公开(公告)号：US20230288447A1

公开(公告)日：2023-09-14

申请号：US18005880

申请日：2021-07-08

Applicant: TECHNOPROBE S.P.A.

Inventor： Stefano FELICI ,  Fabio MORGANA ,  Roberto CRIPPA

IPC: G01R1/067 ,  H01R13/24

CPC classification number: G01R1/06738 ,  G01R1/06761 ,  H01R13/2492

Abstract: A contact probe for a probe head for test equipment of electronic devices is provided. The contact probe includes a first end portion and a second end portion configured to realize a contact with suitable contact structures, and a body portion extended along a longitudinal development axis between respective the first and second end portions. The first end portion includes a base portion, a peripherally protruding element protruding from the base portion, and a hollow part having a base at a surface of the base portion and being surrounded by the peripherally protruding element. In addition, the peripherally protruding element is configured to penetrate into the contact structures.

公开(公告)号：US20230028352A1

公开(公告)日：2023-01-26

申请号：US17783433

申请日：2020-12-10

Applicant: TECHNOPROBE S.P.A.

Inventor： Raffaele VALLAURI ,  Fabio MORGANA

IPC: G01R1/067

Abstract: A contact probe having a first end portion and a second end portion, a probe body extended along a longitudinal development direction between the first end portion and the second end portion is disclosed. The probe body has a pair of arms separated by a slot and extending according to the longitudinal development direction and a conductive insert extended along the longitudinal development direction, in a bending plane of the contact probe. The conductive insert is made of a first material and the contact probe is made of a second material and the first material has a lower electrical resistivity than an electrical resistivity of the second material. The conductive insert is a power transmission element of the contact probe and the arms are structural support elements of the contact probe during a deformation of the probe body.

公开(公告)号：US20200379009A1

公开(公告)日：2020-12-03

申请号：US16903948

申请日：2020-06-17

Applicant: Technoprobe S.p.A.

Inventor： Fabio MORGANA

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/26

Abstract: A contact probe for a testing head for testing electronic devices includes a rod-like body made of a first conductive material and extending along a longitudinal axis, and a contact tip supported by the body at an end portion thereof. The contact tip is made of a second conductive material that is different from the first conductive material. The contact tip includes a contact zone configured to perform mechanical and electrical contact with contact pads of a device under test. The body and the contact tip include respective contact surfaces in contact with each other. The contact surfaces are complementary to each other and include respective connection elements engaging each other. The connection elements include a protruding element projecting from the contact surface of one among the body and the contact tip, and a recess made in the other among the body and the contact tip.