MCM—MLC technology
    2.
    发明授权
    MCM—MLC technology 失效
    MCM-MLC技术

    公开(公告)号:US06442041B2

    公开(公告)日:2002-08-27

    申请号:US09740280

    申请日:2000-12-19

    IPC分类号: H05K702

    摘要: Disclosed is a multilayer electronics packaging structure, especially for use in a multi chip module. By forming an overlap of signal conductors by the respective mesh conductors, an improved shielding effect is achieved and coupling between signal conductors is reduced. By increasing the via punch pitch such that multiple wiring channels are formed between adjacent vias, wirability is improved and the number of signal distribution layers may be reduced. The new structure thus shows improved electrical properties over the state-of-the-art structures, combined with a cost reduction of about 35%.

    摘要翻译: 公开了一种多层电子封装结构,特别适用于多芯片模块。 通过由相应的网状导体形成信号导体的重叠,实现了改进的屏蔽效果,并且减少了信号导线之间的耦合。 通过增加通孔冲压间距,使得在相邻通路之间形成多个布线通道,可改善布线性,并且可以减少信号分布层的数量。 因此,新结构显示出比现有技术结构更好的电性能,同时成本降低约35%。

    Automatic Test Equipment
    3.
    发明申请
    Automatic Test Equipment 审中-公开
    自动测试设备

    公开(公告)号:US20140229782A1

    公开(公告)日:2014-08-14

    申请号:US14259043

    申请日:2014-04-22

    IPC分类号: G06F11/27

    摘要: Embodiments of the present invention provide an automatic test equipment. The automatic test equipment is configured to receive an input signal from a device under test and to write an information describing the input signal to a memory. The automatic test equipment is further configured to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory.

    摘要翻译: 本发明的实施例提供一种自动测试设备。 自动测试设备被配置为从被测设备接收输入信号,并将描述输入信号的信息写入存储器。 自动测试设备还被配置为基于描述从存储器读取的输入信号的信息读取描述来自存储器的输入信号的信息,并为被测设备提供输出信号。