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公开(公告)号:US20210313323A1
公开(公告)日:2021-10-07
申请号:US17353552
申请日:2021-06-21
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: H01L27/088 , H01L29/06 , H01L29/66 , H01L21/8234 , H01L27/02
Abstract: An IC structure comprises first, second, and third circuits. The first circuit comprises a first semiconductor fin, a first gate electrode extending across the first semiconductor fin, and a first gate dielectric layer spacing the first gate electrode apart from the first semiconductor fin. The second circuit comprises a second semiconductor fin, a second gate electrode extending across the second semiconductor fin, and a second gate dielectric layer spacing the second gate electrode apart from the second semiconductor fin. The third circuit comprises a third semiconductor fin, a third gate electrode extending across the third semiconductor fin, and a third gate dielectric layer spacing the third gate electrode apart from the third semiconductor fin. The first gate dielectric layer has a greater thickness than the second gate dielectric layer. The third semiconductor fin has a smaller width than the second semiconductor fin.
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公开(公告)号:US20210234004A1
公开(公告)日:2021-07-29
申请号:US17214589
申请日:2021-03-26
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: H01L29/10 , H01L27/11 , H01L27/092 , H01L21/8238 , H01L23/528 , H01L21/74
Abstract: A method of manufacturing an integrated circuit device includes: doping a substrate with a first type dopant to form a well region; forming a first semiconductor fin and a second semiconductor fin wider than the first semiconductor fin over the well region; forming a first source/drain region of a second type dopant on the first semiconductor fin, the second type dopant is of a different conductivity type than the first type dopant; forming a second source/drain region of the first type dopant on the second semiconductor fin.
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公开(公告)号:US20210057281A1
公开(公告)日:2021-02-25
申请号:US16548285
申请日:2019-08-22
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Jhon-Jhy LIAW
IPC: H01L21/8234 , H01L21/02 , H01L21/8239
Abstract: An IC is provided. The IC includes a plurality of P-type gate-all-around (GAA) field-effect transistors (FETs). At least one first P-type GAA FET includes a plurality of silicon (Si) channel regions vertically stacked over an N-type well region. At least one second P-type GAA FET includes a plurality of silicon germanium (SiGe) channel regions vertically stacked over the N-type well region.
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公开(公告)号:US20200152242A1
公开(公告)日:2020-05-14
申请号:US16744076
申请日:2020-01-15
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jonathan Tsung-Yung CHANG , Cheng-Hung LEE , Chi-Ting CHENG , Hung-Jen LIAO , Jhon-Jhy LIAW , Yen-Huei CHEN
Abstract: A device includes a memory array. The memory array includes a first sub-bank, a first strap cell coupled to the first sub-bank, and a first continuous data line. The first continuous data line includes a first portion and a second portion coupled to the first sub-bank via the first strap cell. The first portion of the first continuous data line is disposed above the first strap cell and the second portion of the first continuous data line is disposed above the first portion of the first continuous data line.
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公开(公告)号:US20200051906A1
公开(公告)日:2020-02-13
申请号:US16101566
申请日:2018-08-13
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: H01L23/522 , H01L23/532 , H01L27/092 , H01L21/768
Abstract: A semiconductor device includes a semiconductor substrate, a metal layer, a dielectric layer, and a via. The metal layer is disposed above the semiconductor substrate. The dielectric layer is disposed between the metal layer and the semiconductor substrate. The via is embedded in the dielectric layer and comprises a first portion and a second portion between the first portion and the semiconductor substrate. The first portion of the via has a first width. The second portion of the via has a second width greater than the first width of the first portion.
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公开(公告)号:US20190288069A1
公开(公告)日:2019-09-19
申请号:US15925630
申请日:2018-03-19
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: H01L29/08 , H01L21/8234 , H01L29/417 , H01L27/11
Abstract: A semiconductor device includes a substrate, a first circuit, and a second circuit. The first circuit is disposed on the substrate and includes a first semiconductor fin and a first gate electrode straddling the first semiconductor fin. The second circuit is different from the first circuit and disposed on the substrate. The second circuit includes a second semiconductor fin and a second gate electrode straddling the second semiconductor fin. A width of the first semiconductor fin is different from a width of the second semiconductor fin.
