and generates a detection signal if the target temperature to be detected is the same as the present operating temperature. The temperature detection method is performed by the temperature detection circuit.

    摘要翻译: 提供了一种温度检测电路和方法。 温度检测电路对要检测的目标温度的输入信号采样第一延迟时间,存储作为采样结果产生的第一地址,对当前工作温度下的输入地址采样第二延迟时间,比较第二地址 产生为具有第一地址的采样结果,并且如果要检测的目标温度与当前工作温度相同,则产生检测信号。 温度检测方法由温度检测电路进行。

    Seal pattern for liquid crystal display device including first, second and third dummy seal patterns in non-active area
    3.
    发明授权
    Seal pattern for liquid crystal display device including first, second and third dummy seal patterns in non-active area 有权
    液晶显示装置的密封图案包括非活动区域中的第一,第二和第三虚拟密封图案

    公开(公告)号:US06836311B2

    公开(公告)日:2004-12-28

    申请号:US10409571

    申请日:2003-04-09

    申请人: Sang-Pyo Hong

    发明人: Sang-Pyo Hong

    IPC分类号: G02F11339

    CPC分类号: G02F1/1339

    摘要: A seal pattern for a liquid crystal display device includes a substrate having an active area and a non-active area, a main seal pattern having an injection hole arranged in a boundary between the active and non-active areas, and first, second, and third dummy-seal patterns in the non-active area that are arranged along a same direction as a portion of the main seal pattern having the injection hole and spaced apart from each other. The first and second dummy-seal patterns have first and second openings corresponding to opposite ends of the injection hole. The third dummy-seal pattern has third, fourth, and fifth openings arranged alternately in correspondence with the first and second openings.

    摘要翻译: 用于液晶显示装置的密封图案包括具有有效面积和非有效面积的基底,主密封图案,其具有布置在活性区域和非活性区域之间的边界中的注入孔,以及第一,第二和/ 非活性区域中的第三虚拟密封图案沿着与具有喷射孔的主密封图案的一部分相同的方向布置并彼此间隔开。 第一和第二虚拟密封图案具有对应于注入孔的相对端的第一和第二开口。 第三虚拟密封图案具有与第一和第二开口相对应地交替设置的第三,第四和第五开口。

    Method of configuring memory cell array block, method of addressing the same, semiconductor memory device and memory cell array block
    4.
    发明授权
    Method of configuring memory cell array block, method of addressing the same, semiconductor memory device and memory cell array block 失效
    配置存储单元阵列块的方法,寻址方法,半导体存储器件和存储单元阵列块

    公开(公告)号:US07227807B2

    公开(公告)日:2007-06-05

    申请号:US11302606

    申请日:2005-12-14

    IPC分类号: G11C8/00

    CPC分类号: G11C8/12

    摘要: A method of configuring a memory cell array block includes dividing a first unit logic block into sub-array blocks and assigning a portion of the sub-array blocks to a second unit logic block, wherein the memory cell array block corresponds to the portion of the sub-array blocks and the second unit logic block, and the portion of the sub-array blocks and the second unit logic block share a peripheral circuit. The first unit logic block may be divided into the sub-array blocks based on a unit of a word line and/or a unit of a bit line. The peripheral circuit may include a row decoder, a column decoder, a sense amplifier and/or an equalize/precharge circuit. A related addressing method, a memory cell array block and semiconductor memory device are also provided.

    摘要翻译: 配置存储单元阵列块的方法包括将第一单元逻辑块划分为子阵列块并将子阵列块的一部分分配给第二单位逻辑块,其中存储单元阵列块对应于 子阵列块和第二单元逻辑块,并且子阵列块的部分和第二单元逻辑块共享外围电路。 第一单元逻辑块可以基于字线的单位和/或位线的单位被划分为子阵列块。 外围电路可以包括行解码器,列解码器,读出放大器和/或均衡/预充电电路。 还提供了相关寻址方法,存储单元阵列块和半导体存储器件。

    Memory core and semiconductor memory device having the same
    5.
    发明申请
    Memory core and semiconductor memory device having the same 失效
    存储器芯和半导体存储器件具有相同的功能

    公开(公告)号:US20070109904A1

    公开(公告)日:2007-05-17

    申请号:US11590313

    申请日:2006-10-31

    IPC分类号: G11C8/00

    摘要: A memory core includes a first sub-memory array including a plurality of first memory cells, a second sub-memory array including a plurality of second memory cells, a bit line amplification circuit configured to amplify a voltage difference between the first bit line and the second bit line, and a column selection circuit including a first column selection transistor and a second column selection transistor, wherein the first and the second selection transistors share a drain and electrically couple the complementary bit line pair to a complementary local input/output line pair, respectively. As a result, the data error due to the distance mismatching can be reduced.

