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公开(公告)号:US20240234481A1
公开(公告)日:2024-07-11
申请号:US18150912
申请日:2023-01-06
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Szu-Shu Yang , Chun Yi Wu , Kai Tzeng , Yuh-Sen Chang , Chi-Cheng Chen , Chi-Chun Peng
IPC: H01L27/08
CPC classification number: H01L28/10
Abstract: A method of forming a semiconductor device, the method including forming a first insulation layer over a substrate, depositing a first stack of magnetic layers over the first insulation layer, etching the first stack of magnetic layers such that a sidewall of the first stack of magnetic layers forms a stairstep pattern, forming a first photosensitive layer over the first stack of magnetic layers, the first insulation layer, and the substrate, wherein a thickness of the first photosensitive layer above a center of a first step of the stairstep pattern is different from a thickness of the first photosensitive layer above a center of a second step of the stairstep pattern, forming a first conductive feature over the first photosensitive layer, depositing a second insulation layer over the first photosensitive layer and the first conductive feature, and depositing a second magnetic layer over the second insulation layer.
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公开(公告)号:US20230290809A1
公开(公告)日:2023-09-14
申请号:US17828844
申请日:2022-05-31
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Mei-Chi Lee , Chi-Cheng Chen , Wei-Li Huang , Kai Tzeng , Chun Yi Wu , Ming-Da Cheng
IPC: H01L49/02
CPC classification number: H01L28/10
Abstract: A method of forming a semiconductor device includes: forming a passivation layer over a conductive pad that is disposed over a substrate; and forming an inductive component over the passivation layer, including: forming a first insulation layer and a first magnetic layer successively over the passivation layer; forming a first polymer layer over the first magnetic layer; forming a first conductive feature over the first polymer layer; forming a second polymer layer over the first polymer layer and the first conductive feature; patterning the second polymer layer, where after the patterning, a first sidewall of the second polymer layer includes multiple segments, where an extension of a first segment of the multiple segments intersects the second polymer layer; and after patterning the second polymer layer, forming a second insulation layer and a second magnetic layer successively over the second polymer layer.
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