公开(公告)号：US20140084878A1

公开(公告)日：2014-03-27

申请号：US14029221

申请日：2013-09-17

Applicant: SEIKO INSTRUMENTS INC.

Inventor： Tsutomu TOMIOKA ,  Atsushi IGARASHI ,  Masakazu SUGIURA

IPC: H03K17/00

CPC classification number: H03K17/005 ,  G05F1/56 ,  H02J1/10

Abstract: Provided is a power supply switching circuit capable of suppressing a load fluctuation such as undershoot that occurs at an output terminal at the time of power supply switching. The power supply switching circuit includes: a battery connected to the output terminal; a replica current generation circuit for generating a replica current that is proportional to a current flowing from the battery to the output terminal; a voltage regulator connected to the output terminal, the voltage regulator including a reference voltage circuit, an error amplifier circuit, an output transistor, and a voltage divider circuit; and a current mirror circuit for causing the replica current to flow through the output transistor of the voltage regulator.

Abstract translation: 提供一种电源切换电路，其能够抑制在电源切换时在输出端子处发生的诸如下冲的负载波动。 电源开关电路包括：连接到输出端子的电池; 复制电流产生电路，用于产生与从电池流向输出端的电流成比例的复制电流; 连接到输出端子的电压调节器，所述电压调节器包括参考电压电路，误差放大器电路，输出晶体管和分压器电路; 以及用于使复制电流流过电压调节器的输出晶体管的电流镜电路。

公开(公告)号：US20150309528A1

公开(公告)日：2015-10-29

申请号：US14693460

申请日：2015-04-22

Applicant: Seiko Instruments Inc.

Inventor： Atsushi IGARASHI ,  Nao OTSUKA

IPC: G05F5/00

CPC classification number: G05F5/00

Abstract: Provided is a power supply voltage monitoring circuit capable of accurately detecting a power supply voltage with a small circuit scale and low power consumption. The power supply voltage monitoring circuit includes: a signal output circuit configured to output a signal voltage representing saturation characteristics with respect to an increase in power supply voltage; and a signal voltage monitoring circuit configured to output a signal representing that the signal voltage of the signal output circuit is normal, the signal voltage monitoring circuit including: a PMOS transistor including a gate connected to an output terminal of the signal output circuit; a first constant current circuit connected to a drain of the PMOS transistor; and an inverter including an input terminal connected to the drain of the PMOS transistor.

Abstract translation: 提供一种能够以小的电路规模和低功耗精确地检测电源电压的电源电压监视电路。 电源电压监视电路包括：信号输出电路，被配置为输出表示相对于电源电压的增加的饱和特性的信号电压; 信号电压监视电路，被配置为输出表示信号输出电路的信号电压正常的信号，所述信号电压监视电路包括：PMOS晶体管，包括与所述信号输出电路的输出端连接的栅极; 连接到PMOS晶体管的漏极的第一恒流电路; 以及反相器，包括连接到PMOS晶体管的漏极的输入端子。

公开(公告)号：US20160064916A1

公开(公告)日：2016-03-03

申请号：US14837534

申请日：2015-08-27

Applicant: Seiko Instruments Inc.

Inventor： Masakazu SUGIURA ,  Atsushi IGARASHI ,  Nao OTSUKA

IPC: H02H3/08 ,  H02H3/12

CPC classification number: H02H3/08 ,  H02H3/12

Abstract: Provided is a semiconductor device including a detection circuit in which, even when a load short-circuit detection circuit and a load open-circuit detection circuit perform false detection due to a fluctuation in power supply voltage and the like, an output of a false detection result can be prevented. The detection circuit includes the load short-circuit detection circuit configured to detect a short circuit of a load, the load open-circuit detection circuit configured to detect an open circuit of the load, and a logic circuit configured to output output signals of the load short-circuit detection circuit and the load open-circuit detection circuit to an output terminal of the logic circuit, in which the logic circuit outputs a signal of a non-detection logic to the output terminal when the outputs of the load open-circuit detection circuit and the load short-circuit detection circuit are detection logics.

Abstract translation: 提供了一种包括检测电路的半导体器件，其中即使当负载短路检测电路和负载开路检测电路由于电源电压等的波动而进行错误检测时，也可以输出错误检测 结果可以防止。 检测电路包括：负载短路检测电路，被配置为检测负载的短路;负载开路检测电路，被配置为检测负载的开路;以及逻辑电路，被配置为输出负载的输出信号 短路检测电路和负载开路检测电路连接到逻辑电路的输出端，逻辑电路在负载开路检测的输出端向输出端输出非检测逻辑信号 电路和负载短路检测电路都是检测逻辑。

公开(公告)号：US20150308902A1

公开(公告)日：2015-10-29

申请号：US14692883

申请日：2015-04-22

Applicant: Seiko Instruments Inc.

