摘要:
In one embodiment, a method for depositing a capping layer on a substrate surface containing a copper layer is provided which includes exposing the substrate surface to a zinc solution to form a zinc layer on the copper layer. The method further includes exposing the substrate surface to a silver solution to form a silver layer on the zinc layer, and depositing the capping layer on the silver layer by an electroless deposition process. A second silver layer may be formed on the capping layer, if desired. In another embodiment, a composition of a deposition solution to deposit a cobalt tungsten alloy is disclosed. The deposition solution includes CaWO4, a cobalt source in a range from about 50 mM to about 500 mM, a complexing agent in a range from about 100 mM to about 700 mM and a buffering agent in a range from about 50 mM to about 500 mM.
摘要翻译:在一个实施例中,提供了一种用于在包含铜层的衬底表面上沉积覆盖层的方法,其包括将衬底表面暴露于锌溶液以在铜层上形成锌层。 该方法还包括将衬底表面暴露于银溶液以在锌层上形成银层,并通过无电沉积工艺将覆盖层沉积在银层上。 如果需要,可以在覆盖层上形成第二银层。 在另一个实施方案中,公开了沉积钴钨合金的沉积溶液的组合物。 沉积溶液包括CaWO 4 SO 4,钴源在约50mM至约500mM的范围内,络合剂在约100mM至约700mM的范围内,缓冲剂的范围 约50mM至约500mM。
摘要:
In one embodiment, a method for depositing a capping layer on a substrate surface containing a copper layer is provided which includes exposing the substrate surface to a zinc solution, exposing the substrate surface to a silver solution to form a silver layer thereon and depositing the capping layer on the silver layer by an electroless deposition process. A second silver layer may be formed on the capping layer, if desired. In another embodiment, a composition of a deposition solution useful for forming a cobalt tungsten alloy contains calcium tungstate, a cobalt source at a concentration within a range from about 50 mM to about 500 mM, a complexing agent at a concentration within a range from about 100 mM to about 700 mM, and a buffering agent at a concentration within a range from about 50 mM to about 500 mM.
摘要:
A semiconductor substrate processing method and apparatus, more specifically, a method and apparatus for polishing a substrate or semiconductor wafer in a polishing system. In one embodiment, the system includes one or more polishing modules, an input module, a first robot and a second robot that provides a compact polishing system that has a minimal tool footprint. The first robot is adapted to transfer the substrate to the input module, while the second robot is adapted to transfer the substrate between the input module and the one or more polishing modules. In another embodiment, the first and second robots have rotary actuators coupled to their grippers that enable the substrate to be orientated between a horizontal and vertical position. The input module is adapted to maintain the substrate in a vertical orientation. The vertical orientation of the substrates facilitates integration of a cleaning system that cleans the substrates while in the vertical orientation.