    摘要翻译: 存储器芯包括包括多个第一存储器单元的第一子存储器阵列,包括多个第二存储单元的第二子存储器阵列,位线放大电路,被配置为放大第一位线和第二存储器单元之间的电压差 第二位线和包括第一列选择晶体管和第二列选择晶体管的列选择电路,其中第一和第二选择晶体管共享漏极,并将互补位线对电耦合到互补的本地输入/输出线对 , 分别。 结果,可以减少由于距离不匹配引起的数据错误。

    Semiconductor device, method of manufacturing the same, sense amplifier and method of forming the same
    6.
    发明授权
    Semiconductor device, method of manufacturing the same, sense amplifier and method of forming the same 有权
    半导体器件及其制造方法,感光放大器及其形成方法

    公开(公告)号:US07605409B2

    公开(公告)日:2009-10-20

    申请号:US11673403

    申请日:2007-02-09

    IPC分类号: H01L27/108

    摘要: A semiconductor device includes first and second unit circuits. Each first unit circuit has first transistors connected in series, wherein each of the first transistors includes a first gate structure having a pitch. Each second unit circuit has second transistors connected in series, wherein each of the second transistors includes a second gate structure having the pitch. A third transistor and a fourth transistor electrically isolate each of the first and second unit circuits, respectively. An insulation layer covers the first through the fourth transistors. Plugs in the insulation layer are connected to a first gate structure, a second gate structure, a first source region, a first drain region, a second source region or a second drain region. A wiring is connected to the plugs.

    摘要翻译: 半导体器件包括第一和第二单元电路。 每个第一单元电路具有串联连接的第一晶体管,其中每个第一晶体管包括具有间距的第一栅极结构。 每个第二单元电路具有串联连接的第二晶体管,其中每个第二晶体管包括具有间距的第二栅极结构。 第三晶体管和第四晶体管分别电隔离第一和第二单元电路中的每一个。 绝缘层覆盖第一至第四晶体管。 绝缘层中的插塞连接到第一栅极结构,第二栅极结构,第一源极区域,第一漏极区域,第二源极区域或第二漏极区域。 接线连接到插头。

    Method of configuring memory cell array block, method of addressing the same, semiconductor memory device and memory cell array block
    7.
    发明申请
    Method of configuring memory cell array block, method of addressing the same, semiconductor memory device and memory cell array block 失效
    配置存储单元阵列块的方法,寻址方法,半导体存储器件和存储单元阵列块

    公开(公告)号:US20060126419A1

    公开(公告)日:2006-06-15

    申请号:US11302606

    申请日:2005-12-14

    IPC分类号: G11C8/00

    CPC分类号: G11C8/12

    摘要: A method of configuring a memory cell array block includes dividing a first unit logic block into sub-array blocks and assigning a portion of the sub-array blocks to a second unit logic block, wherein the memory cell array block corresponds to the portion of the sub-array blocks and the second unit logic block, and the portion of the sub-array blocks and the second unit logic block share a peripheral circuit. The first unit logic block may be divided into the sub-array blocks based on a unit of a word line and/or a unit of a bit line. The peripheral circuit may include a row decoder, a column decoder, a sense amplifier and/or an equalize/precharge circuit. A related addressing method, a memory cell array block and semiconductor memory device are also provided.

