公开(公告)号：US20150308902A1

公开(公告)日：2015-10-29

申请号：US14692883

申请日：2015-04-22

Applicant: Seiko Instruments Inc.

Inventor： Masakazu SUGIURA ,  Tsutomu TOMIOKA ,  Hideyuki SAWAI ,  Atsushi IGARASHI ,  Nao OTSUKA ,  Daisuke OKANO

IPC: G01K7/01 ,  H01L27/02 ,  G01K13/00

CPC classification number: G01K7/01 ,  G01K3/005 ,  H01L27/0255

Abstract: Provided is an overheat detection circuit configured to accurately detect a temperature of a semiconductor device even at high temperature and thus avoid outputting an erroneous detection result. The overheat detection circuit includes: a PN junction element, being a temperature sensitive element; a constant current circuit configured to supply the PN junction element with a bias current; a comparator configured to compare a voltage generated at the PN junction element and a reference voltage; a second PN junction element configured to cause a leakage current to flow through a reference voltage circuit at high temperature; and a third PN junction element configured to bypass a leakage current of the constant current circuit at the high temperature.

Abstract translation: 提供了一种过热检测电路，其被配置为即使在高温也能够精确地检测半导体器件的温度，从而避免输出错误的检测结果。 过热检测电路包括：作为温度敏感元件的PN结元件; 配置为向PN结元件提供偏置电流的恒流电路; 比较器，被配置为比较在PN结元件处产生的电压和参考电压; 第二PN结元件，其构造成使得漏电流在高温下流过参考电压电路; 以及第三PN结元件，其构造成在高温下绕过恒流电路的漏电流。

公开(公告)号：US20160187203A1

公开(公告)日：2016-06-30

申请号：US14969653

申请日：2015-12-15

Applicant: Seiko Instruments Inc.

Inventor： Masakazu SUGIURA ,  Hideyuki SAWAI

IPC: G01K1/12 ,  G01K7/01

CPC classification number: G01K7/01 ,  G01K3/005

Abstract: Provided is an overheat detection circuit that is capable of quickly outputting an overheated state detection signal in an overheated state without outputting an unintended erroneous output caused by disturbance noise, such as momentary voltage fluctuations in the power supply. The overheat detection circuit includes: a temperature sensor; a comparison section; and a disturbance noise removal section configured to output an overheated state detection signal to an output section after a predetermined delay time has elapsed. The delay time is reduced in proportion to temperature.

Abstract translation: 提供一种能够在过热状态下快速输出过热状态检测信号而不输出由诸如电源中的瞬时电压波动的干扰噪声引起的意外错误输出的过热检测电路。 过热检测电路包括：温度传感器; 比较部分; 以及干扰噪声去除部，被配置为在经过了预定的延迟时间之后将过热状态检测信号输出到输出部。 延迟时间与温度成比例地降低。