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    Measurement probe for profilometer and method for manufacturing same
    1.
    发明申请
    Measurement probe for profilometer and method for manufacturing same 审中-公开
    轮廓仪的测量探头及其制造方法

    公开(公告)号：US20060000101A1

    公开(公告)日：2006-01-05

    申请号：US11170533

    申请日：2005-06-29

    申请人： Takeo Nakagawa ,  Qing Liu ,  De-Cheng Chen

    发明人： Takeo Nakagawa ,  Qing Liu ,  De-Cheng Chen

    IPC分类号： G01B5/004

    CPC分类号： G01B5/28

    摘要： A probe (30) for use in surface measurement equipment such as a profilometer. The probe includes a holder (32), a head member (35), and a connecting member (37). The connecting member has a first end and a second end. The holder has a first recess (33) at one end thereof for receiving the first end of the connecting member. The head member has a second recess spanning from an outer surface to a central portion thereof for receiving the second end of the connecting member. The first end of the connecting member has a similar shape to the first recess of the holder and is fixed in first recess by adhering, welding or doweling. The second end of the connecting member has a similar shape to the second recess of the head member and is fixed in the second recess by adhering or welding.

    摘要翻译： 用于表面测量设备（如轮廓仪）的探针（30）。 探针包括保持器（32），头部构件（35）和连接构件（37）。 连接构件具有第一端和第二端。 保持器在其一端具有用于接收连接构件的第一端的第一凹部（33）。 头部构件具有从外表面到其中心部分的第二凹部，用于接收连接构件的第二端。 连接构件的第一端具有与保持件的第一凹部类似的形状，并且通过粘接，焊接或定位固定在第一凹部中。 连接构件的第二端具有与头部构件的第二凹部相似的形状，并且通过粘合或焊接固定在第二凹部中。

    Friction stir welding method and friction stir welded housing
    4.
    发明授权
    Friction stir welding method and friction stir welded housing 有权
    摩擦搅拌焊接方法和摩擦搅拌焊接外壳

    公开(公告)号：US08220694B2

    公开(公告)日：2012-07-17

    申请号：US12729407

    申请日：2010-03-23

    申请人： Koichi Nakagawa ,  Qing Liu ,  Isao Shiozawa ,  Takeo Nakagawa

    发明人： Koichi Nakagawa ,  Qing Liu ,  Isao Shiozawa ,  Takeo Nakagawa

    IPC分类号： B23K20/12

    CPC分类号： B23K20/1265 ,  B23K20/1255 ,  B23K2103/10

    摘要： A friction stir welding method utilizes a joining tool comprising a friction surface; a first workpiece comprising a first treating layer, a second workpiece comprising a second treating layer, and a joining member with a melting point lower than that of the first workpiece and the second workpiece. The joining member is arranged at the joining portion of the first workpiece and the second workpiece, and abutting the first workpiece and the second workpiece. The friction surface of the joining tool is positioned to resist at least one of the first treating layer and the second treating layer. The joining tool is rotated and moved to agitate at least one of the first workpiece and the second workpiece, until at least part of the first workpiece and the second workpiece are plasticized and joined together.

    摘要翻译： 摩擦搅拌焊接方法利用包括摩擦面的接合工具; 包括第一处理层的第一工件，包括第二处理层的第二工件和熔点低于第一工件和第二工件的熔点的接合部件。 接合构件布置在第一工件和第二工件的接合部分处，并且邻接第一工件和第二工件。 接合工具的摩擦表面定位成抵抗第一处理层和第二处理层中的至少一个。 连接工具被旋转移动以搅动第一工件和第二工件中的至少一个，直到第一工件和第二工件的至少一部分被塑化并连接在一起。

    Contour measuring method for measuring aspects of objects
    7.
    发明授权
    Contour measuring method for measuring aspects of objects 有权
    轮廓测量方法用于测量物体的各个方面

    公开(公告)号：US07725290B2

    公开(公告)日：2010-05-25

    申请号：US11966957

    申请日：2007-12-28

    申请人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    发明人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    IPC分类号： G01B3/22

    CPC分类号： G01B5/20

    摘要： An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.

