公开(公告)号：US4055780A

公开(公告)日：1977-10-25

申请号：US675963

申请日：1976-04-12

申请人： Shichio Kawai ,  Takaho Tanaka ,  Eisuke Bannai ,  Kenji Uchida ,  Ryuichi Shimizu

发明人： Shichio Kawai ,  Takaho Tanaka ,  Eisuke Bannai ,  Kenji Uchida ,  Ryuichi Shimizu

IPC分类号： H01J1/148 ,  H01J1/14 ,  H01J19/06 ,  H01K1/04

CPC分类号： H01J1/148

摘要： A single crystal of lanthanum hexaboride is used as a tip of a thermionic emission cathode.

摘要翻译： 六硼化镧的单晶用作热离子发射阴极的尖端。

公开(公告)号：US5828227A

公开(公告)日：1998-10-27

申请号：US846316

申请日：1997-04-30

申请人： Tetsu Shiota ,  Hideki Tokura ,  Kenji Morimoto ,  Takaho Tanaka ,  Yoshiharu Kaneda ,  Keiichi Itoh ,  Ken Kimura ,  Shigeo Kitamura

发明人： Tetsu Shiota ,  Hideki Tokura ,  Kenji Morimoto ,  Takaho Tanaka ,  Yoshiharu Kaneda ,  Keiichi Itoh ,  Ken Kimura ,  Shigeo Kitamura

IPC分类号： G01R23/00 ,  G01R31/00 ,  G01R31/12 ,  G01R31/34 ,  G05B23/02

CPC分类号： G01R31/1227 ,  G01R31/1254 ,  G01R31/343 ,  G01R31/34

摘要： An abnormality detecting method and apparatus for electrical equipment measures the frequency spectrum of a signal detected by a partial discharge sensor and detects a partial discharge signal having a frequency component in the neighborhood of a resonance frequency to detect the abnormality of the electrical equipment. The resonance frequency is determined on the basis of the electrical equipment and the measuring circuit. Where the electrical equipment is a rotating electric machine, the resonance frequency is determined on the basis of the length of the stator core, and a narrow bandpass filter circuit passes a frequency component around a resonance frequency to detect a partial discharge signal from the passed signal.

摘要翻译： 用于电气设备的异常检测方法和装置测量由局部放电传感器检测到的信号的频谱，并检测具有在谐振频率附近的频率分量的局部放电信号，以检测电气设备的异常。 谐振频率基于电气设备和测量电路确定。 在电气设备是旋转电机的情况下，谐振频率基于定子铁芯的长度来确定，窄带通滤波器电路通过谐振频率周围的频率分量，以从通过的信号中检测局部放电信号 。

公开(公告)号：US5680059A

公开(公告)日：1997-10-21

申请号：US359427

申请日：1994-12-20

申请人： Tetsu Shiota ,  Hideki Tokura ,  Kenji Morimoto ,  Takaho Tanaka ,  Yoshiharu Kaneda ,  Keiichi Itoh ,  Ken Kimura ,  Shigeo Kitamura

发明人： Tetsu Shiota ,  Hideki Tokura ,  Kenji Morimoto ,  Takaho Tanaka ,  Yoshiharu Kaneda ,  Keiichi Itoh ,  Ken Kimura ,  Shigeo Kitamura

IPC分类号： G01R23/00 ,  G01R31/00 ,  G01R31/12 ,  G01R31/34 ,  G05B23/02 ,  G01R31/02

CPC分类号： G01R31/1227 ,  G01R31/1254 ,  G01R31/343 ,  G01R31/34

摘要： The abnormality detecting method and apparatus for electric equipment measure the frequency spectrum of a signal detected by a partial discharge sensor 9, and detect a partial discharge signal having a frequency component in the neighborhood of a resonance frequency determined on the basis of the electric equipment and its measuring circuit, then detect the abnormality of the electric equipment. In a rotating electric machine particularly, the narrow band filter circuit 23 passes a frequency component around a resonance frequency determined on the basis of the length of the stator core to detect a partial discharge signal from the passed signal.

