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公开(公告)号:US09722065B1
公开(公告)日:2017-08-01
申请号:US15014842
申请日:2016-02-03
发明人: Yu-Syuan Lin , Jiun-Lei Yu , Ming-Cheng Lin , Chun Lin Tsai
IPC分类号: H01L29/66 , H01L29/778 , H01L29/06 , H01L29/47
CPC分类号: H01L29/7787 , H01L29/0649 , H01L29/0661 , H01L29/1075 , H01L29/2003 , H01L29/475 , H01L29/7786 , H02M3/00 , H02M3/1588 , Y02B70/1466
摘要: A semiconductor device includes a transistor, a semiconductor layer, an active region and a conductive layer. The active region is in the semiconductor layer. The conductive layer is configured to maintain a channel in the active region when the transistor is triggered to be conducted.
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公开(公告)号:US09443969B2
公开(公告)日:2016-09-13
申请号:US13948925
申请日:2013-07-23
发明人: King-Yuen Wong , Po-Chih Chen , Chen-Ju Yu , Fu-Chih Yang , Jiun-Lei Jerry Yu , Fu-Wei Yao , Ru-Yi Su , Yu-Syuan Lin
IPC分类号: H01L29/778
CPC分类号: H01L29/66462 , H01L29/1066 , H01L29/2003 , H01L29/41766 , H01L29/518 , H01L29/7786 , H01L29/7787
摘要: A transistor includes a substrate, a channel layer over the substrate, an active layer over the channel layer, a metal diffusion barrier over the active layer, and a gate over the metal diffusion barrier. The active layer has a band gap discontinuity with the channel layer.
摘要翻译: 晶体管包括衬底,衬底上的沟道层,沟道层上的有源层,有源层上的金属扩散势垒以及金属扩散势垒上的栅极。 有源层与沟道层具有带隙不连续性。
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公开(公告)号:US12087820B2
公开(公告)日:2024-09-10
申请号:US18301461
申请日:2023-04-17
发明人: Yu-Syuan Lin , Jiun-Lei Yu , Ming-Cheng Lin , Chun Lin Tsai
IPC分类号: H01L29/10 , H01L27/085 , H01L29/06 , H01L29/20 , H01L29/423 , H01L29/47 , H01L29/778 , H01L29/78 , H02M3/158 , H02M3/00
CPC分类号: H01L29/1075 , H01L29/0649 , H01L29/0661 , H01L29/475 , H01L29/7786 , H01L29/7787 , H02M3/1588 , H01L29/2003 , H02M3/003 , Y02B70/10
摘要: A semiconductor device includes a transistor, a semiconductor layer, an active region and a conductive layer. The active region is in the semiconductor layer. The conductive layer is configured to maintain a channel in the active region when the transistor is triggered to be conducted.
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公开(公告)号:US10269948B2
公开(公告)日:2019-04-23
申请号:US15944345
申请日:2018-04-03
发明人: Han-Chin Chiu , Sheng-De Liu , Yu-Syuan Lin , Yao-Chung Chang , Cheng-Yuan Tsai
IPC分类号: H01L29/205 , H01L29/778 , H01L29/66 , H01L29/20
摘要: A semiconductor structure includes a semiconductive substrate having a top surface, a III-V compound layer covering the top surface, and a passivation layer having a lower portion and an upper portion, both comprising at least one of oxide and nitride over the III-V compound layer. The semiconductor structure also includes an etch stop layer between the lower portion and the upper portion of the passivation layer, and a gate stack penetrating through the etch stop layer and landing on the lower portion of the passivation layer. The gate stack is surrounded by the etch stop layer.
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公开(公告)号:US11631741B2
公开(公告)日:2023-04-18
申请号:US16947284
申请日:2020-07-27
发明人: Yu-Syuan Lin , Jiun-Lei Yu , Ming-Cheng Lin , Chun Lin Tsai
摘要: A semiconductor device includes a transistor, a semiconductor layer, an active region and a conductive layer. The active region is in the semiconductor layer. The conductive layer is configured to maintain a channel in the active region when the transistor is triggered to be conducted.
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公开(公告)号:US10727329B2
公开(公告)日:2020-07-28
申请号:US16219281
申请日:2018-12-13
发明人: Yu-Syuan Lin , Jiun-Lei Yu , Ming-Cheng Lin , Chun Lin Tsai
IPC分类号: H01L29/778 , H01L29/78 , H01L29/423 , H01L29/06 , H01L29/47 , H01L29/10 , H02M3/158 , H02M3/00 , H01L29/20
摘要: A semiconductor device includes a transistor, a semiconductor layer, an active region and a conductive layer. The active region is in the semiconductor layer. The conductive layer is configured to maintain a channel in the active region when the transistor is triggered to be conducted.
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公开(公告)号:US10170613B2
公开(公告)日:2019-01-01
申请号:US15664767
申请日:2017-07-31
发明人: Yu-Syuan Lin , Jiun-Lei Yu , Ming-Cheng Lin , Chun Lin Tsai
摘要: A semiconductor device includes a transistor, a semiconductor layer, an active region and a conductive layer. The active region is in the semiconductor layer. The conductive layer is configured to maintain a channel in the active region when the transistor is triggered to be conducted.
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公开(公告)号:US09941398B2
公开(公告)日:2018-04-10
申请号:US15072992
申请日:2016-03-17
发明人: Han-Chin Chiu , Sheng-De Liu , Yu-Syuan Lin , Yao-Chung Chang , Cheng-Yuan Tsai
IPC分类号: H01L29/778 , H01L29/205 , H01L29/66
CPC分类号: H01L29/7784 , H01L29/2003 , H01L29/205 , H01L29/66462 , H01L29/7783
摘要: A semiconductor structure comprises a semiconductive substrate comprising a top surface, a III-V compound layer over the semiconductive substrate, and a first passivation layer over the III-V compound layer. The semiconductor structure also includes an etch stop layer over the first passivation layer. The semiconductor structure further includes a gate stack over the first passivation layer and surrounded by the etch stop layer.
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