NOVEL PHOTOACID GENERATOR, RESIST COMPOSITION, AND PATTERNING PROCESS
    4.
    发明申请
    NOVEL PHOTOACID GENERATOR, RESIST COMPOSITION, AND PATTERNING PROCESS 有权
    新型光电发生器,电阻组合和图案处理

    公开(公告)号:US20090061358A1

    公开(公告)日:2009-03-05

    申请号:US12204685

    申请日:2008-09-04

    摘要: Photoacid generators generate sulfonic acids of formula (1a) or (1c) upon exposure to high-energy radiation. R1—COOCH(CF3)CF2SO3+H+  (1a) R1—O—COOCH(CF3)CF2SO3−H+  (1c) R1 is a C20-C50 hydrocarbon group having a steroid structure. The photoacid generators are compatible with resins and can control acid diffusion and are thus suited for use in chemically amplified resist compositions.

    摘要翻译: 光生酸发生剂在暴露于高能量辐射时产生式(1a)或(1c)的磺酸。 <?in-line-formula description =“In-line formula”end =“lead”?> R1-COOCH(CF3)CF2SO3 + H +(1a)<?in-line-formula description =“In-line Formulas”end =“tail”?> <?in-line-formula description =“In-line Formulas”end =“lead”?> R1-O-COOCH(CF3)CF2SO3-H +(1c) =“内联式”末端=“尾”→R1是具有类固醇结构的C20-C50烃基。 光致酸产生剂与树脂相容并且可以控制酸扩散,因此适用于化学增幅抗蚀剂组合物。