PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND METHOD FOR FABRICATING THE SAME
    1.
    发明申请
    PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND METHOD FOR FABRICATING THE SAME 审中-公开
    包含电场对准探头提示的探测系统及其制造方法

    公开(公告)号:US20100229265A1

    公开(公告)日:2010-09-09

    申请号:US12767954

    申请日:2010-04-27

    IPC分类号: G01Q70/16

    摘要: A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with a gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate, depositing a carbon dot on the catalyst metal film, etching away the catalyst metal film not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film and growing a carbon nanotube probe tip on the catalyst metal film. The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.

    摘要翻译: 一种机械稳定和取向的扫描探针尖端,其包括具有逐渐减小的直径的基底的碳纳米管,在探针尖端具有尖锐的尖端。 通过在基板上沉积催化剂金属膜,在催化剂金属膜上沉积碳点,蚀刻未被碳点掩蔽的催化剂金属膜,从催化剂中除去碳点,从而制造这种尖端或尖端阵列 金属膜暴露催化剂金属膜并在催化剂金属膜上生长碳纳米管探针尖端。 碳探针尖端可以是直的,有角度的或急剧弯曲的,并具有各种技术应用。

    Probe System Comprising an Electric-Field-Aligned Probe Tip and Method for Fabricating the Same
    2.
    发明申请
    Probe System Comprising an Electric-Field-Aligned Probe Tip and Method for Fabricating the Same 有权
    包括电场对准探头尖端的探头系统及其制造方法

    公开(公告)号:US20080272299A1

    公开(公告)日:2008-11-06

    申请号:US12088223

    申请日:2006-10-10

    摘要: A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate (10 & 12 in FIG. 1(a)), depositing a carbon dot (14 in FIG. 1(b)) on the catalyst metal film, etching away the catalyst metal film (FIG. 1(c)) not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film (FIG. 1(d)), and growing a carbon nanotube probe tip on the catalyst film (16 in FIG. 1(e)). The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.

    摘要翻译: 一种机械稳定和取向的扫描探针尖端,其包括具有逐渐减小的直径的基底的碳纳米管,在探针尖端具有尖锐的尖端。 通过在衬底(图10中的10和12)(图1(a))上沉积催化剂金属膜( a))沉积碳点(14 在催化剂金属膜上的图1( b)中,蚀刻掉催化剂金属膜(图1)( c ))未被碳点掩蔽,从催化剂金属膜除去碳点以暴露催化剂金属膜(图1( d)),并且生长碳纳米管 探针尖端在催化剂膜上(图1中的16)(图1)( e))。 碳探针尖端可以是直的,有角度的或急剧弯曲的,并具有各种技术应用。

    Probe system comprising an electric-field-aligned probe tip and method for fabricating the same
    3.
    发明授权
    Probe system comprising an electric-field-aligned probe tip and method for fabricating the same 有权
    包括电场对准探针尖端的探针系统及其制造方法

    公开(公告)号:US07735147B2

    公开(公告)日:2010-06-08

    申请号:US12088223

    申请日:2006-10-10

    IPC分类号: H01J37/06

    摘要: A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate (10 & 12 in FIG. 1(a)), depositing a carbon dot (14 in FIG. 1(b)) on the catalyst metal film, etching away the catalyst metal film (FIG. 1(c)) not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film (FIG. 1(d)), and growing a carbon nanotube probe tip on the catalyst film (16 in FIG. 1(e)). The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.

    摘要翻译: 一种机械稳定和取向的扫描探针尖端,其包括具有逐渐减小的直径的基底的碳纳米管,在探针尖端具有尖锐的尖端。 通过在基板(图1(a)中的10和12)上沉积催化剂金属膜,在催化剂金属上沉积碳点(图1(b)中的14))来产生尖端或尖端阵列 蚀刻不被碳点掩蔽的催化剂金属膜(图1(c)),从催化剂金属膜除去碳点以暴露催化剂金属膜(图1(d)),并生长 催化剂膜上的碳纳米管探针尖端(图1(e)中的16))。 碳探针尖端可以是直的,有角度的或急剧弯曲的,并具有各种技术应用。

    APPARATUS FOR STORING SOLID STATE DRIVES OR HARD DISK DRIVES
    4.
    发明申请
    APPARATUS FOR STORING SOLID STATE DRIVES OR HARD DISK DRIVES 有权
    存储固态驱动器或硬盘驱动器的装置

    公开(公告)号:US20130180935A1

    公开(公告)日:2013-07-18

    申请号:US13436397

    申请日:2012-03-30

    IPC分类号: H05K7/14 B65D85/00

    CPC分类号: G11B33/128 G06F1/187

    摘要: An apparatus includes a container having a base for receiving a drive, and a clam having a first end that is rotatably coupled to the base, a second end, and a body extending from the first end to the second end, the clam rotatable relative to the base so that the clam can be placed at a first position and a second position, wherein when the clam is at the first position, the container allows the drive to be placed therein, and wherein when the clam is at the second position, the clam secures the drive relative to the container. A frame includes at least sixteen slots to receive respective drive storage devices, which store respective SFF8201 7 mm drives, in EIA RS310D 1U space. A frame includes at least forty-eight slots to receive respective drive storage devices, which store respective SFF8201 7 mm drives, in EIA RS310D 2U space.

    摘要翻译: 一种装置包括具有用于接收驱动器的基座的容器和具有可旋转地联接到基座的第一端的蛤蜊,第二端和从第一端延伸到第二端的主体,蛤可相对于 基部,使得蛤蜊可以放置在第一位置和第二位置,其中当蛤蜊处于第一位置时,容器允许驱动器被放置在其中,并且其中当蛤蜊处于第二位置时, 蛤蜊相对于容器固定驱动器。 框架包括至少十六个插槽,用于接收在EIA RS310D 1U空间中存储相应的SFF8201 7 mm驱动器的相应驱动器存储设备。 一个框架包括至少四十八个插槽,用于接收在EIA RS310D 2U空间中存储相应的SFF8201 7 mm驱动器的相应驱动器存储设备。

    Noise-reduction method for processing a test port
    6.
    发明授权
    Noise-reduction method for processing a test port 有权
    用于处理测试端口的降噪方法

    公开(公告)号:US07969158B2

    公开(公告)日:2011-06-28

    申请号:US12135451

    申请日:2008-06-09

    IPC分类号: G01R31/02 G01R29/26 H01H31/02

    CPC分类号: H04L43/50

    摘要: A noise-reduction method for processing a port is applied to a test target for testing or being burned in with software. At least one zero-Ohm resistor is provided with a first end thereof electrically connected to a device under test (DUT) of the test target and a second end thereof connected to a test port. Moreover, at least one grounding zero-Ohm resistor is provided with one end connected to ground and the other end is a floating end. After the test target is finished debugging or burned in with software, the connection of the first end and the DUT is disabled, and the second end is connected to ground through the floating end to reduce noise generation and improve a flexibility in circuit layout.

    摘要翻译: 用于处理端口的降噪方法被应用于用于测试或被软件烧录的测试目标。 设置至少一个零欧姆电阻器,其第一端电连接到测试目标的被测器件(DUT),其第二端连接到测试端口。 此外,至少有一个接地零欧姆电阻器的一端连接到地,另一端是浮动端。 测试目标完成调试或软件烧录后,第一端和DUT的连接被禁用,第二端通过浮动端连接到地,以减少噪声产生,提高电路布局的灵活性。