INDUCTIVE PLASMA DOPING
    2.
    发明申请
    INDUCTIVE PLASMA DOPING 审中-公开
    电感等离子喷涂

    公开(公告)号:US20100167506A1

    公开(公告)日:2010-07-01

    申请号:US12347483

    申请日:2008-12-31

    IPC分类号: H01L21/30

    摘要: In some embodiments, a method of doping a semiconductor wafer disposed on a pedestal electrode in an inductive plasma chamber includes generating a plasma having a first voltage with respect to ground in the inductive plasma chamber, and applying a radio frequency (RF) voltage with respect to ground to the pedestal electrode in the inductive plasma chamber. The positive RF voltage is based on the first voltage of the plasma.

    摘要翻译: 在一些实施例中,掺杂设置在感应等离子体室中的基座电极上的半导体晶片的方法包括在感应等离子体室中产生相对于接地的第一电压的等离子体,并且施加射频(RF)电压 接地到电感等离子体室中的基座电极。 正RF电压基于等离子体的第一电压。