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公开(公告)号:US20190164971A1
公开(公告)日:2019-05-30
申请号:US16122772
申请日:2018-09-05
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: H01L27/092 , H01L29/78 , H01L29/423 , H01L29/66 , H01L21/8238
Abstract: A semiconductor device includes a first fin, a second fin, an isolation gate and a dielectric dummy gate. The first and second fins extend in a first direction. The isolation gate extends in a second direction and crosses the first fin. The isolation gate includes a conductive material. The dielectric dummy gate extends from one end of the isolation gate in the second direction and overlaps with the second fin.
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公开(公告)号:US20170162256A1
公开(公告)日:2017-06-08
申请号:US15435149
申请日:2017-02-16
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: G11C11/00
CPC classification number: G11C11/419 , G11C7/12 , G11C11/00 , G11C11/412 , G11C11/4125
Abstract: A semiconductor memory includes a first data line, a second data line, a first coupling line, a second coupling line, a first plurality of transistors, and a second plurality of transistors. The first coupling line is configured to be capacitively coupled with the first data line. The second coupling line is configured to be capacitively coupled with the second data line. The first plurality of transistors are configured to transmit a first voltage to the first coupling line and the second coupling line in response to a first control signal. The second plurality of transistors are configured to transmit a second voltage to the first coupling line, the second coupling line, or a combination thereof in response to a second control signal and a third control signal.
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公开(公告)号:US20170076755A1
公开(公告)日:2017-03-16
申请号:US15153687
申请日:2016-05-12
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jonathan Tsung-Yung CHANG , Cheng-Hung LEE , Chi-Ting CHENG , Hung-Jen LIAO , Jhon-Jhy LIAW , Yen-Huei CHEN
CPC classification number: G11C5/02 , G11C5/025 , G11C5/14 , G11C7/10 , G11C7/1069 , G11C7/1096 , G11C7/12 , G11C7/22 , G11C11/417
Abstract: A device includes a memory array, a first data line, and a second data line. The memory array includes a first strap cell, a first sub-bank, and a second sub-bank, in which the first strap cell is disposed between the first sub-bank and the second sub-bank. The first data line has a first portion and a second portion, in which the first portion of the first data line is disconnected from the second portion of the first data line, and the second portion of the first data line is configured to couple the first sub-bank to a first input/output (I/O) circuit. The second data line and the first portion of the first data line are configured to couple the second sub-bank to the first I/O circuit.
Abstract translation: 一种设备包括存储器阵列,第一数据线和第二数据线。 存储器阵列包括第一带单元,第一子库和第二子库,其中第一带单元设置在第一子库和第二子库之间。 第一数据线具有第一部分和第二部分,其中第一数据线的第一部分与第一数据线的第二部分断开,并且第一数据线的第二部分被配置为将第一数据线的第一部分耦合第一数据线 子行到第一个输入/输出(I / O)电路。 第二数据线和第一数据线的第一部分被配置为将第二子组耦合到第一I / O电路。
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公开(公告)号:US20250159974A1
公开(公告)日:2025-05-15
申请号:US19024557
申请日:2025-01-16
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhon-Jhy LIAW
IPC: H10D84/83 , H10B12/00 , H10D30/62 , H10D62/10 , H10D64/01 , H10D84/01 , H10D84/03 , H10D84/85 , H10D86/00 , H10D89/10
Abstract: An IC structure a first circuit and a second circuit. The first circuit includes a plurality of first fin structures, and one or more first gate structures extending across the plurality of first fin structures. The second circuit includes a plurality of second fin structures, and one or more second gate structures extending across the plurality of second fin structures. In a plan view, one of second fin structures has a width greater than a width of one of the first fin structures. A spacing between adjacent two of the plurality of second fin structures is less than a spacing between adjacent two of the plurality of first fin structures.
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