摘要:
An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.
摘要:
An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.
摘要:
An apparatus for measuring a goniometric reflection property of a sample has: one or more illuminators; a toroidal mirror which is rotationally symmetrical around a center axis effectively contacting with a surface of the sample; a light receiver having an incident aperture on the center axis; a rotating optics which rotates around a rotation axis which effectively coincides with the center axis; and a controller for controlling operations of the illuminators, the light receiver, and the rotating optics, wherein the toroidal mirror reflects light fluxes emitted from the surface of the sample illuminated by the one or more illuminators in emitting directions perpendicular to the center axis and directs each of the light fluxes to the center axis, and wherein the rotating optics specifies one of the light fluxes reflected by the toroidal mirror and directs the specified light flux to the incident aperture of the light receiver.
摘要:
An apparatus for measuring a goniometric reflection property of a sample has: one or more illuminators; a toroidal mirror which is rotationally symmetrical around a center axis effectively contacting with a surface of the sample; a light receiver having an incident aperture on the center axis; a rotating optics which rotates around a rotation axis which effectively coincides with the center axis; and a controller for controlling operations of the illuminators, the light receiver, and the rotating optics, wherein the toroidal mirror reflects light fluxes emitted from the surface of the sample illuminated by the one or more illuminators in emitting directions perpendicular to the center axis and directs each of the light fluxes to the center axis, and wherein the rotating optics specifies one of the light fluxes reflected by the toroidal mirror and directs the specified light flux to the incident aperture of the light receiver.
摘要:
A color luminance meter 1 is provided with a polychrometer 4 as a spectral optical system including a light receiving sensor array 43, a signal processing circuit 5 and an operation control unit 6. The operation control unit 6 carries out calculations to obtain characteristics of a measurement light based on a specified spectral responsitivity, using light reception signals and specified weighting coefficients. The spectral responsitivities of light receiving sensors constructing the light receiving sensor array 43 are selected such that B≧5 nm and A/B lies within a range of 1.5 to 4.0 when A, B denote the half power band width of the spectral responsitivities and a center wavelength interval of the spectral responsitivities. Accordingly, there can be provided a light measuring apparatus capable of maximally suppressing errors to highly precisely measure color luminance values and the like even in a measurement of a light lying in a narrow band such as a monochromatic light.
摘要:
A color luminance meter 1 is provided with a polychrometer 4 as a spectral optical system including a light receiving sensor array 43, a signal processing circuit 5 and an operation control unit 6. The operation control unit 6 carries out calculations to obtain characteristics of a measurement light based on a specified spectral responsitivity, using light reception signals and specified weighting coefficients. The spectral responsitivities of light receiving sensors constructing the light receiving sensor array 43 are selected such that B≧5 nm and A/B lies within a range of 1.5 to 4.0 when A, B denote the half power band width of the spectral responsitivities and a center wavelength interval of the spectral responsitivities. Accordingly, there can be provided a light measuring apparatus capable of maximally suppressing errors to highly precisely measure color luminance values and the like even in a measurement of a light lying in a narrow band such as a monochromatic light.
摘要:
A wavelength displacement correcting system and method where a monochromatic beam from an LED is incident through an incident slit of a spectral device and is diffracted on a diffraction grating to form a dispersed light image. Information relating to the dispersed light image is outputted and a wavelength displacement is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width is calculated, using the calculated wavelength displacement amount of the beam, and the calculated wavelength displacement amounts of at least two diffracted beams.
摘要:
An optical property measuring method and an optical property measuring apparatus according to an aspect of the invention are operable to select bi-spectral characteristics relatively close to bi-spectral characteristics of a fluorescent sample, out of multiple bi-spectral characteristics stored in advance, based on a relative ratio between excitation efficiencies of the fluorescent sample illuminated by excitation illuminations whose spectral distributions are different from each other, in calculating an optical property of the fluorescent sample. The inventive optical property measuring method and optical property measuring apparatus are advantageous in calculating an optical property of a fluorescent sample easily and with high precision.
摘要:
In a reflection characteristic measuring apparatus 10 and a method for calibrating the reflection characteristic measuring apparatus, multiple standard spectral characteristics, or multiple calibration data based on the multiple standard spectral characteristics are obtained in advance with corresponding reference values relating to an emission characteristic of a light source 21. An optimum standard spectral characteristic or an optimum calibration data is selected from the multiple standard spectral characteristics or the multiple calibration data obtained. A spectral reflection characteristic of a sample is calculated using the selected standard spectral characteristic or the selected calibration data.
摘要:
In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost.