摘要:
A semiconductor-device characteristic measurement apparatus includes first measuring unit for measuring a first electrical characteristic of a device under test, second measuring unit, switch for switching between the first measuring unit and the second measuring means such that one of the measuring unit is connected to the device under test, and controller for controlling the switching means. The switch includes switches that switch between a first wiring configuration for electrically connecting the first measuring unit to the device under test and a second wiring configuration for electrically connecting the second measuring unit to the device under test. The switch is electrically connected to the device under test at a position closer to the device under test than the first measuring unit and the second measuring unit.
摘要:
A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.
摘要:
A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.
摘要:
A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.
摘要:
A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.
摘要:
A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.
摘要:
A concrete mixer truck includes: a driving device that drives a mixer drum to rotate; a pressure sensor that detects a pressure of the working fluid in the driving device; a material introduction determination unit that determines whether or not a material for generating the mixed concrete has been introduced into the mixer drum; a pressure determination unit that determines whether or not the pressure of the working fluid detected by the pressure sensor has fallen to a set pressure set in advance in accordance with a carrying amount and a fluidity of the mixed concrete after the introduction of the materials for the mixed concrete into the mixer drum; and a notification device that notifies an operator that the pressure of the working fluid in the driving device has fallen to the set pressure on the basis of the determination made by the pressure determination unit.
摘要:
A portable information terminal apparatus generates a first signal, based on the user's operation, that causes a recording/reproducing apparatus to acquire program information. A second signal based on the user's operation, causes the recording/reproducing apparatus to display the acquired program information. A third signal based on the user's operation causes the recording/reproducing apparatus to preset the program for unattended recording. A fourth signal based on the user's operation causes the recording/reproducing apparatus to convert the recorded program to video data in a predetermined file format.
摘要:
Provided is an alkali-niobate-based piezoelectric porcelain composition which has a crystal-structure transition point in the range of operation guarantee temperatures and which, despite this, is inhibited from abruptly changing in capacitance. The piezoelectric porcelain composition comprises Li, Na, K, Nb, Ta, Sb, and O as major constituent elements and has an alkali-niobate-based perovskite structure. When the composition has an ABO3 type perovskite structure as a unit lattice in which Z=1, the composition has a transition point at which the crystal structure changes from the monoclinic to the tetragonal system. Thus, the composition has a crystal-structure transition point at −50° C. to 150° C. so as to utilize the high piezoelectric effect produced by the MPB at the crystal-structure transition point and, despite this, has the feature of always satisfying ΔC>0.
摘要:
There is provided a database server capable of easily adding various kinds of associated data without modifying the structure of the database. A heading node (T node) is correlated with an associated node (A node) and an association role R is defined between the T node and the A node associated with it. Furthermore, each of the T node and the A node is added with an identifier (ID), its attribute (node type), and a name (node name). The data having such a structure is stored in an association/role table (AR table) composed of an entry containing ID of the A node and T node associated with each other and the association role R defined between them and in an identifier table (ID table) containing the ID, attribute, and name of the A node and the T node, so that the data can be searched.