Inventor： Masakazu SUGIURA ,  Tsutomu TOMIOKA ,  Hideyuki SAWAI ,  Atsushi IGARASHI ,  Nao OTSUKA ,  Daisuke OKANO

IPC: G01K7/01 ,  H01L27/02 ,  G01K13/00

CPC classification number: G01K7/01 ,  G01K3/005 ,  H01L27/0255

Abstract: Provided is an overheat detection circuit configured to accurately detect a temperature of a semiconductor device even at high temperature and thus avoid outputting an erroneous detection result. The overheat detection circuit includes: a PN junction element, being a temperature sensitive element; a constant current circuit configured to supply the PN junction element with a bias current; a comparator configured to compare a voltage generated at the PN junction element and a reference voltage; a second PN junction element configured to cause a leakage current to flow through a reference voltage circuit at high temperature; and a third PN junction element configured to bypass a leakage current of the constant current circuit at the high temperature.

Abstract translation: 提供了一种过热检测电路，其被配置为即使在高温也能够精确地检测半导体器件的温度，从而避免输出错误的检测结果。 过热检测电路包括：作为温度敏感元件的PN结元件; 配置为向PN结元件提供偏置电流的恒流电路; 比较器，被配置为比较在PN结元件处产生的电压和参考电压; 第二PN结元件，其构造成使得漏电流在高温下流过参考电压电路; 以及第三PN结元件，其构造成在高温下绕过恒流电路的漏电流。

公开(公告)号：US20160216307A1

公开(公告)日：2016-07-28

申请号：US15002686

申请日：2016-01-21

Applicant: Seiko Instruments Inc.

Inventor： Masakazu SUGIURA ,  Atsushi IGARASHI

IPC: G01R31/02

CPC classification number: G01R31/026 ,  H03K17/18 ,  H03K2217/0054

Abstract: Provided is a detection circuit configured to avoid erroneous detection that may occur immediately after a detection circuit is powered on. The detection circuit includes: an output transistor connected between a voltage input terminal and a voltage output terminal; and a load open-circuit detection circuit configured to detect an open circuit of a load connected to the voltage output terminal, in which an output circuit of the load open-circuit detection circuit includes a first transistor and a second transistor connected in series, the first transistor having a gate connected to the output transistor in common, the second transistor having a gate to which a signal indicating that the open-circuit of the load is detected, and in which the first transistor is in an off state when the output transistor is in an off state.

Abstract translation: 提供了一种检测电路，被配置为避免在检测电路通电之后立即发生的错误检测。 检测电路包括：连接在电压输入端子和电压输出端子之间的输出晶体管; 以及负载开路检测电路，被配置为检测连接到所述电压输出端子的负载的开路，其中所述负载开路检测电路的输出电路包括串联连接的第一晶体管和第二晶体管， 所述第一晶体管具有与所述输出晶体管共同连接的栅极，所述第二晶体管具有栅极，在所述栅极上指示所述负载的开路被检测到的信号，并且当所述第一晶体管处于截止状态时， 处于关闭状态。

公开(公告)号：US20140232447A1

公开(公告)日：2014-08-21

申请号：US14182950

申请日：2014-02-18

Applicant: Seiko Instruments Inc.

Inventor： Kosuke TAKADA ,  Atsushi IGARASHI

IPC: H03L5/02

CPC classification number: H03L5/02 ,  H03K3/356086 ,  H03K19/018507

Abstract: There is provided a level shift circuit free from malfunction. The level shift circuit converts a signal of a first power supply voltage of a first supply terminal, which is supplied to an input terminal, into a signal of a second power supply voltage of a second supply terminal and outputs the converted signal to an output terminal. The level shift circuit has a control circuit that detects when the first power supply voltage reduces below a predetermined voltage. The voltage of the output terminal of the level shift circuit is fixed to the second power supply voltage or a ground voltage according to a detection signal of the control circuit.

Abstract translation: 提供了一个没有故障的电平转换电路。 电平移位电路将提供给输入端子的第一电源端子的第一电源电压的信号转换为第二电源端子的第二电源电压的信号，并将转换的信号输出到输出端子 。 电平移位电路具有检测第一电源电压何时降低到预定电压以下的控制电路。 电平移位电路的输出端子的电压根据控制电路的检测信号固定在第二电源电压或接地电压上。