摘要翻译： 电气设备的异常检测方法和装置测量由局部放电传感器9检测的信号的频谱，并且检测具有基于电气设备确定的共振频率附近的频率分量的局部放电信号，以及 其测量电路，然后检测电气设备的异常。 特别地，在旋转电机中，窄带滤波器电路23通过基于定子铁芯的长度确定的共振频率的频率分量，以从通过的信号检测局部放电信号。

公开(公告)号：US5690732A

公开(公告)日：1997-11-25

申请号：US891914

申请日：1992-06-01

申请人： Shigeki Otani ,  Takaho Tanaka ,  Yoshio Ishizawa

发明人： Shigeki Otani ,  Takaho Tanaka ,  Yoshio Ishizawa

IPC分类号： C30B13/30 ,  C30B13/00 ,  C30B13/28 ,  H05B6/04 ,  C30B15/20

CPC分类号： C30B13/00 ,  C30B13/28 ,  C30B29/10 ,  C30B29/36 ,  Y10T117/1004

摘要： A method of automatically growing a single crystal by using a floating-zone method in which radio-frequency induction heating is utilized, wherein the shape of molten zone of a sintered rod material is judged by comparing an anode voltage in a radio-frequency oscillation tube with a radio-frequency current, or a change in the shape of molten zone is judged depending of a change in a radio-frequency current during the growth of the sintered rod material, and power for heating is controlled on the basis of the judgement.

摘要翻译： 通过使用利用射频感应加热的浮动区域法自动生长单晶的方法，其中通过比较射频振荡管中的阳极电压来判断烧结棒材料的熔融区域的形状 根据烧结棒材生长期间的射频电流的变化来判断熔融区域的形状的变化，根据判断来控制加热功率。

公开(公告)号：US5238527A

公开(公告)日：1993-08-24

申请号：US706197

申请日：1991-05-28

申请人： Shigeki Otani ,  Takaho Tanaka ,  Yoshio Ishizawa

发明人： Shigeki Otani ,  Takaho Tanaka ,  Yoshio Ishizawa

IPC分类号： C30B13/00

CPC分类号： C30B13/00 ,  C30B29/10

摘要： The present invention relates to a lanthanum boride type single crystal having the chemical formula (La.sub.1-x M.sub.x)B.sub.6 (0.01.ltoreq.x.ltoreq.0.50) wherein M is at least one rare earth element selected from the group consisting of Ce, Pr, Nd, Sm and Gd, and further relates to a method for growing a lanthanum boride type single crystal by fusion method, which comprises using a lanthanum boride starting material containing from 1 to 50 mol % of at least one rare earth boride selected from the group consisting of CeB.sub.6, PrB.sub.6, NdB.sub.6, SmB.sub.6 and GdB.sub.6.

摘要翻译： 本发明涉及具有化学式（La1-xMx）B6（0.01≤x≤0.50）的硼化镧型单晶，其中M是至少一种选自Ce，Pr Nd，Sm和Gd，还涉及通过熔融法生长硼化镧型单晶的方法，该方法包括使用含有1至50mol％的至少一种选自以下的稀土硼化物的硼化镧原料： 由CeB6，PrB6，NdB6，SmB6和GdB6组成的组。

公开(公告)号：US6114871A

公开(公告)日：2000-09-05

申请号：US971599

申请日：1997-11-17

申请人： Tetsu Shiota ,  Hideki Tokura ,  Kenji Morimoto ,  Takaho Tanaka ,  Yoshiharu Kaneda ,  Keiichi Itoh ,  Ken Kimura ,  Shigeo Kitamura

发明人： Tetsu Shiota ,  Hideki Tokura ,  Kenji Morimoto ,  Takaho Tanaka ,  Yoshiharu Kaneda ,  Keiichi Itoh ,  Ken Kimura ,  Shigeo Kitamura

