Polishing slurries and methods for chemical mechanical polishing
    2.
    发明授权
    Polishing slurries and methods for chemical mechanical polishing 失效
    抛光浆料和化学机械抛光方法

    公开(公告)号:US07553430B2

    公开(公告)日:2009-06-30

    申请号:US11540297

    申请日:2006-09-29

    IPC分类号: C09K13/00

    摘要: Aqueous polishing slurries for chemical-mechanical polishing are effective for polishing copper at high polish rates. The aqueous slurries according to the present invention may include soluble salts of molybdenum dissolved in an oxidizing agent and molybdic acid dissolved in an oxidizing agent. Methods for polishing copper by chemical-mechanical planarization include polishing copper with low pressures using a polishing pad and a aqueous slurries including soluble salts of molybdenum dissolved in an oxidizing agent and molybdic acid dissolved in an oxidizing agent, particles of MoO3 dissolved in an oxidizing agent, and particles of MoO2 dissolved in an oxidizing agent.

    摘要翻译: 用于化学机械抛光的水性抛光浆对于以高抛光速率抛光铜是有效的。 根据本发明的水性浆料可以包括溶解在氧化剂中的钼的可溶性盐和溶解在氧化剂中的钼酸。 通过化学机械平面化抛光铜的方法包括使用抛光垫来抛光低压铜,以及包含溶解在氧化剂中的钼的可溶性盐和溶解在氧化剂中的钼酸的水性浆料,溶解在氧化剂中的MoO 3颗粒 ,和溶解在氧化剂中的MoO 2颗粒。