摘要:
An operational amplifier capable of offset cancel in a shorter period, as well as a line driver capable of shortening one horizontal period and a liquid crystal display device are provided. In the operational amplifier of the invention, a time necessary for feed back control can be shortened than usual by a constitution that an output voltage VO in one horizontal period H1 which is one horizontal period before is defined as a reference voltage in an offset cancel preparatory period HC2, thereby changing the output voltage VO(2) only by the offset voltage VO(2) by the feed back control. In the line driver of the invention, the operational amplifier not used for the output of display data D1 to D6 conducts offset cancel operation and it is successively shifted on every one horizontal period. Since it is no more necessary to incorporate the offset cancel preparatory period in the output period, one horizontal period can be shortened further.
摘要:
An operational amplifier capable of offset cancel in a shorter period, as well as a line driver capable of shortening one horizontal period and a liquid crystal display device are provided. In the operational amplifier of the invention, a time necessary for feed back control can be shortened than usual by a constitution that an output voltage VO in one horizontal period H1 which is one horizontal period before is defined as a reference voltage in an offset cancel preparatory period HC2, thereby changing the output voltage VO(2) only by the offset voltage VO(2) by the feed back control. In the line driver of the invention, the operational amplifier not used for the output of display data D1 to D6 conducts offset cancel operation and it is successively shifted on every one horizontal period. Since it is no more necessary to incorporate the offset cancel preparatory period in the output period, one horizontal period can be shortened further.
摘要:
The invention relates to an X-Y address type solid-state image pickup device manufactured by a CMOS process, and has an object to provide an X-Y address type solid-state image pickup device which has a small element size and a wide opening ratio, and can reduce a kTC noise. A photodiode 10, a reset transistor 12, a source follower amplifier 14, and a horizontal selection transistor 16 are formed in each of pixel regions Pmn. A kTC noise reduction circuit 6VR1 for reducing a kTC noise and a CDS circuit 6CL1 are formed outside of the pixel regions Pmn. A differential amplifier is constituted by a first differential transistor 62 of the kTC noise reduction circuit 6VR1 and the source follower amplifier 14 in each of the pixel regions Pmn.
摘要:
In a data driver 10A of a dot-inversion driving type, the outputs of voltage buffer amplifiers B1 to B12 are connected to respective data bus lines D1 to D12 of a LCD panel, short-circuiting switches S1, S3, S5, S7, S9 and S11 are connected between ones of every other adjacent data bus lines concerned with the same display color, and interconnecting lines on first and second rows are arranged in a staggered configuration. These short-circuiting switches are formed at one sides of every other data bus lines, and turned on by a control circuit 13 when the outputs of the voltage buffer amplifier are in a high impedance state.
摘要:
A selector circuit comprises four 2-input selectors 50 to 53 each selecting in response to the complementary selection signals D2 and *D2 of MSB and a 4-input selector 24A selecting in response to complementary selection signals D1, *D1, D0 and *D0 of the lower 2 bit. In each of the 2-input selectors 50 to 53, one ends of two switching transistors are commonly connected to each other and the two switching transistors are adjacently arranged in the same row. In the 4-input selector 24A, 4 analogue switch circuits, each of which has two switching transistors arranged in the same row and serially connected, are arranged in parallel to one another and each is arranged in the same row as that of a corresponding 2-input selector. Same selectors are arranged in a row on a substrate and trunk lines for providing two families of gradation potentials V0 to V7 to the circuits are laid above the circuits. Upper/lower trunk line pairs are in the third and second wiring layer, respectively. The distance between adjacent trunk lines in the same wiring layer is 2d in a connecting area and is d in a non-connecting area. A trunk line in the third wiring layer is branched toward adjacent trunk line, and the branched line is connected through an interlayer contact to a line parallel to a trunk line in the second wiring layer.
摘要:
An operational amplifier capable of offset cancel in a shorter period, as well as a line driver capable of shortening one horizontal period and a liquid crystal display device are provided. In the operational amplifier of the invention, a time necessary for feed back control can be shortened than usual by a constitution that an output voltage VO in one horizontal period H1 which is one horizontal period before is defined as a reference voltage in an offset cancel preparatory period HC2, thereby changing the output voltage VO(2) only by the offset voltage VO(2) by the feed back control. In the line driver of the invention, the operational amplifier not used for the output of display data D1 to D6 conducts offset cancel operation and it is successively shifted on every one horizontal period. Since it is no more necessary to incorporate the offset cancel preparatory period in the output period, one horizontal period can be shortened further.
摘要:
Lower level of data latch holding a digital image data and a positive selector arranged immediately above positive gradation voltage line, for selecting positive analog gradation voltage of positive gradation levels are take as a set, and upper level of data latch holding a digital image data and a negative selector arranged immediately above negative gradation voltage line, for selecting negative analog gradation voltage of negative gradation levels are take as a set. Two sets are arranged in alignment in vertical direction. A plurality of sets of vertically aligned sets are arranged horizontally to shorten a length in horizontal direction with respect to gradation voltage lines.
摘要:
Lower level of data latch holding a digital image data and a positive selector arranged immediately above positive gradation voltage line, for selecting positive analog gradation voltage of positive gradation levels are take as a set, and upper level of data latch holding a digital image data and a negative selector arranged immediately above negative gradation voltage line, for selecting negative analog gradation voltage of negative gradation levels are take as a set. Two sets are arranged in alignment in vertical direction. A plurality of sets of vertically aligned sets are arranged horizontally to shorten a length in horizontal direction with respect to gradation voltage lines.
摘要:
An offset cancel circuit for an operational amplifier comprises a capacitive element for storing a voltage to be amplified by an operational amplifier section and containing an offset, and for feedback-controlling a voltage value of the operational amplifier section based on the stored voltage, and switching elements for switching operation between the storage of the voltage in the capacitive element and the feedback control based on the value of the voltage stored in the capacitive element. The capacitive element and the switching elements can be used to cancel accurately an offset in the operational amplifier section without increasing the gate areas of transistors in the operational amplifier section.
摘要:
A semiconductor device carries out a test utilizing contact with a probe needle without being affected by narrowing of the pitch at which output pads are arranged. The device is equipped with test circuits provided between a plurality of output buffers via which signals are output and output pads corresponding thereto. The test circuit includes output switches caused to sequentially make connections by a controller in test and interpad switches involved in making connections of the output pads with a test pad by the controller in test. In test, probe needles are brought into contact with the test pad. The output pads are not used in test, and can be arranged at a narrowed pitch. Thus, the chip area can be reduced and are therefore so that the pitch for the output pads can be narrowed and the chip area can be decreased.