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公开(公告)号：US20210063478A1
公开(公告)日：2021-03-04
申请号：US17098179
申请日：2020-11-13
Applicant: Technoprobe S.p.A.
Inventor： Riccardo VETTORI
Abstract: A probe card for a test equipment of electronic devices includes a flexible membrane configured to carry high frequency signals between a device under test and a support plate. The flexible membrane is connected to the support plate through a peripheral zone, and a damping structure is arranged between the support plate and the flexible membrane. A plurality of micro contact probes include a body extending between a first end and a second end, and the second end is configured to abut onto contact pads of the device under test, and the damping structure and the first ends of the micro contact probes are in contact with opposite faces of a same contact zone of the flexible membrane. The flexible membrane includes at least one weakening zone arranged between the contact zone and the peripheral zone.
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公开(公告)号：US20250052783A1
公开(公告)日：2025-02-13
申请号：US18719473
申请日：2022-12-19
Applicant: TECHNOPROBE S.P.A.
Inventor： Riccardo VETTORI
Abstract: A contact probe is disclosed having a first end portion which ends with a contact tip configured to abut onto a contact pad of a device under test and a second end portion which ends with a contact head configured to abut onto a contact pad of a board of a testing apparatus, as well as a probe body extended between the first end portion and the second end portion along with a longitudinal development axis The first end portion includes a first support part, interposed between the probe body and the contact tip. Suitably, the first support part includes at least one contact pin and one probe length which extend parallel to each other along the longitudinal development axis and are separated by an air gap.
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公开(公告)号：US20230314476A1
公开(公告)日：2023-10-05
申请号：US18040336
申请日：2021-08-03
Applicant: TECHNOPROBE S.P.A.
Inventor： Riccardo VETTORI
CPC classification number: G01R1/06738 , G01R1/07357 , G01R1/06716
Abstract: A contact probe having a first end portion adapted to abut onto a contact pad of a device under test and a second end portion adapted to abut onto a contact pad of a PCB board of a testing apparatus, as well as a rod-shaped probe body extended between the end portions along a longitudinal development direction is provided with an opening extending along the longitudinal development direction and defines at least one pair of arms in the probe body. Suitably, each arm of the at least one pair of arms has a not constant transversal section, which is perpendicular to the longitudinal development direction, having different areas in correspondence of different points along the probe body and ensures a distribution of the stress along the probe body during bending thereof during testing operation of the device under test performed by means of the contact probe.
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Patent Agency Ranking
公开(公告)号：US20240027495A1
公开(公告)日：2024-01-25
申请号：US18254758
申请日：2021-12-09
Applicant: TECHNOPROBE S.P.A.
Inventor： Riccardo VETTORI
CPC classification number: G01R1/07357 , G01R1/06738 , G01R1/07371
Abstract: A contact probe is disclosed having a first end portion with a contact tip adapted to abut onto a contact pad of a device under test, a second end portion with a contact head adapted to abut onto a contact pad of a board of a test equipment, a probe body extended between the first and the second end portions according to a longitudinal development axis, and an elastic stopper provided in an elastic portion of the probe body arranged contiguous to the second end portion. The elastic stopper is deformable between a first working condition, in which it has a transversal diameter greater than a transversal diameter of the probe body, and a second working condition in which it has a transversal diameter corresponding to the transversal diameter of the probe body.
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公开(公告)号：US20230305054A1
公开(公告)日：2023-09-28
申请号：US18042159
申请日：2021-08-23
Applicant: TECHNOPROBE S.P.A.
Inventor： Riccardo VETTORI , Roberto CRIPPA
IPC: G01R31/28
CPC classification number: G01R31/2887 , G01R31/2891
Abstract: A probe head for a testing apparatus of electronic devices is disclosed having a plurality of contact probes, a guide provided with a plurality of guide holes for slidingly housing the contact probes, and a containment element which is adapted to support the guide. The containment element includes a first portion and a second portion which is movable with respect to the first portion, movement means adapted to move the second portion of the containment element with respect to the first portion, and a test optical signal distribution element configured to transmit a test optical signal to the device under test. The test optical signal distribution element is associated with the second portion of the containment element and is arranged to be moved integrally therewith. The movement means is configured to allow the alignment of the test optical signal distribution element.
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公开(公告)号：US20210123950A1
公开(公告)日：2021-04-29
申请号：US17139782
申请日：2020-12-31
Applicant: Technoprobe S.p.A.
Inventor： Riccardo VETTORI
Abstract: A probe card for testing a device under test having a plurality of contact pads includes a support plate having first contact pads thereon. A flexible membrane has a first face and a peripheral portion including second contact pads thereon. A plurality of contact probes are associated with a first face of the flexible membrane and are configured to abut onto the plurality of contact pads of the device under test. A sliding contact area includes: the first contact pads formed on the support plate; the second contact pads formed on the peripheral portion of the flexible membrane, the peripheral portion of the flexible membrane configured to come in pressing contact onto the support plate at the sliding contact area. A pressing element contacts the peripheral portion of the flexible membrane at the sliding contact area, and the pressing element puts the second contact pads into pressing contact with the first contact pads.
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公开(公告)号：US20200348337A1
公开(公告)日：2020-11-05
申请号：US16931188
申请日：2020-07-16
Applicant: Technoprobe S.p.A.
Inventor： Riccardo VETTORI
Abstract: A cantilever contact probe includes a shaped probe body included between a descending probe section and an ascending probe section. At least one end portion is formed in the descending probe section, and bent with respect to a longitudinal axis starting from a bending point and ending with a contact tip of the cantilever contact probe that is configured to abut onto a contact pad of a device under test of that wafer. Suitably, the shaped probe body comprises at least one base portion, an upper portion extending, starting from the base portion, along a longitudinal extension axis of the shaped probe body, orthogonally to the reference plane and a top portion, connected to the upper portion and having a greater diameter than a diameter of the upper portion to form a T, the upper portion being the stem of the T and the top portion being the crosspiece of the T.
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公开(公告)号：US20200348336A1
公开(公告)日：2020-11-05
申请号：US16931183
申请日：2020-07-16
Applicant: Technoprobe S.p.A.
Inventor： Riccardo VETTORI
Abstract: A cantilever probe head includes a support ring associated with a PCB board and a plurality of contact probes, protruding from the support ring in a cantilever manner and being held by a support associated with the support ring. Each contact probe has a rod-like body having a longitudinal axis inclined with respect to a reference plane corresponding to a plane of a wafer of devices under test by the cantilever probe head, as well as at least one first end portion, provided in a first probe section protruding from the support in the direction of the wafer of devices under test, the first end portion being bent with respect to the longitudinal axis starting from a bending point and ending with a contact tip of the contact probe able to abut onto a contact pad of a device under test of the wafer.
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