    摘要翻译： 用于测量物体方面的示例性轮廓测量方法包括：（1）提供包括两个轮廓测量探针和处理器的测量装置，所述轮廓测量探针具有尖端延伸部和用于感测尖端延伸部的位移的位移传感器， 处理器电连接到位移传感器; （2）驱动两个尖端延伸部分别接触物体的两个相对表面; （3）驱动两个末端延伸部分别移动和接触物体的两个相对表面，同时位移传感器将尖端延伸部上的位移信息发送到处理器; （4）根据所述尖端延伸部上的位移信息，由所述处理器计算所述物体的横截面; （5）重复步骤（3）和（4），处理器计算对象的多个横截面，编制横截面以获得对象的方面。

    Distance measuring probe with air discharge system
    8.
    发明授权
    Distance measuring probe with air discharge system 有权
    带排气系统的距离测量探头

    公开(公告)号：US07398603B2

    公开(公告)日：2008-07-15

    申请号：US11611724

    申请日：2006-12-15

    申请人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    发明人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    IPC分类号： G01B5/012

    CPC分类号： G01B13/00 ,  G01B3/008 ,  G01B5/012

    摘要： An exemplary distance measuring probe (100) includes a tube track (12), a tip extension (16), a pair of hollow tubes (14), a pair of air discharge systems (115), a linear measuring scale (18), and a displacement sensor (19). The tip extension is configured to touch a surface of an object (50). The linear measuring scale and the displacement sensor are respectively fixed relative to one of the tube track and the tip extension. The hollow tubes contain a flux of air, and are configured to cooperatively push the tip extension to move. Each air discharge system ejects part of air in the corresponding hollow tube out of the hollow tube. The linear measuring scale displays values of displacements of the tip extension. The displacement sensor detects and reads the displacement values displayed by the linear measuring scale.

    摘要翻译： 示例性的距离测量探针（100）包括管道（12），尖端延伸部（16），一对中空管（14），一对排气系统（115），线性测量秤（18） 和位移传感器（19）。 尖端延伸部被配置为接触物体（50）的表面。 线性测量秤和位移传感器分别相对于管道和末端延伸部之一固定。 中空管包含空气通量，并且被构造成协同推动尖端延伸部移动。 每个排气系统将空心管中的一部分空气排出中空管。 线性测量刻度显示尖端延伸部位移的值。 位移传感器检测并读取由线性测量刻度显示的位移值。

    CONTOUR MEASURING METHOD FOR MEASURING ASPECTS OF OBJECTS
    9.
    发明申请
    CONTOUR MEASURING METHOD FOR MEASURING ASPECTS OF OBJECTS 有权
    用于测量物体方面的轮廓测量方法

    公开(公告)号：US20090037140A1

    公开(公告)日：2009-02-05

    申请号：US11966957

    申请日：2007-12-28

    申请人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    发明人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    IPC分类号： G01B5/20

    CPC分类号： G01B5/20

    摘要： An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.

    摘要翻译： 用于测量物体方面的示例性轮廓测量方法包括：（1）提供包括两个轮廓测量探针和处理器的测量装置，所述轮廓测量探针具有尖端延伸部和用于感测尖端延伸部的位移的位移传感器， 处理器电连接到位移传感器; （2）驱动两个尖端延伸部分别接触物体的两个相对表面; （3）驱动两个末端延伸部分别移动和接触物体的两个相对表面，同时位移传感器将尖端延伸部上的位移信息发送到处理器; （4）根据所述尖端延伸部上的位移信息，由所述处理器计算所述物体的横截面; （5）重复步骤（3）和（4），处理器计算对象的多个横截面，编制横截面以获得对象的方面。

    Contour measuring probe
    10.
    发明授权
    Contour measuring probe 有权
    轮廓测量探头

    公开(公告)号：US07726036B2

    公开(公告)日：2010-06-01

    申请号：US11966951

    申请日：2007-12-28

    申请人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    发明人： Qing Liu ,  Jun-Qi Li ,  Takeo Nakagawa

    IPC分类号： G01B5/20 ,  G01B5/00

    CPC分类号： G01B5/012 ,  G01B3/008

    摘要： An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).

    摘要翻译： 示例性轮廓测量探针包括导向件（12），可移动齿条，反平衡机构，线性测量秤（24）和位移传感器（26）。 可动齿条包括用于接触物体表面的末端延伸部（20）。 在作用在可移动支架上的重力作用下，推动末端延伸部20向物体移动。 反平衡机构被构造成部分地平衡作用在可移动支架上的重力。 线性测量刻度（24）显示尖端延伸部（20）的位移值。 位移传感器（26）检测并读取由线性测量秤（24）显示的位移值。