摘要:
A discharge voltage detecting unit 7 detects a discharge voltage and determines an average discharge voltage in a specified period of time. An optimum machining condition computing unit 8 determines a discharge current that makes an average discharge voltage detected by the discharge voltage detecting unit equal to an average discharge voltage when a new machining liquid is used and determines discharging time, non-operating time, and a servo reference voltage depending on the determined discharge current from the relational equations with a discharge current, discharging time, non-operating time, and a servo reference voltage that are stored in the machining condition data base storing unit 9 and establish optimum machining conditions and controls a servo 4 and a machining electrode 5 under the optimum machining conditions by a servo control unit 6 at the time of machining.
摘要:
A discharge voltage detecting unit of an electric discharge machine detects a discharge voltage and determines an average discharge voltage in a specified period of time. An optimum machining condition computing unit determines a discharge current that makes an average discharge voltage detected by a discharge voltage detecting unit equal to an average discharge voltage when a new machining liquid is used. The optimum machining condition computing unit determines an optimal discharging time, an optimal non-operating time, and an optimal servo reference voltage from relational equations depending on the determined discharge current. A machining condition data base storing unit stores the discharge current, the discharging time, the non-operating time, and the servo reference voltage. A servo control unit establishes the optimum machining conditions at the time of machining.
摘要:
A method of manufacturing a semiconductor device includes preparing a semiconductor wafer, forming a semiconductor function element on the semiconductor wafer, drying the semiconductor wafer after forming the semiconductor function element by using an isopropyl alcohol vapor, heating the semiconductor wafer after drying the semiconductor wafer, and performing an RA cleaning on the semiconductor wafer after heating the semiconductor wafer by using a fuming nitric acid.
摘要:
The present invention provides an acceleration sensor that improves endurance by avoiding damage to stopper portions. When a downward vibration is applied to a weight member and the weight member displaces downward, a bottom face of the weight member abuts a bottom plate, and the weight member stops and downward displacement is obstructed. Furthermore, when the weight member displaces upward, peripheral weight portions abut stopper portions, and the weight member stops and upward displacement is obstructed. Because displacement of the weight member is obstructed by abutting the stopper portions, if the strength of the stopper portions is low, the stopper portions may be damaged. However, by providing reinforcement portions which reinforce the stopper portions, damage to the stopper portions may be prevented, and endurance of the acceleration sensor is improved.
摘要:
A method of manufacturing a semiconductor device includes preparing a semiconductor wafer, forming a semiconductor function element on the semiconductor wafer, drying the semiconductor wafer after forming the semiconductor function element by using an isopropyl alcohol vapor, heating the semiconductor wafer after drying the semiconductor wafer, and performing a cleaning on the semiconductor wafer after heating the semiconductor wafer by using a fuming nitric acid.
摘要:
A refrigerant-circulating system which comprises a refrigeration cycle comprising a refrigerant compressor, a condenser, an expansion mechanism and an evaporator to form a refrigerant circuit and employing a refrigerant which contains no chlorine, wherein an aromatic polyether oil having as a base oil structure a benzene ring having an ether bond is employed as a refrigerator oil.