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公开(公告)号:US20230227375A1
公开(公告)日:2023-07-20
申请号:US18118294
申请日:2023-03-07
Applicant: TOTO LTD.
Inventor: Junichi IWASAWA , Toshihiro AOSHIMA
IPC: C04B41/87 , C04B41/50 , C04B41/00 , C23C24/04 , C23C16/44 , C04B35/505 , C04B35/622 , C23C4/12 , H01L21/683 , H01L21/687
CPC classification number: C04B41/87 , C04B41/5045 , C04B41/009 , C23C24/04 , C23C16/4404 , C04B35/505 , C04B35/62222 , C23C4/12 , H01L21/6833 , H01L21/68757 , C04B2235/3225 , C04B2235/963 , C04B2237/066 , C04B2237/343 , C04B2237/592 , C04B2235/781 , C04B2235/785 , Y02T50/60 , C04B2235/3217
Abstract: According to an aspect of the invention, there is provided a plasma-resistant member including: a base member; and a layer structural component formed at a surface of the base member, the layer structural component including an yttria polycrystalline body and being plasma resistant, the layer structural component including a first uneven structure, and a second uneven structure formed to be superimposed onto the first uneven structure, the second uneven structure having an unevenness finer than an unevenness of the first uneven structure.
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公开(公告)号:US20190144347A1
公开(公告)日:2019-05-16
申请号:US16246852
申请日:2019-01-14
Applicant: TOTO LTD.
Inventor: Junichi IWASAWA , Toshihiro AOSHIMA
IPC: C04B41/87 , C04B35/505 , C04B35/622 , H01L21/683 , H01L21/687 , C23C4/12 , C04B41/50 , C23C24/04 , C23C16/44 , C04B41/00
Abstract: According to an aspect of the invention, there is provided a plasma-resistant member including: a base member; and a layer structural component formed at a surface of the base member, the layer structural component including an yttria polycrystalline body and being plasma resistant, the layer structural component including a first uneven structure, and a second uneven structure formed to be superimposed onto the first uneven structure, the second uneven structure having an unevenness finer than an unevenness of the first uneven structure.
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公开(公告)号:US20190276368A1
公开(公告)日:2019-09-12
申请号:US16296934
申请日:2019-03-08
Applicant: TOTO LTD.
Inventor: Junichi IWASAWA , Hiroaki ASHIZAWA , Takuma WADA , Ryoto TAKIZAWA , Toshihiro AOSHIMA , Yuuki TAKAHASHI , Atsushi KINJO
IPC: C04B35/505 , H01L21/67 , C01F17/00 , C01B11/24 , C01F7/02 , C01G25/02 , C04B35/622 , H01J37/28
Abstract: Disclosed is provision of a ceramic coat having an excellent low-particle generation as well as a method for assessing the low-particle generation of the ceramic coat. A composite structure including a substrate and a structure which is formed on the substrate and has a surface, wherein the structure includes a polycrystalline ceramic and the composite structure has luminance Sa satisfying a specific value calculated from a TEM image analysis thereof, can be suitably used as an inner member of a semiconductor manufacturing apparatus required to have a low-particle generation.
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公开(公告)号:US20160332921A1
公开(公告)日:2016-11-17
申请号:US14651503
申请日:2013-12-27
Applicant: TOTO LTD.
Inventor: Junichi IWASAWA , Toshihiro AOSHIMA
IPC: C04B41/87 , C04B35/622 , C23C4/12 , H01L21/683 , H01L21/687 , C04B35/505 , C04B41/50
CPC classification number: C04B41/87 , C04B35/505 , C04B35/62222 , C04B41/009 , C04B41/5045 , C04B2235/3217 , C04B2235/3225 , C04B2235/781 , C04B2235/785 , C04B2235/963 , C04B2237/066 , C04B2237/343 , C04B2237/592 , C23C4/12 , C23C16/4404 , C23C24/04 , H01L21/6833 , H01L21/68757 , Y02T50/6765 , C04B35/10 , C04B41/4543
Abstract: According to an aspect of the invention, there is provided a plasma-resistant member including: a base member; and a layer structural component formed at a surface of the base member, the layer structural component including an yttria polycrystalline body and being plasma resistant, the layer structural component including a first uneven structure, and a second uneven structure formed to be superimposed onto the first uneven structure, the second uneven structure having an unevenness finer than an unevenness of the first uneven structure.
Abstract translation: 根据本发明的一个方面,提供一种等离子体耐受构件,其包括:基座构件; 以及形成在所述基底构件的表面上的层结构部件,所述层结构部件包括氧化钇多晶体并具有等离子体电阻,所述层结构部件包括第一凹凸结构,以及第二凹凸结构,形成为叠置在所述第一 第二不均匀结构具有比第一凹凸结构的凹凸更细的凹凸。
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