    摘要翻译: 配置存储单元阵列块的方法包括将第一单元逻辑块划分为子阵列块并将子阵列块的一部分分配给第二单位逻辑块,其中存储单元阵列块对应于 子阵列块和第二单元逻辑块,并且子阵列块的部分和第二单元逻辑块共享外围电路。 第一单元逻辑块可以基于字线的单位和/或位线的单位被划分为子阵列块。 外围电路可以包括行解码器,列解码器,读出放大器和/或均衡/预充电电路。 还提供了相关寻址方法,存储单元阵列块和半导体存储器件。

    Seal pattern for liquid crystal display device
    8.
    发明申请
    Seal pattern for liquid crystal display device 有权
    液晶显示装置的密封图案

    公开(公告)号:US20050088603A1

    公开(公告)日:2005-04-28

    申请号:US10989502

    申请日:2004-11-17

    申请人: Sang-Pyo Hong

    发明人: Sang-Pyo Hong

    IPC分类号: G02F1/1339

    CPC分类号: G02F1/1339

    摘要: A seal pattern for a liquid crystal display device includes a substrate having an active area and a non-active area, a main seal pattern having an injection hole arranged in a boundary between the active and non-active areas, and first, second, and third dummy-seal patterns in the non-active area that are arranged along a same direction as a portion of the main seal pattern having the injection hole and spaced apart from each other. The first and second dummy-seal patterns have first and second openings corresponding to opposite ends of the injection hole. The third dummy-seal pattern has third, fourth, and fifth openings arranged alternately in correspondence with the first and second openings.

    摘要翻译: 用于液晶显示装置的密封图案包括具有有效面积和非有效面积的基底,主密封图案,其具有布置在活性区域和非活性区域之间的边界中的注入孔,以及第一,第二和/ 非活性区域中的第三虚拟密封图案沿着与具有喷射孔的主密封图案的一部分相同的方向布置并彼此间隔开。 第一和第二虚拟密封图案具有对应于注入孔的相对端的第一和第二开口。 第三虚拟密封图案具有与第一和第二开口相对应地交替设置的第三,第四和第五开口。

    Seal pattern for liquid crystal display device including inner seal with first and second openings
    9.
    发明授权
    Seal pattern for liquid crystal display device including inner seal with first and second openings 有权
    液晶显示装置的密封图案包括具有第一和第二开口的内部密封

    公开(公告)号:US06919949B2

    公开(公告)日:2005-07-19

    申请号:US10989502

    申请日:2004-11-17

    申请人: Sang-Pyo Hong

    发明人: Sang-Pyo Hong

    IPC分类号: G02F1/1339

    CPC分类号: G02F1/1339

    摘要: A seal pattern for a liquid crystal display device includes a substrate having an active area and a non-active area, a main seal pattern having an injection hole arranged in a boundary between the active and non-active areas, and first, second, and third dummy-seal patterns in the non-active area that are arranged along a same direction as a portion of the main seal pattern having the injection hole and spaced apart from each other. The first and second dummy-seal patterns have first and second openings corresponding to opposite ends of the injection hole. The third dummy-seal pattern has third, fourth, and fifth openings arranged alternatively in correspondence with the first and second openings.

    摘要翻译: 用于液晶显示装置的密封图案包括具有有效面积和非有效面积的基底,主密封图案,其具有布置在活性区域和非活性区域之间的边界中的注入孔,以及第一,第二和/ 非活性区域中的第三虚拟密封图案沿着与具有喷射孔的主密封图案的一部分相同的方向布置并彼此间隔开。 第一和第二虚拟密封图案具有对应于注入孔的相对端的第一和第二开口。 第三虚拟密封图案具有与第一和第二开口相对应地交替布置的第三,第四和第五开口。

    Temperature detection circuit and temperature detection method
    10.
    发明申请
    Temperature detection circuit and temperature detection method 有权
    温度检测电路和温度检测方法

    公开(公告)号:US20050018513A1

    公开(公告)日:2005-01-27

    申请号:US10875003

    申请日:2004-06-22

    申请人: Sang-Pyo Hong

    发明人: Sang-Pyo Hong

    IPC分类号: G11C7/04 G11C11/406

    摘要: A temperature detection circuit and method are provided. The temperature detection circuit samples a first delay time for an input signal at a target temperature to be detected, stores a first addresses generated as the sampled result, samples a second delay time for the input address at a present operating temperature, compares a second addresses generated as the sampled result with the first addresses, and generates a detection signal if the target temperature to be detected is the same as the present operating temperature. The temperature detection method is performed by the temperature detection circuit.

    摘要翻译: 提供了一种温度检测电路和方法。 温度检测电路对要检测的目标温度的输入信号采样第一延迟时间,存储作为采样结果产生的第一地址,对当前工作温度下的输入地址采样第二延迟时间,比较第二地址 产生为具有第一地址的采样结果,并且如果要检测的目标温度与当前工作温度相同,则产生检测信号。 温度检测方法由温度检测电路进行。