IPC分类号： G01R23/00 ,  G01R31/00 ,  G01R31/12 ,  G01R31/34 ,  G05B23/02

CPC分类号： G01R31/1227 ,  G01R31/1254 ,  G01R31/343 ,  G01R31/34

摘要： A defect detecting apparatus for monitoring an electrical equipment for defects, the electrical equipment having a resonance frequency. The defect detecting apparatus includes a sensor operatively connected to the electrical equipment for sensing a signal indicating a defect in the electrical equipment; a first bandpass filter operatively connected to the sensor, the first bandpass filter having a first bandwidth and first center frequency at substantially the resonance frequency of the electrical equipment; a second bandpass filter operatively connected to the sensor, the second bandpass filter having a second bandwidth and a second center frequency higher than the resonance frequency of the electrical equipment; a signal strength comparing circuit operatively connected to the first bandpass filter and the second bandpass filter for comparing relative strengths of signals output by the first bandpass filter and the second bandpass filter; and a partial discharge measuring circuit operatively connected to the signal strength comparing circuit for measuring an output signal of the first bandpass filter relative to an output signal of the second bandpass filter to indicate a defect in the electrical equipment.

摘要翻译： 一种用于监测电气设备缺陷的缺陷检测装置，所述电气设备具有共振频率。 缺陷检测装置包括可操作地连接到电气设备的传感器，用于感测指示电气设备中的缺陷的信号; 第一带通滤波器，其操作地连接到所述传感器，所述第一带通滤波器具有基本上所述电气设备的谐振频率处的第一带宽和第一中心频率; 第二带通滤波器，其操作地连接到所述传感器，所述第二带通滤波器具有高于所述电气设备的谐振频率的第二带宽和第二中心频率; 信号强度比较电路，可操作地连接到第一带通滤波器和第二带通滤波器，用于比较由第一带通滤波器和第二带通滤波器输出的信号的相对强度; 以及局部放电测量电路，其可操作地连接到所述信号强度比较电路，用于相对于所述第二带通滤波器的输出信号测量所述第一带通滤波器的输出信号，以指示所述电气设备中的缺陷。

公开(公告)号：US5336362A

公开(公告)日：1994-08-09

申请号：US962871

申请日：1992-10-19

申请人： Takaho Tanaka ,  Yutaka Kamimura ,  Shigeki Otani ,  Yoshio Ishizawa

发明人： Takaho Tanaka ,  Yutaka Kamimura ,  Shigeki Otani ,  Yoshio Ishizawa

IPC分类号： C30B13/00 ,  C30B29/10 ,  C30B13/04

CPC分类号： C30B13/00 ,  C30B29/10

摘要： It is an object of the present invention to obtain a high quality YB66 crystal by lowering the temperature of the molten zone and growing a crystal by deposition growth under an incongruent condition. A method for preparing a yttrium 66 boride crystal by the floating zone method by use of a YB66 polycrystalline rod. A YB66 crystal having a composition with an atomic ratio B/Y within a range of from 50 to 75, is grown under such conditions that the melt has a composition (an atomic ratio B/Y) different from the raw YB66 polycrystalline rod and the growing YB66 crystal, and that an equilibrium is maintained at the growth interface. When the atomic ratio B/Y of the starting material is within the range of from 50 to 62 and the atomic ratio B/Y of the melt is within the range of from 40 to 62, it is possible to attain the atomic ratio B/Y of the growing crystal within the range of from 50 to 62. When the atomic ratio B/Y of the starting material is within the range of from 62 to 75 and the atomic ratio B/Y of the melt is within the range of from 62 to 93, it is possible to attain the atomic ratio B/Y of the growing crystal within the range of from 62 to 75.

摘要翻译： 本发明的目的是通过降低熔融区的温度并在不一致的条件下通过沉积生长生长晶体来获得高质量的YB66晶体。 通过使用YB66多晶棒通过浮动区法制备钇66硼化物晶体的方法。 具有原子比B / Y在50至75范围内的组成的YB66晶体在使熔体具有与原始YB66多晶棒不同的组成（原子比B / Y）的条件下生长， 生长YB66晶体，并且在生长界面保持平衡。 当起始材料的原子比B / Y在50至62的范围内并且熔体的原子比B / Y在40至62的范围内时，可以获得原子比B / 生长晶体的Y在50至62的范围内。当原料的原子比B / Y在62至75的范围内时，熔体的原子比B / Y在 62〜93，可以使生长晶体的原子比B / Y在62〜75的范围内。