HIGH SPEED DISTRIBUTED OPTICAL SENSOR INSPECTION SYSTEM
    9.
    发明申请
    HIGH SPEED DISTRIBUTED OPTICAL SENSOR INSPECTION SYSTEM 有权
    高速分布式光传感器检测系统

    公开(公告)号:US20110102575A1

    公开(公告)日:2011-05-05

    申请号:US12940214

    申请日:2010-11-05

    IPC分类号: H04N7/18

    摘要: An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.

    摘要翻译: 电子装配线包括第一电子组装机和第二电子组装机。 第一个电子组装机器具有第一电子组装机出口。 第二电子组装机具有第二电子组装机入口和出口。 第二电子组装机的入口通过输送机联接到第一电子组装机的出口。 在第二电子组件的入口之前,第一光学检测传感器设置在输送机之上,并且被配置为相对于以第一光学检测传感器以不间断方式通过的基板提供第一传感器检查图像数据。 在第二电子组装机器的出口之后,第二光学检测传感器设置在传送器上方并且被配置为相对于在第二光学检测传感器下方以不间断的方式通过的基板提供第二传感器检查图像数据。 计算机可操作地耦合到第一和第二光学检测传感器,并且被配置为基于第一和第二检查图像数据中的至少一个提供检查结果。

    HIGH SPEED OPTICAL INSPECTION SYSTEM WITH ADAPTIVE FOCUSING
    10.
    发明申请
    HIGH SPEED OPTICAL INSPECTION SYSTEM WITH ADAPTIVE FOCUSING 有权
    具有自适应聚焦的高速光学检测系统

    公开(公告)号:US20110090333A1

    公开(公告)日:2011-04-21

    申请号:US12939267

    申请日:2010-11-04

    IPC分类号: H04N7/18

    摘要: An optical inspection system for inspecting a substrate is provided. The system includes an array of cameras configured to acquire a plurality of sets of images as the substrate and the array undergo relative motion with respect to each other. At least one focus actuator is operably coupled to each camera of the array of cameras to cause displacement of at least a portion of each camera that affects focus. A substrate range calculator is configured to receive at least portions of images from the array and to calculate range between the array of cameras and the substrate. A controller is coupled to the array of cameras and to the range calculator. The controller is configured to provide a control signal to each of the at least one focus actuator to adaptively focus each camera of the array during the relative motion.

    摘要翻译: 提供了一种用于检查基板的光学检查系统。 该系统包括被配置为获取多组图像作为基板并且阵列相对于彼此经历相对运动的相机阵列。 至少一个聚焦致动器可操作地耦合到相机阵列的每个相机,以引起影响焦点的每个相机的至少一部分的位移。 衬底范围计算器被配置为从阵列接收至少部分图像并计算相机阵列和衬底之间的范围。 控制器耦合到相机阵列和距离计算器。 控制器被配置为向至少一个聚焦致动器中的每一个提供控制信号,以在相对运动期间自适应地对准阵列的每个相机。