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公开(公告)号：US20180279972A1
公开(公告)日：2018-10-04
申请号：US15562777
申请日：2016-03-01
Applicant: SHIMADZU CORPORATION
Inventor： Koichi TANABE , Shingo FURUI , Toshinori YOSHIMUTA , Kenji KIMURA , Akihiro NISHIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA , Toshiyuki SATO
CPC classification number: G01T1/2018 , A61B6/4208 , A61B6/4233 , A61B6/484
Abstract: In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.
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公开(公告)号：US20180364182A1
公开(公告)日：2018-12-20
申请号：US15623813
申请日：2017-06-15
Applicant: Shimadzu Corporation
Inventor： Koichi TANABE , Shingo FURUI , Hiroyuki KISHIHARA , Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
Abstract: An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.
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公开(公告)号：US20180042571A1
公开(公告)日：2018-02-15
申请号：US15555663
申请日：2015-03-06
Applicant: Shimadzu Corporation
Inventor： Satoshi SANO , Toshiyuki SATO , Koichi TANABE , Shingo FURUI , Toshinori YOSHIMUTA , Hiroyuki KISHIHARA , Takahiro DOKI , Akira HORIBA
CPC classification number: A61B6/5258 , A61B6/4035 , A61B6/484 , A61B6/487 , G01N23/043 , G01N23/20075
Abstract: Provided is a radiation phase difference imaging apparatus in which a separation distance between a phase grating and a radiation detector is optimized. The separation distance between the phase grating and a detection surface of an FPD is determined based on the magnitude of noise corruption in a self-image projected onto the detection surface. The magnitude of the effect of the noise is used as a basis for assessing the separation distance. It is determined whether a distance Zd is appropriate for imaging, based on the magnitude of noise corruption in the self-image in a self-image picture which is obtained when the distance Zd is the distance between the phase grating and the detection surface of the FPD. The separation distance can thus be optimized based on actual conditions of an actual X-ray source that emits a plurality of types of X-rays.
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公开(公告)号：US20170343486A1
公开(公告)日：2017-11-30
申请号：US15538622
申请日：2015-11-20
Applicant: Shimadzu Corporation
Inventor： Koichi TANABE , Shingo FURUI , Hiroyuki KISHIHARA , Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
CPC classification number: G01N23/04 , A61B6/4291 , A61B6/4429 , A61B6/4476 , A61B6/484 , A61B6/487 , A61B6/5235 , G01N2223/1016 , G01N2223/501 , G21K1/067 , G21K1/10 , G21K2207/005
Abstract: Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object. Therefore, according to the present invention, it is configured such that imaging is performed while changing the relative position of the imaging system and the object.
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