PHOTONIC DEVICE
    1.
    发明申请

    公开(公告)号:US20220269003A1

    公开(公告)日:2022-08-25

    申请号:US17740213

    申请日:2022-05-09

    Abstract: A photonic device includes an optical coupler, a waveguide structure, a metal-dielectric stack, and a protection layer. The optical coupler is over a semiconductor substrate. The waveguide structure is over the semiconductor substrate and laterally connected to the optical coupler. A top of the waveguide structure is lower than a top of the optical coupler. The metal-dielectric stack is over the optical coupler and the waveguide structure. The metal-dielectric stack has a hole above the optical coupler. The protection layer lines the hole of the metal-dielectric stack.

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20210098514A1

    公开(公告)日:2021-04-01

    申请号:US16894647

    申请日:2020-06-05

    Abstract: A semiconductor device includes a first semiconductor structure and a second semiconductor structure. The first semiconductor structure includes silicon. The second semiconductor structure is embedded in the first semiconductor structure, in which the second semiconductor structure has at least one convex portion and at least one concave portion. The convex portion and the concave portion are on at least one edge of the second semiconductor structure, and a shape of the concave portion includes rectangle, trapezoid, inverted trapezoid, or parallelogram. The second semiconductor structure includes germanium, elements of group III or group V, or combinations thereof.

    PHOTONIC DEVICE
    6.
    发明公开
    PHOTONIC DEVICE 审中-公开

    公开(公告)号:US20230358959A1

    公开(公告)日:2023-11-09

    申请号:US18352727

    申请日:2023-07-14

    CPC classification number: G02B6/136 G02B6/12004

    Abstract: A photonic device includes an optical coupler, a photodetector, a waveguide structure, a metal-dielectric stack, a contact, an interlayer dielectric layer, and a protection layer. The optical coupler, the photodetector, and the waveguide structure are over a substrate. The waveguide structure is laterally connected to the optical couple. A top of the waveguide structure is lower than a top of the optical coupler. The metal-dielectric stack is over the optical coupler, the photodetector, and the waveguide structure. The metal-dielectric stack has a hole above the optical coupler. The contact connects the photodetector to the metal-dielectric stack. The interlayer dielectric layer is below the metal-dielectric stack and surrounds the contact. The protection layer lines the hole of the metal-dielectric stack. A bottom surface of the protection layer is lower than a top surface of the contact.

    SEMICONDUCTOR DEVICE
    7.
    发明公开

    公开(公告)号:US20230317743A1

    公开(公告)日:2023-10-05

    申请号:US18329218

    申请日:2023-06-05

    Abstract: A semiconductor device includes a first semiconductor structure and a second semiconductor structure. The first semiconductor structure includes silicon. The second semiconductor structure is embedded in the first semiconductor structure, in which the second semiconductor structure has at least one convex portion and at least one concave portion. The convex portion and the concave portion are on at least one edge of the second semiconductor structure, and a shape of the concave portion includes rectangle, trapezoid, inverted trapezoid, or parallelogram. The second semiconductor structure includes germanium, elements of group III or group V, or combinations thereof. The convex portion of the second semiconductor structure has a top surface substantially coplanar with a top surface of the first semiconductor structure.

    FLASH MEMORY STRUCTURE AND METHOD FOR FORMING THE SAME
    10.
    发明申请
    FLASH MEMORY STRUCTURE AND METHOD FOR FORMING THE SAME 有权
    闪存存储器结构及其形成方法

    公开(公告)号:US20150155394A1

    公开(公告)日:2015-06-04

    申请号:US14093269

    申请日:2013-11-29

    CPC classification number: H01L29/792 H01L21/28282 H01L29/42344 H01L29/66833

    Abstract: Embodiments of mechanisms of a semiconductor device structure are provided. The semiconductor device structure includes a substrate and a word line cell disposed over the substrate. The semiconductor device structure includes a substrate and a control gate formed over the substrate. The semiconductor device further includes an insulating layer formed on a sidewall of the control gate and a memory gate formed adjacent to the insulating layer. In addition, the insulating layer has a first height, and the memory gate has a second height shorter than the first height.

    Abstract translation: 提供半导体器件结构的机构的实施例。 半导体器件结构包括衬底和设置在衬底上的字线单元。 半导体器件结构包括衬底和形成在衬底上的控制栅极。 半导体器件还包括形成在控制栅极的侧壁上的绝缘层和邻近绝缘层形成的存储栅极。 此外,绝缘层具有第一高度,并且存储栅极具有比第一高度短的第二高度。

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